{"id":"https://openalex.org/W4412375723","doi":"https://doi.org/10.1109/tvlsi.2025.3585043","title":"ReTern: Exploiting Natural Redundancy and Sign Transformations for Enhanced Fault Tolerance in Compute-in-Memory-Based Ternary LLMs","display_name":"ReTern: Exploiting Natural Redundancy and Sign Transformations for Enhanced Fault Tolerance in Compute-in-Memory-Based Ternary LLMs","publication_year":2025,"publication_date":"2025-07-08","ids":{"openalex":"https://openalex.org/W4412375723","doi":"https://doi.org/10.1109/tvlsi.2025.3585043"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2025.3585043","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2025.3585043","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035901172","display_name":"Akul Malhotra","orcid":"https://orcid.org/0000-0002-6152-2377"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Akul Malhotra","raw_affiliation_strings":["Elmore Family School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA"],"raw_orcid":"https://orcid.org/0000-0002-6152-2377","affiliations":[{"raw_affiliation_string":"Elmore Family School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044276472","display_name":"Sumeet Kumar Gupta","orcid":"https://orcid.org/0000-0001-5609-9722"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sumeet Kumar Gupta","raw_affiliation_strings":["Elmore Family School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA"],"raw_orcid":"https://orcid.org/0000-0001-5609-9722","affiliations":[{"raw_affiliation_string":"Elmore Family School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12747131,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"33","issue":"9","first_page":"2518","last_page":"2527"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10409","display_name":"Fuel Cells and Related Materials","score":0.9455999732017517,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10409","display_name":"Fuel Cells and Related Materials","score":0.9455999732017517,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9424999952316284,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9340999722480774,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8154801726341248},{"id":"https://openalex.org/keywords/ternary-operation","display_name":"Ternary operation","score":0.6756818294525146},{"id":"https://openalex.org/keywords/sign","display_name":"Sign (mathematics)","score":0.5978947281837463},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5267519354820251},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4987144470214844},{"id":"https://openalex.org/keywords/natural","display_name":"Natural (archaeology)","score":0.4645630419254303},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3576418161392212},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.34494495391845703},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15802112221717834},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.1452946960926056},{"id":"https://openalex.org/keywords/history","display_name":"History","score":0.1437910795211792},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10632991790771484},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.060191839933395386},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.05524498224258423}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8154801726341248},{"id":"https://openalex.org/C64452783","wikidata":"https://www.wikidata.org/wiki/Q1524945","display_name":"Ternary operation","level":2,"score":0.6756818294525146},{"id":"https://openalex.org/C139676723","wikidata":"https://www.wikidata.org/wiki/Q1193832","display_name":"Sign (mathematics)","level":2,"score":0.5978947281837463},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5267519354820251},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4987144470214844},{"id":"https://openalex.org/C2776608160","wikidata":"https://www.wikidata.org/wiki/Q4785462","display_name":"Natural (archaeology)","level":2,"score":0.4645630419254303},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3576418161392212},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.34494495391845703},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15802112221717834},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.1452946960926056},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.1437910795211792},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10632991790771484},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.060191839933395386},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.05524498224258423},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2025.3585043","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2025.3585043","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6700000166893005,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1971319818","https://openalex.org/W2068702789","https://openalex.org/W2329040051","https://openalex.org/W2626719825","https://openalex.org/W2768104155","https://openalex.org/W2889456398","https://openalex.org/W2909800597","https://openalex.org/W2912765464","https://openalex.org/W2998617917","https://openalex.org/W3005619596","https://openalex.org/W3026337110","https://openalex.org/W3034538198","https://openalex.org/W3052229291","https://openalex.org/W3134526034","https://openalex.org/W3136138154","https://openalex.org/W3177907605","https://openalex.org/W4221148833","https://openalex.org/W4280496502","https://openalex.org/W4312457094","https://openalex.org/W4312954441","https://openalex.org/W4313251083","https://openalex.org/W4319459123","https://openalex.org/W4362689609","https://openalex.org/W4386763838","https://openalex.org/W4390017976","https://openalex.org/W4390189088","https://openalex.org/W4399144004","https://openalex.org/W4400985603","https://openalex.org/W4406178148"],"related_works":["https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W2102525122","https://openalex.org/W4245282135","https://openalex.org/W4306316843","https://openalex.org/W2130594209","https://openalex.org/W2036953450","https://openalex.org/W4300955944","https://openalex.org/W2170004886","https://openalex.org/W2108317625"],"abstract_inverted_index":{"Ternary":[0],"large":[1],"language":[2],"models":[3],"(LLMs),":[4],"which":[5],"use":[6,115],"ternary":[7,35,45,149],"precision":[8],"weights":[9,139],"and":[10,23,32,101,147,182,186],"8-bit":[11],"activations,":[12],"have":[13],"demonstrated":[14],"competitive":[15],"performance":[16,33],"while":[17,127],"significantly":[18],"reducing":[19],"the":[20,51,128,165,169,177],"high":[21],"computational":[22],"memory":[24,60],"requirements":[25],"of":[26,34,86,171,179],"full-precision":[27],"LLMs.":[28],"The":[29,110],"energy":[30],"efficiency":[31],"LLMs":[36,75,150],"can":[37],"be":[38],"further":[39],"improved":[40],"by":[41],"deploying":[42],"them":[43],"on":[44,95,143,164],"computing-in-memory":[46],"(TCiM)":[47],"accelerators,":[48,88],"thereby":[49],"alleviating":[50],"von-Neumann":[52],"bottleneck.":[53],"However,":[54],"TCiM":[55,87,103],"accelerators":[56],"are":[57],"prone":[58],"to":[59,65,77,114,117,122,134],"stuck-at":[61],"faults":[62],"(SAFs)":[63],"leading":[64],"degradation":[66],"in":[67,124,137,162,168],"model":[68],"accuracy.":[69],"This":[70],"is":[71,93,113,132],"particularly":[72],"severe":[73],"for":[74],"due":[76,121],"their":[78,107],"low":[79],"weight":[80],"sparsity.":[81],"To":[82],"boost":[83],"SAF":[84],"tolerance":[85],"we":[89],"propose":[90],"ReTern":[91],"that":[92,152],"based":[94],"1)":[96],"fault-aware":[97],"sign":[98],"transformations":[99],"(FASTs)":[100],"2)":[102],"bitcell":[104,130],"reprogramming":[105],"exploiting":[106],"natural":[108,129],"redundancy.":[109],"key":[111],"idea":[112],"FAST":[116],"minimize":[118],"computation":[119],"errors":[120],"SAFs":[123,136],"+1/\u22121":[125],"weights,":[126],"redundancy":[131],"exploited":[133],"target":[135],"0":[138],"(zero-fix).":[140],"Our":[141],"experiments":[142],"BitNet":[144],"b1.58":[145],"700M":[146],"3B":[148],"show":[151],"our":[153],"technique":[154],"furnishes":[155],"significant":[156],"fault":[157],"tolerance,":[158],"notably":[159],"~35%":[160],"reduction":[161],"perplexity":[163],"Wikitext":[166],"dataset":[167],"presence":[170],"faults.":[172],"These":[173],"benefits":[174],"come":[175],"at":[176],"cost":[178],"<3%,":[180],"<7%,":[181],"<1%":[183],"energy,":[184],"latency,":[185],"area":[187],"overheads,":[188],"respectively.":[189]},"counts_by_year":[],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}