{"id":"https://openalex.org/W4402350201","doi":"https://doi.org/10.1109/tvlsi.2024.3449293","title":"A Two-Channel Interleaved ADC With Fast-Converging Foreground Time Calibration and Comparison-Based Control Logic","display_name":"A Two-Channel Interleaved ADC With Fast-Converging Foreground Time Calibration and Comparison-Based Control Logic","publication_year":2024,"publication_date":"2024-09-09","ids":{"openalex":"https://openalex.org/W4402350201","doi":"https://doi.org/10.1109/tvlsi.2024.3449293"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2024.3449293","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2024.3449293","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103580734","display_name":"Xiang an Yan","orcid":null},"institutions":[{"id":"https://openalex.org/I205237279","display_name":"Nankai University","ror":"https://ror.org/01y1kjr75","country_code":"CN","type":"education","lineage":["https://openalex.org/I205237279"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiang Yan","raw_affiliation_strings":["Institute of Photo Electronic Thin Film Devices and Technology, Nankai University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Institute of Photo Electronic Thin Film Devices and Technology, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028065158","display_name":"Kefan Qin","orcid":"https://orcid.org/0000-0002-3085-2242"},"institutions":[{"id":"https://openalex.org/I205237279","display_name":"Nankai University","ror":"https://ror.org/01y1kjr75","country_code":"CN","type":"education","lineage":["https://openalex.org/I205237279"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kefan Qin","raw_affiliation_strings":["Institute of Photo Electronic Thin Film Devices and Technology, Nankai University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Institute of Photo Electronic Thin Film Devices and Technology, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107234748","display_name":"Xinyue Zheng","orcid":null},"institutions":[{"id":"https://openalex.org/I205237279","display_name":"Nankai University","ror":"https://ror.org/01y1kjr75","country_code":"CN","type":"education","lineage":["https://openalex.org/I205237279"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinyue Zheng","raw_affiliation_strings":["Institute of Photo Electronic Thin Film Devices and Technology, Nankai University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Institute of Photo Electronic Thin Film Devices and Technology, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101637603","display_name":"Weibo Hu","orcid":"https://orcid.org/0000-0002-3991-7575"},"institutions":[{"id":"https://openalex.org/I205237279","display_name":"Nankai University","ror":"https://ror.org/01y1kjr75","country_code":"CN","type":"education","lineage":["https://openalex.org/I205237279"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weibo Hu","raw_affiliation_strings":["Institute of Photo Electronic Thin Film Devices and Technology, Nankai University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Institute of Photo Electronic Thin Film Devices and Technology, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042984808","display_name":"Wei Ma","orcid":"https://orcid.org/0000-0001-5242-4305"},"institutions":[{"id":"https://openalex.org/I205237279","display_name":"Nankai University","ror":"https://ror.org/01y1kjr75","country_code":"CN","type":"education","lineage":["https://openalex.org/I205237279"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Ma","raw_affiliation_strings":["Institute of Photo Electronic Thin Film Devices and Technology, Nankai University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Institute of Photo Electronic Thin Film Devices and Technology, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004775194","display_name":"Haitao Cui","orcid":"https://orcid.org/0000-0001-8235-2365"},"institutions":[{"id":"https://openalex.org/I205237279","display_name":"Nankai University","ror":"https://ror.org/01y1kjr75","country_code":"CN","type":"education","lineage":["https://openalex.org/I205237279"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haitao Cui","raw_affiliation_strings":["Institute of Photo Electronic Thin Film Devices and Technology, Nankai University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Institute of Photo Electronic Thin Film Devices and Technology, Nankai