{"id":"https://openalex.org/W4390905019","doi":"https://doi.org/10.1109/tvlsi.2024.3350870","title":"A CMOS AFE Array With DC Input Current Cancellation for FMCW LiDAR","display_name":"A CMOS AFE Array With DC Input Current Cancellation for FMCW LiDAR","publication_year":2024,"publication_date":"2024-01-16","ids":{"openalex":"https://openalex.org/W4390905019","doi":"https://doi.org/10.1109/tvlsi.2024.3350870"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2024.3350870","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2024.3350870","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101589524","display_name":"Xiaoxiao Zheng","orcid":"https://orcid.org/0000-0002-7475-2331"},"institutions":[{"id":"https://openalex.org/I136765683","display_name":"Tianjin University of Technology","ror":"https://ror.org/00zbe0w13","country_code":"CN","type":"education","lineage":["https://openalex.org/I136765683"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaoxiao Zheng","raw_affiliation_strings":["Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology and the Tianjin Infrared Imaging Technology Engineering Center, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-7475-2331","affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology and the Tianjin Infrared Imaging Technology Engineering Center, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I136765683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101592927","display_name":"Mao Ye","orcid":"https://orcid.org/0000-0003-3150-6779"},"institutions":[{"id":"https://openalex.org/I136765683","display_name":"Tianjin University of Technology","ror":"https://ror.org/00zbe0w13","country_code":"CN","type":"education","lineage":["https://openalex.org/I136765683"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mao Ye","raw_affiliation_strings":["Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology and the Tianjin Infrared Imaging Technology Engineering Center, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0003-3150-6779","affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology and the Tianjin Infrared Imaging Technology Engineering Center, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I136765683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013963951","display_name":"Zhiwei Li","orcid":"https://orcid.org/0009-0000-6390-1883"},"institutions":[{"id":"https://openalex.org/I136765683","display_name":"Tianjin University of Technology","ror":"https://ror.org/00zbe0w13","country_code":"CN","type":"education","lineage":["https://openalex.org/I136765683"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiwei Li","raw_affiliation_strings":["Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology and the Tianjin Infrared Imaging Technology Engineering Center, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0009-0000-6390-1883","affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology and the Tianjin Infrared Imaging Technology Engineering Center, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I136765683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057812128","display_name":"Yao Li","orcid":"https://orcid.org/0000-0002-7014-8145"},"institutions":[{"id":"https://openalex.org/I136765683","display_name":"Tianjin University of Technology","ror":"https://ror.org/00zbe0w13","country_code":"CN","type":"education","lineage":["https://openalex.org/I136765683"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Li","raw_affiliation_strings":["Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology and the Tianjin Infrared Imaging Technology Engineering Center, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-7014-8145","affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology and the Tianjin Infrared Imaging Technology Engineering Center, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I136765683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065179609","display_name":"Qiuwei Wang","orcid":"https://orcid.org/0000-0001-5970-6639"},"institutions":[{"id":"https://openalex.org/I136765683","display_name":"Tianjin University of Technology","ror":"https://ror.org/00zbe0w13","country_code":"CN","type":"education","lineage":["https://openalex.org/I136765683"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiuwei Wang","raw_affiliation_strings":["Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology and the Tianjin Infrared Imaging Technology Engineering Center, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0001-5970-6639","affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology and the Tianjin Infrared Imaging Technology Engineering Center, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I136765683"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100952126","display_name":"Yiqiang Zhao","orcid":"https://orcid.org/0000-0002-4564-952X"},"institutions":[{"id":"https://openalex.org/I136765683","display_name":"Tianjin University of Technology","ror":"https://ror.org/00zbe0w13","country_code":"CN","type":"education","lineage":["https://openalex.org/I136765683"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiqiang Zhao","raw_affiliation_strings":["Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology and the Tianjin Infrared Imaging Technology Engineering Center, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology and the Tianjin Infrared Imaging Technology Engineering Center, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I136765683"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101589524"],"corresponding_institution_ids":["https://openalex.org/I136765683"],"apc_list":null,"apc_paid":null,"fwci":4.8746,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.94838188,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"32","issue":"3","first_page":"422","last_page":"431"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9905999898910522,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transimpedance-amplifier","display_name":"Transimpedance amplifier","score":0.8986210227012634},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6081534624099731},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4870181679725647},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.48570045828819275},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4519793391227722},{"id":"https://openalex.org/keywords/lidar","display_name":"Lidar","score":0.43684467673301697},{"id":"https://openalex.org/keywords/analog-front-end","display_name":"Analog