{"id":"https://openalex.org/W7113900175","doi":"https://doi.org/10.1109/tvlsi.2025.3640215","title":"FADE: Fault-Aware Adaptive On-Die ECC for Improving Robustness","display_name":"FADE: Fault-Aware Adaptive On-Die ECC for Improving Robustness","publication_year":2025,"publication_date":"2025-12-10","ids":{"openalex":"https://openalex.org/W7113900175","doi":"https://doi.org/10.1109/tvlsi.2025.3640215"},"language":null,"primary_location":{"id":"doi:10.1109/tvlsi.2025.3640215","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2025.3640215","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Youngki Moon","orcid":"https://orcid.org/0009-0001-4264-4803"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngki Moon","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Computer Systems and Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0001-4264-4803","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems and Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Juyong Lee","orcid":"https://orcid.org/0009-0006-0102-3695"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Juyong Lee","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Computer Systems and Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0006-0102-3695","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems and Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Nayeun Kim","orcid":"https://orcid.org/0009-0003-4230-925X"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Nayeun Kim","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Computer Systems and Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0003-4230-925X","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems and Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yeonho Choi","orcid":"https://orcid.org/0009-0000-6042-7143"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yeonho Choi","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Computer Systems and Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0000-6042-7143","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems and Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Byungsoo Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byungsoo Kim","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Computer Systems and Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems and Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":null,"display_name":"Sungho Kang","orcid":"https://orcid.org/0000-0002-7093-2095"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Computer Systems and Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-7093-2095","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems and Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.46523388,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"34","issue":"2","first_page":"707","last_page":"710"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9520000219345093,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9520000219345093,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.014999999664723873,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.00989999994635582,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7249000072479248},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6827999949455261},{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.5989000201225281},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5400999784469604},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.43459999561309814},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4341000020503998},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.40369999408721924},{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.39910000562667847}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7249000072479248},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6827999949455261},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6152999997138977},{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.5989000201225281},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5400999784469604},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.43459999561309814},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4341000020503998},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.42149999737739563},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.40369999408721924},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.39910000562667847},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.3937000036239624},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3610000014305115},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3569999933242798},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.35339999198913574},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.3361000120639801},{"id":"https://openalex.org/C90119067","wikidata":"https://www.wikidata.org/wiki/Q43260","display_name":"Polynomial","level":2,"score":0.31709998846054077},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3012000024318695},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.29260000586509705},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.2678999900817871},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.26019999384880066},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2547999918460846},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.25189998745918274},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.25029999017715454}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2025.3640215","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2025.3640215","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2954055522","https://openalex.org/W4225865409","https://openalex.org/W4292261931","https://openalex.org/W4313546932","https://openalex.org/W4403598521","https://openalex.org/W4404371702","https://openalex.org/W4407851765","https://openalex.org/W4413267633"],"related_works":[],"abstract_inverted_index":{"The":[0],"increasing":[1],"density":[2],"of":[3,55,102,145,173,196],"dynamic":[4],"random":[5],"access":[6],"memory":[7,126],"(DRAM)":[8],"renders":[9],"permanent":[10,68],"faults":[11,56,69,174],"and":[12,21,47,70,166,198],"soft":[13,71],"errors":[14],"more":[15],"prevalent,":[16],"which":[17,83],"critically":[18],"reduces":[19],"yield":[20],"reliability.":[22],"Although":[23],"error":[24,49,95,167],"correction":[25,50,168],"code":[26],"(ECC)":[27],"can":[28,187],"mitigate":[29],"this":[30,73],"issue,":[31],"existing":[32],"ECCs":[33],"are":[34,175],"not":[35],"optimized":[36],"for":[37],"fault":[38,43,91,109,116,132,161,164],"correction.":[39],"As":[40,140],"a":[41,76,108,134,141,191],"result,":[42,142],"tolerance":[44,165],"remains":[45],"insufficient,":[46],"the":[48,53,100,115,119,130,143,153,158,171,179,184],"capability":[51,169],"in":[52,82,89,124,148,170,194],"presence":[54,172],"is":[57,111,138],"degraded.":[58],"Therefore,":[59],"to":[60,99,152],"improve":[61],"DRAM":[62],"robustness":[63],"by":[64,113],"efficiently":[65],"addressing":[66],"both":[67,163],"errors,":[72],"brief":[74],"proposes":[75],"fault-aware":[77],"adaptive":[78],"on-die":[79],"ECC":[80,85],"(FADE)":[81],"two":[84],"engines":[86],"independently":[87],"operate":[88],"either":[90],"mode":[92,96],"(FM)":[93],"or":[94],"(EM)":[97],"according":[98],"number":[101,144],"faulty":[103],"symbols":[104],"(FSs).":[105],"In":[106],"FM,":[107],"polynomial":[110],"reconstructed":[112],"reusing":[114],"addresses":[117],"that":[118,183],"built-in":[120],"self-repair":[121],"(BISR)":[122],"stores":[123],"content-addressable":[125],"(CAM).":[127],"To":[128],"calculate":[129],"corresponding":[131],"magnitudes,":[133],"modified":[135],"decoding":[136],"equation":[137],"employed.":[139],"correctable":[146],"FSs":[147],"FM":[149],"doubles":[150],"compared":[151],"conventional":[154],"ECC.":[155],"Moreover,":[156],"with":[157,190],"proposed":[159,185],"symbol-based":[160],"isolation,":[162],"drastically":[176],"enhanced.":[177],"Additionally,":[178],"experimental":[180],"results":[181],"show":[182],"design":[186],"be":[188],"implemented":[189],"reasonable":[192],"overhead":[193],"terms":[195],"delay":[197],"area.":[199]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-12-11T00:00:00"}