{"id":"https://openalex.org/W4402216672","doi":"https://doi.org/10.1109/tvlsi.2024.3449320","title":"A Double-Data-Rate Ripple Counter With Calibration Circuits for Correlated Multiple Sampling in CMOS Image Sensors","display_name":"A Double-Data-Rate Ripple Counter With Calibration Circuits for Correlated Multiple Sampling in CMOS Image Sensors","publication_year":2024,"publication_date":"2024-09-04","ids":{"openalex":"https://openalex.org/W4402216672","doi":"https://doi.org/10.1109/tvlsi.2024.3449320"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2024.3449320","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2024.3449320","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008587684","display_name":"Wanbin Zha","orcid":"https://orcid.org/0000-0002-4095-4648"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wanbin Zha","raw_affiliation_strings":["School of Microelectronics and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051428047","display_name":"Jiangtao Xu","orcid":"https://orcid.org/0000-0003-1162-6562"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangtao Xu","raw_affiliation_strings":["School of Microelectronics and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025807838","display_name":"Kaiming Nie","orcid":"https://orcid.org/0000-0002-5383-0580"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kaiming Nie","raw_affiliation_strings":["School of Microelectronics and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018662039","display_name":"Zhiyuan Gao","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyuan Gao","raw_affiliation_strings":["School of Microelectronics and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5008587684"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":0.6161,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.68091217,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"33","issue":"2","first_page":"568","last_page":"572"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9801999926567078,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9569000005722046,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7248647212982178},{"id":"https://openalex.org/keywords/ripple","display_name":"Ripple","score":0.6689138412475586},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6304942965507507},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6103305220603943},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.6075496673583984},{"id":"https://openalex.org/keywords/correlated-double-sampling","display_name":"Correlated double sampling","score":0.5232885479927063},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4698677957057953},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.46821072697639465},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.4526207447052002},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39313995838165283},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.32525259256362915},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2496654987335205},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.2475576400756836},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22813653945922852},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22450241446495056},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19066870212554932},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07562685012817383}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7248647212982178},{"id":"https://openalex.org/C2779599953","wikidata":"https://www.wikidata.org/wiki/Q1776117","display_name":"Ripple","level":3,"score":0.6689138412475586},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6304942965507507},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6103305220603943},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.6075496673583984},{"id":"https://openalex.org/C118277053","wikidata":"https://www.wikidata.org/wiki/Q5172837","display_name":"Correlated double sampling","level":4,"score":0.5232885479927063},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4698677957057953},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.46821072697639465},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.4526207447052002},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39313995838165283},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.32525259256362915},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2496654987335205},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2475576400756836},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22813653945922852},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22450241446495056},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19066870212554932},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07562685012817383},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2024.3449320","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2024.3449320","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6200000047683716,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1031046863","display_name":null,"funder_award_id":"2021ZD0109801","funder_id":"https://openalex.org/F4320329860","funder_display_name":"National Science and Technology Major Project"},{"id":"https://openalex.org/G7946790667","display_name":null,"funder_award_id":"62134004","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320329860","display_name":"National Science and Technology Major Project","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2016997355","https://openalex.org/W2093218199","https://openalex.org/W2112370080","https://openalex.org/W3012438093","https://openalex.org/W3048431371","https://openalex.org/W3094756424","https://openalex.org/W3134599322","https://openalex.org/W3142638269"],"related_works":["https://openalex.org/W2352535872","https://openalex.org/W2022123780","https://openalex.org/W2349576212","https://openalex.org/W1981776476","https://openalex.org/W2334823507","https://openalex.org/W2107073676","https://openalex.org/W4255753471","https://openalex.org/W2331709517","https://openalex.org/W2565551736","https://openalex.org/W2156731538"],"abstract_inverted_index":{"This":[0,21,57],"brief":[1,22],"presents":[2],"a":[3,24,135,210],"double-data-rate":[4],"(DDR)":[5],"ripple":[6],"counter":[7,69],"with":[8],"calibration":[9,78],"circuits":[10],"for":[11],"correlated":[12,50],"multiple":[13],"sampling":[14,52],"(CMS)":[15],"in":[16,67,116,134],"CMOS":[17],"image":[18],"sensors":[19],"(CISs).":[20],"analyzes":[23],"specific":[25],"type":[26],"of":[27,37,64,74,99,213],"least":[28],"significant":[29],"bit":[30],"(LSB)":[31],"error":[32,58],"that":[33,143],"obstructs":[34],"the":[35,38,61,65,72,84,93,97,100,147,179,206],"recording":[36,96],"prior":[39],"LSB":[40,66,85,101],"count":[41],"result":[42,98],"during":[43],"continuous":[44],"counting":[45],"processes":[46],"when":[47],"performing":[48],"digital":[49,55],"double":[51],"(DDS)":[53],"and":[54,70,91,162,192],"CMS.":[56],"stems":[59],"from":[60],"transparent":[62],"characteristic":[63],"DDR":[68],"causes":[71],"increase":[73],"random":[75,106,149],"noise.":[76],"A":[77,122],"circuit":[79],"is":[80,108,132,151,166,181,195],"presented":[81],"to":[82],"calibrate":[83],"error,":[86],"which":[87],"achieves":[88],"carry":[89],"propagation":[90],"retains":[92],"remainder":[94],"by":[95,110],"after":[102,120],"each":[103],"quantization.":[104],"The":[105,139],"noise":[107,150,180],"reduced":[109],"25.5%":[111],"based":[112],"on":[113],"simulation":[114],"results":[115,141],"different":[117],"CMS":[118,177],"iterations":[119],"calibration.":[121],"<inline-formula":[123,152,167,182,196],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[124,153,168,183,197],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[125,154,169,184,198],"<tex-math":[126,155,170,185,199],"notation=\"LaTeX\">$1280\\times":[127],"1024$":[128],"</tex-math></inline-formula>":[129,161,173,191,202],"prototype":[130,207],"CIS":[131,148,208],"fabricated":[133],"110-nm":[136],"1P4M":[137],"process.":[138],"experimental":[140],"show":[142],"at":[144,176],"DDS":[145],"mode,":[146],"notation=\"LaTeX\">$147~\\mu":[156],"\\text":[157,187],"{":[158,188],"V}_{\\text":[159,189],"{rms}}$":[160,190],"ADC":[163],"power":[164,193],"consumption":[165,194],"notation=\"LaTeX\">$21.07~\\mu":[171],"$":[172,201],"W,":[174],"whereas":[175],"=2,":[178],"notation=\"LaTeX\">$118~\\mu":[186],"notation=\"LaTeX\">$28.07~\\mu":[200],"W.":[203],"In":[204],"addition,":[205],"has":[209],"column":[211],"FPN":[212],"0.006%.":[214]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}