{"id":"https://openalex.org/W4285611639","doi":"https://doi.org/10.1109/tvlsi.2022.3189804","title":"Preponing Fault Detections for Test Compaction Under Transparent Scan","display_name":"Preponing Fault Detections for Test Compaction Under Transparent Scan","publication_year":2022,"publication_date":"2022-07-15","ids":{"openalex":"https://openalex.org/W4285611639","doi":"https://doi.org/10.1109/tvlsi.2022.3189804"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2022.3189804","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2022.3189804","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032651920","display_name":"Irith Pomeranz","orcid":"https://orcid.org/0000-0002-5491-7282"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Irith Pomeranz","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5032651920"],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":0.2271,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.47943421,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"30","issue":"10","first_page":"1543","last_page":"1547"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9679999947547913,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/compaction","display_name":"Compaction","score":0.8760146498680115},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6765092611312866},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.6729482412338257},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6234738230705261},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5212495923042297},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5123533010482788},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5014379024505615},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.49310895800590515},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4923943281173706},{"id":"https://openalex.org/keywords/dynamic-compaction","display_name":"Dynamic compaction","score":0.4791918992996216},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.47070643305778503},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.43632766604423523},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4178128242492676},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3806098997592926},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.354134202003479},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3187862038612366},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.26332515478134155},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26047009229660034},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1575237214565277},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.1507466435432434},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.09801346063613892},{"id":"https://openalex.org/keywords/geotechnical-engineering","display_name":"Geotechnical engineering","score":0.09123343229293823},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0821649432182312},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07798370718955994}],"concepts":[{"id":"https://openalex.org/C196715460","wikidata":"https://www.wikidata.org/wiki/Q1414356","display_name":"Compaction","level":2,"score":0.8760146498680115},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6765092611312866},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.6729482412338257},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6234738230705261},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5212495923042297},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5123533010482788},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5014379024505615},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.49310895800590515},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4923943281173706},{"id":"https://openalex.org/C2777882295","wikidata":"https://www.wikidata.org/wiki/Q5318957","display_name":"Dynamic compaction","level":3,"score":0.4791918992996216},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.47070643305778503},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.43632766604423523},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4178128242492676},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3806098997592926},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.354134202003479},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3187862038612366},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.26332515478134155},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26047009229660034},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1575237214565277},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.1507466435432434},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.09801346063613892},{"id":"https://openalex.org/C187320778","wikidata":"https://www.wikidata.org/wiki/Q1349130","display_name":"Geotechnical engineering","level":1,"score":0.09123343229293823},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0821649432182312},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07798370718955994},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2022.3189804","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2022.3189804","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2117137640","https://openalex.org/W2129851282","https://openalex.org/W2524537451","https://openalex.org/W2570554800","https://openalex.org/W2806771822","https://openalex.org/W2807103069","https://openalex.org/W2901308131","https://openalex.org/W2952274626","https://openalex.org/W2969852599","https://openalex.org/W3103876292","https://openalex.org/W3193311994","https://openalex.org/W3215527485","https://openalex.org/W4280603897"],"related_works":["https://openalex.org/W1581610324","https://openalex.org/W2129124567","https://openalex.org/W2167571917","https://openalex.org/W3088373974","https://openalex.org/W2620614665","https://openalex.org/W2146547687","https://openalex.org/W2049913894","https://openalex.org/W2146381271","https://openalex.org/W2801332551","https://openalex.org/W2127184179"],"abstract_inverted_index":{"A":[0],"test":[1,11,22,33,40,85,135,145,153,158],"compaction":[2,23,86,136,154,159],"procedure":[3,137],"under":[4],"transparent":[5,82],"scan":[6,36,46,83,96,107],"can":[7,24,126],"compact":[8],"a":[9,15,38,43,133],"scan-based":[10,39],"set":[12,41],"that":[13,29,73,138,142],"contains":[14],"minimum":[16],"number":[17],"of":[18,45,57,67,75,81,152],"tests.":[19],"The":[20,65],"additional":[21],"be":[25,127],"important":[26],"in":[27,62,132],"applications":[28],"require":[30],"highly":[31],"compacted":[32],"sets.":[34],"Transparent":[35],"views":[37],"as":[42],"sequence":[44],"shift":[47,97,108],"and":[48,52,125],"functional":[49,99],"capture":[50,100],"cycles":[51,59,101,116,122],"allows":[53],"the":[54,76,79,118,149],"two":[55],"types":[56],"clock":[58,115,121],"to":[60,71,90,144],"appear":[61],"arbitrary":[63],"sequences.":[64],"contribution":[66],"this":[68],"brief":[69],"is":[70,87],"suggest":[72],"one":[74],"reasons":[77],"for":[78,84],"effectiveness":[80],"its":[88],"ability":[89],"prepone":[91],"fault":[92,111],"detections":[93,112],"by":[94],"replacing":[95],"with":[98,156],"when":[102],"faults":[103],"are":[104,113],"activated":[105],"during":[106],"cycles.":[109],"When":[110],"preponed,":[114],"around":[117],"original":[119],"detection":[120],"become":[123],"unnecessary":[124],"omitted.":[128],"This":[129],"view":[130],"results":[131],"new":[134],"focuses":[139],"on":[140],"steps":[141],"contribute":[143],"compaction,":[146],"thus":[147],"reducing":[148],"computational":[150],"effort":[151],"compared":[155],"general-purpose":[157],"procedures.":[160]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}