{"id":"https://openalex.org/W4414229378","doi":"https://doi.org/10.1109/tvlsi.2025.3602019","title":"An Effective Faults Detection Method for RRAM Application","display_name":"An Effective Faults Detection Method for RRAM Application","publication_year":2025,"publication_date":"2025-09-16","ids":{"openalex":"https://openalex.org/W4414229378","doi":"https://doi.org/10.1109/tvlsi.2025.3602019"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2025.3602019","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2025.3602019","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062180403","display_name":"Zhikuang Cai","orcid":"https://orcid.org/0000-0002-0264-3849"},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhikuang Cai","raw_affiliation_strings":["College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041199465","display_name":"Chenfei Hua","orcid":null},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenfei Hua","raw_affiliation_strings":["College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5119630546","display_name":"Xuejie Ning","orcid":"https://orcid.org/0009-0004-9595-9229"},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuejie Ning","raw_affiliation_strings":["College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100413203","display_name":"Shiyu Li","orcid":null},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiyu Li","raw_affiliation_strings":["College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100644413","display_name":"Xiaoting Liu","orcid":"https://orcid.org/0009-0009-8491-6254"},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoting Liu","raw_affiliation_strings":["College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069221620","display_name":"Xiaojuan Lian","orcid":"https://orcid.org/0000-0001-6390-6553"},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaojuan Lian","raw_affiliation_strings":["College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100435771","display_name":"Lei Wang","orcid":"https://orcid.org/0000-0001-7266-148X"},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Wang","raw_affiliation_strings":["College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5062180403"],"corresponding_institution_ids":["https://openalex.org/I41198531"],"apc_list":null,"apc_paid":null,"fwci":1.2445,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.84853204,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"33","issue":"12","first_page":"3492","last_page":"3499"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.967199981212616,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12676","display_name":"Machine Learning and ELM","score":0.9520000219345093,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.31279999017715454},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.31220000982284546},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.2944999933242798},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.26170000433921814}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43220001459121704},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36629998683929443},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.31279999017715454},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.31220000982284546},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3043999969959259},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.2944999933242798},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2782000005245209},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27639999985694885},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.26170000433921814},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.259799987077713}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2025.3602019","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2025.3602019","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1992247641","https://openalex.org/W2008901850","https://openalex.org/W2059323493","https://openalex.org/W2096607693","https://openalex.org/W2774180017","https://openalex.org/W2786883037","https://openalex.org/W2794194363","https://openalex.org/W2911925285","https://openalex.org/W2940984015","https://openalex.org/W3007474556","https://openalex.org/W3138138784","https://openalex.org/W3153338730","https://openalex.org/W3177243749","https://openalex.org/W3177368726","https://openalex.org/W3184531420","https://openalex.org/W3216428750","https://openalex.org/W4200136005","https://openalex.org/W4210519761","https://openalex.org/W4285141512","https://openalex.org/W4312036042","https://openalex.org/W4312372425","https://openalex.org/W4317033389","https://openalex.org/W4317905305","https://openalex.org/W4319865974","https://openalex.org/W4381746668","https://openalex.org/W4384026301","https://openalex.org/W4390098554","https://openalex.org/W4392642239","https://openalex.org/W4394698472","https://openalex.org/W4401568724","https://openalex.org/W4402350226","https://openalex.org/W4405021899"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}