{"id":"https://openalex.org/W4381163370","doi":"https://doi.org/10.1109/tvlsi.2023.3277517","title":"PUF-CIM: SRAM-Based Compute-In-Memory With Zero Bit-Error-Rate Physical Unclonable Function for Lightweight Secure Edge Computing","display_name":"PUF-CIM: SRAM-Based Compute-In-Memory With Zero Bit-Error-Rate Physical Unclonable Function for Lightweight Secure Edge Computing","publication_year":2023,"publication_date":"2023-06-19","ids":{"openalex":"https://openalex.org/W4381163370","doi":"https://doi.org/10.1109/tvlsi.2023.3277517"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2023.3277517","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2023.3277517","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027732281","display_name":"Zhuojun Chen","orcid":"https://orcid.org/0000-0003-0431-8852"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]},{"id":"https://openalex.org/I198357462","display_name":"Changsha University","ror":"https://ror.org/011d8sm39","country_code":"CN","type":"education","lineage":["https://openalex.org/I198357462"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhuojun Chen","raw_affiliation_strings":["Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-0431-8852","affiliations":[{"raw_affiliation_string":"Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China","institution_ids":["https://openalex.org/I198357462","https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101591446","display_name":"Ming Wu","orcid":"https://orcid.org/0000-0002-5215-8753"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]},{"id":"https://openalex.org/I198357462","display_name":"Changsha University","ror":"https://ror.org/011d8sm39","country_code":"CN","type":"education","lineage":["https://openalex.org/I198357462"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Wu","raw_affiliation_strings":["Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China","institution_ids":["https://openalex.org/I198357462","https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014547724","display_name":"Yifeng Zhou","orcid":"https://orcid.org/0009-0008-5838-8278"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]},{"id":"https://openalex.org/I198357462","display_name":"Changsha University","ror":"https://ror.org/011d8sm39","country_code":"CN","type":"education","lineage":["https://openalex.org/I198357462"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yifeng Zhou","raw_affiliation_strings":["Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0009-0008-5838-8278","affiliations":[{"raw_affiliation_string":"Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China","institution_ids":["https://openalex.org/I198357462","https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016277480","display_name":"Renlong Li","orcid":null},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]},{"id":"https://openalex.org/I198357462","display_name":"Changsha University","ror":"https://ror.org/011d8sm39","country_code":"CN","type":"education","lineage":["https://openalex.org/I198357462"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Renlong Li","raw_affiliation_strings":["Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China","institution_ids":["https://openalex.org/I198357462","https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jinzhe Tan","orcid":null},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]},{"id":"https://openalex.org/I198357462","display_name":"Changsha University","ror":"https://ror.org/011d8sm39","country_code":"CN","type":"education","lineage":["https://openalex.org/I198357462"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinzhe Tan","raw_affiliation_strings":["Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China","institution_ids":["https://openalex.org/I198357462","https://openalex.org/I16609230"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011292218","display_name":"Ding Ding","orcid":"https://orcid.org/0000-0002-9865-5077"},"institutions":[{"id":"https://openalex.org/I49934816","display_name":"Hunan University of Technology","ror":"https://ror.org/04j3vr751","country_code":"CN","type":"education","lineage":["https://openalex.org/I49934816"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ding Ding","raw_affiliation_strings":["School of Intelligent Engineering and Intelligent Manufacturing, Hunan University of Technology and Business, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-9865-5077","affiliations":[{"raw_affiliation_string":"School of Intelligent