front-end","score":0.4292004108428955},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.39723557233810425},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39219406247138977},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.345927357673645},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29620474576950073},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1108870804309845}],"concepts":[{"id":"https://openalex.org/C92631468","wikidata":"https://www.wikidata.org/wiki/Q215437","display_name":"Transimpedance amplifier","level":5,"score":0.8986210227012634},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6081534624099731},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4870181679725647},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.48570045828819275},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4519793391227722},{"id":"https://openalex.org/C51399673","wikidata":"https://www.wikidata.org/wiki/Q504027","display_name":"Lidar","level":2,"score":0.43684467673301697},{"id":"https://openalex.org/C2778870119","wikidata":"https://www.wikidata.org/wiki/Q16002927","display_name":"Analog front-end","level":3,"score":0.4292004108428955},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.39723557233810425},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39219406247138977},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.345927357673645},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29620474576950073},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1108870804309845}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2024.3350870","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2024.3350870","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.550000011920929,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G3933277241","display_name":null,"funder_award_id":"2018YFB1304700","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1483625982","https://openalex.org/W1973141323","https://openalex.org/W2038896145","https://openalex.org/W2045528440","https://openalex.org/W2069474418","https://openalex.org/W2074688368","https://openalex.org/W2090338205","https://openalex.org/W2144546776","https://openalex.org/W2267996924","https://openalex.org/W2555095614","https://openalex.org/W2558667450","https://openalex.org/W2600127839","https://openalex.org/W2735966618","https://openalex.org/W2794339865","https://openalex.org/W2796483014","https://openalex.org/W2856799292","https://openalex.org/W2893585393","https://openalex.org/W2995852770","https://openalex.org/W3016600231","https://openalex.org/W3087944237","https://openalex.org/W3100435238","https://openalex.org/W3113249514","https://openalex.org/W3120629561","https://openalex.org/W3133590258","https://openalex.org/W3198286360","https://openalex.org/W4293768846","https://openalex.org/W4295832109","https://openalex.org/W4310614840","https://openalex.org/W4317496076"],"related_works":["https://openalex.org/W1548231692","https://openalex.org/W2086246441","https://openalex.org/W2025150006","https://openalex.org/W2744687610","https://openalex.org/W2623916616","https://openalex.org/W4317795005","https://openalex.org/W2113213298","https://openalex.org/W2038029977","https://openalex.org/W3153765185","https://openalex.org/W2113036342"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,34,41,46,136,215],"low":[4],"noise":[5,191],"and":[6,21,49,70,91,102,110,133,162,169,193,206,223],"wide":[7],"linear":[8,216],"dynamic":[9,217],"20-channel":[10],"analog":[11],"front-end":[12],"(AFE)":[13],"array":[14,30,130,153,212],"for":[15],"frequency-modulated":[16],"continuous-wave":[17],"(FMCW)":[18],"light":[19],"detection":[20],"ranging":[22],"(LiDAR)":[23],"system.":[24],"Each":[25],"channel":[26,228],"of":[27,33,124,159,220,226],"the":[28,59,63,71,81,98,115,122,125,151,155,164,180,184,187,194,224],"AFE":[29,126,129,152,211],"mainly":[31],"consists":[32],"shunt":[35],"feedback":[36],"transimpedance":[37,157,182],"amplifier":[38,89],"(SF-TIA)":[39],"with":[40,85],"dc":[42,60,64,72,165],"cancellation":[43],"loop":[44],"(DCL),":[45],"post":[47,82],"amplifier,":[48,83],"an":[50,86,92],"output":[51,103,112],"buffer.":[52],"The":[53,128,210],"DCL":[54],"is":[55,94,118,229],"proposed":[56,95],"to":[57,67,96,120,232],"eliminate":[58],"current,":[61,192],"comprising":[62],"current":[65,73,166],"sunk":[66],"ground":[68],"(dc-STG)":[69],"sourced":[74],"from":[75],"power":[76],"supply":[77],"(dc-SFP).":[78],"In":[79],"addition,":[80],"cascaded":[84],"operational":[87],"transconductance":[88],"(OTA)":[90],"SF-TIA,":[93],"decouple":[97],"relationship":[99],"between":[100,167,198],"gain":[101,109,158],"common":[104],"voltage,":[105],"achieving":[106],"both":[107],"large":[108,111],"swing.":[113],"Furthermore,":[114],"equalization":[116],"technique":[117],"adopted":[119],"expand":[121],"bandwidth":[123],"array.":[127],"was":[131],"implemented":[132],"fabricated":[134],"in":[135],"0.18-":[137],"<inline-formula":[138,170,233],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[139,171,234],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[140,172,235],"<tex-math":[141,173,236],"notation=\"LaTeX\">$\\mu":[142],"\\text{m}$":[143],"</tex-math></inline-formula>":[144,177,238],"CMOS":[145],"technology.":[146],"Measurement":[147],"results":[148],"show":[149],"that":[150],"achieves":[154,214],"maximum":[156,181],"107":[160],"dB":[161,222],"eliminates":[163],"\u2212150":[168],"notation=\"LaTeX\">$250":[174],"~\\mu":[175],"\\text{A}$":[176],".":[178],"With":[179],"gain,":[183],"measured":[185],"bandwidth,":[186],"equivalent":[188],"input-referred":[189],"rms":[190],"signal-to-crosstalk":[195],"ratio":[196],"(SCR)":[197],"adjacent":[199],"channels":[200],"are":[201],"165":[202],"MHz,":[203],"29.4":[204],"nArms,":[205],"\u221233.9":[207],"dB,":[208],"respectively.":[209],"also":[213],"range":[218],"(DR)":[219],"66":[221],"area":[225],"each":[227],"approximately":[230],"equal":[231],"notation=\"LaTeX\">$0.16\\times1.3$":[237],"mm2.":[239]},"counts_by_year":[{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}