University, Tianjin, China","institution_ids":["https://openalex.org/I205237279"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5103580734"],"corresponding_institution_ids":["https://openalex.org/I205237279"],"apc_list":null,"apc_paid":null,"fwci":0.8898,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.74414341,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"32","issue":"11","first_page":"2001","last_page":"2011"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9733999967575073,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.570389986038208},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5681228637695312},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5656968355178833},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.30194324254989624},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.15347591042518616},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10076713562011719}],"concepts":[{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.570389986038208},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5681228637695312},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5656968355178833},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.30194324254989624},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.15347591042518616},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10076713562011719}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2024.3449293","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2024.3449293","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.4399999976158142}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1981215785","https://openalex.org/W2051606634","https://openalex.org/W2060342110","https://openalex.org/W2073537459","https://openalex.org/W2103655129","https://openalex.org/W2104040946","https://openalex.org/W2104347576","https://openalex.org/W2104728238","https://openalex.org/W2113142084","https://openalex.org/W2130395397","https://openalex.org/W2164683688","https://openalex.org/W2167161290","https://openalex.org/W2169289334","https://openalex.org/W2288311220","https://openalex.org/W2525429079","https://openalex.org/W2587931883","https://openalex.org/W2741129378","https://openalex.org/W2743796603","https://openalex.org/W2747877381","https://openalex.org/W2800943457","https://openalex.org/W2809151566","https://openalex.org/W3000227939","https://openalex.org/W3007104685","https://openalex.org/W3121203924","https://openalex.org/W3157918965","https://openalex.org/W3201893035","https://openalex.org/W3204393444","https://openalex.org/W4226265545","https://openalex.org/W4285112352","https://openalex.org/W4285262187","https://openalex.org/W4312941160","https://openalex.org/W4396214293"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4391375266","https://openalex.org/W1979597421","https://openalex.org/W2007980826","https://openalex.org/W2061531152","https://openalex.org/W3002753104","https://openalex.org/W2077600819","https://openalex.org/W2142036596","https://openalex.org/W2072657027","https://openalex.org/W2600246793"],"abstract_inverted_index":{"A":[0],"dual-channel":[1],"interleaved":[2],"analog-to-digital":[3],"converter":[4],"(ADC)":[5],"operating":[6],"at":[7,114,119],"320":[8,120],"MS/s":[9],"is":[10,21,32,76,98,126],"prototyped":[11],"to":[12,34,82],"validate":[13],"a":[14,73,106,136],"fast-converging":[15],"foreground":[16,43,47],"time":[17,44],"calibration":[18],"algorithm":[19],"that":[20],"independent":[22],"of":[23,38],"ADC":[24,97],"offset":[25,40],"errors.":[26],"An":[27],"input":[28,116],"polarity":[29],"switching":[30],"technique":[31],"introduced":[33],"eliminate":[35],"the":[36,49,70,79],"impact":[37],"sub-ADC":[39,71],"mismatches":[41],"during":[42],"calibration.":[45],"After":[46],"calibration,":[48],"signal-to-noise":[50,109],"and":[51,55,65,85,135],"distortion":[52,111],"ratio":[53,112],"(SNDR)":[54,113],"spurious":[56],"free":[57],"dynamic":[58],"range":[59],"(SFDR)":[60],"are":[61],"improved":[62],"by":[63],"8.6":[64],"18.4":[66],"dB,":[67],"respectively.":[68],"In":[69],"design,":[72],"comparison":[74],"functionality":[75],"enabled":[77],"in":[78],"digital":[80,102],"circuits":[81],"prevent":[83],"metastability":[84],"expedite":[86],"data":[87],"conversion.":[88],"The":[89,96,122],"single-channel":[90],"conversion":[91],"rates":[92],"reach":[93],"160":[94],"MS/s.":[95,121],"implemented":[99],"via":[100],"40-nm":[101],"CMOS":[103],"technology,":[104],"achieving":[105],"52.01":[107],"dB":[108],"plus":[110],"near-Nyquist":[115],"while":[117],"sampling":[118],"overall":[123],"power":[124],"consumption":[125],"3.65":[127],"mW,":[128],"which":[129],"includes":[130],"an":[131],"on-chip":[132],"reference":[133],"buffer":[134],"clock":[137],"circuit.":[138]},"counts_by_year":[{"year":2025,"cited_by_count":4}],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}