Engineering and Intelligent Manufacturing, Hunan University of Technology and Business, Changsha, China","institution_ids":["https://openalex.org/I49934816"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5027732281"],"corresponding_institution_ids":["https://openalex.org/I16609230","https://openalex.org/I198357462"],"apc_list":null,"apc_paid":null,"fwci":8.3283,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.98582749,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"31","issue":"8","first_page":"1234","last_page":"1247"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.805695652961731},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8053051233291626},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7108755111694336},{"id":"https://openalex.org/keywords/encryption","display_name":"Encryption","score":0.5025451183319092},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.43001294136047363},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.4120400547981262},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4013461172580719},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.38289403915405273},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.2718989849090576},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.2682439386844635},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.26035088300704956},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2564830482006073},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.1793300211429596},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16321241855621338}],"concepts":[{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.805695652961731},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8053051233291626},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7108755111694336},{"id":"https://openalex.org/C148730421","wikidata":"https://www.wikidata.org/wiki/Q141090","display_name":"Encryption","level":2,"score":0.5025451183319092},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.43001294136047363},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.4120400547981262},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4013461172580719},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.38289403915405273},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.2718989849090576},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.2682439386844635},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.26035088300704956},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2564830482006073},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.1793300211429596},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16321241855621338}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2023.3277517","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2023.3277517","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G5714589009","display_name":null,"funder_award_id":"22B0654","funder_id":"https://openalex.org/F4320311213","funder_display_name":"Education Department of Hunan Province"},{"id":"https://openalex.org/G8192902605","display_name":null,"funder_award_id":"kq2208061","funder_id":"https://openalex.org/F4320322924","funder_display_name":"Changsha University of Science\u00a0and\u00a0Technology"}],"funders":[{"id":"https://openalex.org/F4320311213","display_name":"Education Department of Hunan Province","ror":"https://ror.org/05ckg3w11"},{"id":"https://openalex.org/F4320322924","display_name":"Changsha University of Science\u00a0and\u00a0Technology","ror":"https://ror.org/03yph8055"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":52,"referenced_works":["https://openalex.org/W1973124816","https://openalex.org/W2000171858","https://openalex.org/W2067008732","https://openalex.org/W2113322447","https://openalex.org/W2115255494","https://openalex.org/W2146276996","https://openalex.org/W2169212403","https://openalex.org/W2412363831","https://openalex.org/W2435473771","https://openalex.org/W2565960208","https://openalex.org/W2591601611","https://openalex.org/W2593172471","https://openalex.org/W2765081478","https://openalex.org/W2775637085","https://openalex.org/W2782511028","https://openalex.org/W2785141883","https://openalex.org/W2792313743","https://openalex.org/W2891550056","https://openalex.org/W2898913080","https://openalex.org/W2899983232","https://openalex.org/W2904299207","https://openalex.org/W2907642298","https://openalex.org/W2919115771","https://openalex.org/W2920326572","https://openalex.org/W2921329602","https://openalex.org/W2961904611","https://openalex.org/W2964176059","https://openalex.org/W2966285227","https://openalex.org/W2966524683","https://openalex.org/W2990591126","https://openalex.org/W2997394243","https://openalex.org/W3000301330","https://openalex.org/W3011368285","https://openalex.org/W3017968097","https://openalex.org/W3026786299","https://openalex.org/W3070232965","https://openalex.org/W3097655915","https://openalex.org/W3099073033","https://openalex.org/W3099871312","https://openalex.org/W3100351549","https://openalex.org/W3104353813","https://openalex.org/W3135906938","https://openalex.org/W3139521791","https://openalex.org/W3159353913","https://openalex.org/W3161688185","https://openalex.org/W3164913974","https://openalex.org/W3210448356","https://openalex.org/W4200107098","https://openalex.org/W4226402784","https://openalex.org/W4286377434","https://openalex.org/W6643269824","https://openalex.org/W6717974185"],"related_works":["https://openalex.org/W4386278306","https://openalex.org/W2594513438","https://openalex.org/W2010558539","https://openalex.org/W2580259249","https://openalex.org/W3096667951","https://openalex.org/W3038784943","https://openalex.org/W2775062502","https://openalex.org/W2302863414","https://openalex.org/W4385196433","https://openalex.org/W4388510194"],"abstract_inverted_index":{"With":[0],"the":[1,5,21,28,49,67,117,137,158,200,238,241],"rapid":[2],"development":[3],"of":[4,7,63,119,253,259],"Internet":[6],"Things":[8],"(IoT),":[9],"compute-in-memory":[10],"(CIM)":[11],"is":[12,71,102,187],"a":[13,75,89,144,192],"promising":[14],"candidate":[15],"for":[16,23,79,104],"edge":[17],"computing,":[18],"which":[19,161],"eliminates":[20],"need":[22],"frequent":[24],"data":[25],"transfer":[26],"between":[27],"memory":[29,100],"and":[30,113,123,133,153,167,177,189,211,215,233,255],"processing":[31],"units.":[32],"On":[33],"one":[34],"hand,":[35,51],"CIM":[36,80],"provides":[37],"an":[38],"efficient":[39],"approach":[40],"to":[41,73,149],"achieve":[42],"deep":[43],"neural":[44],"network":[45],"(DNN)":[46],"inference;":[47],"on":[48,96],"other":[50],"its":[52,84],"security":[53],"issues":[54],"such":[55],"as":[56],"model":[57,106,247],"leakage":[58],"are":[59],"ignored":[60],"in":[61,157,191,225],"most":[62],"state-of-the-art":[64],"studies.":[65],"In":[66,86],"resource-limited":[68],"conditions,":[69],"it":[70,228],"essential":[72],"develop":[74],"lightweight":[76,105],"secure":[77],"scheme":[78],"without":[81],"significantly":[82],"sacrificing":[83],"performance.":[85],"this":[87],"work,":[88],"physical":[90],"unclonable":[91],"function":[92],"(PUF)-CIM":[93],"macro":[94],"based":[95],"static":[97],"random":[98],"access":[99],"(SRAM)":[101],"proposed":[103,201,219,242],"protection.":[107],"An":[108],"SRAM-based":[109],"PUF":[110,202],"extracts":[111],"unique":[112],"stable":[114],"keys":[115],"from":[116],"mismatch":[118],"multirow":[120],"discharge":[121],"rate":[122,129],"further":[124],"achieves":[125,221],"zero":[126,208],"bit":[127,147],"error":[128],"(BER)":[130],"under":[131,213],"temperature":[132,214],"voltage":[134,216],"fluctuations":[135],"by":[136],"on-chip":[138,204],"masking":[139,205],"technique.":[140],"Besides,":[141,227],"we":[142],"propose":[143],"10T":[145],"SRAM":[146],"cell":[148],"perform":[150],"XOR":[151,175],"operation":[152,156,180],"multiply-and-accumulate":[154],"(MAC)":[155],"same":[159],"cell,":[160],"avoids":[162],"weight":[163],"movement":[164],"during":[165],"encryption":[166],"decryption.":[168],"The":[169,184,218],"whole":[170],"process":[171],"including":[172],"key":[173],"generation,":[174],"encryption,":[176],"ciphertext":[178],"MAC":[179],"has":[181],"been":[182],"realized.":[183],"test":[185],"chip":[186],"designed":[188],"fabricated":[190],"55-nm":[193],"CMOS":[194],"process.":[195],"Experimental":[196],"results":[197],"show":[198],"that":[199],"with":[203,237,250],"can":[206,244],"provide":[207],"unstable":[209],"bits":[210],"BER":[212],"variations.":[217],"PUF-CIM":[220,243],"96.20%":[222],"inference":[223],"accuracy":[224,251],"MNIST.":[226],"presents":[229],"93.35\u2013121.38-TOPS/W":[230],"energy":[231,256],"efficiency":[232,257],"1324.24-GOPS":[234],"throughput.":[235],"Compared":[236],"normal":[239],"CIM,":[240],"enhance":[245],"AI":[246],"security,":[248],"only":[249],"loss":[252],"1%":[254],"degradation":[258],"16.1%.":[260]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":17},{"year":2024,"cited_by_count":7}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}