{"id":"https://openalex.org/W4226145082","doi":"https://doi.org/10.1109/tvlsi.2022.3158729","title":"A 20.5-nW Resistor-Less Bandgap Voltage Reference With Self-Biased Compensation for Process Variations","display_name":"A 20.5-nW Resistor-Less Bandgap Voltage Reference With Self-Biased Compensation for Process Variations","publication_year":2022,"publication_date":"2022-04-05","ids":{"openalex":"https://openalex.org/W4226145082","doi":"https://doi.org/10.1109/tvlsi.2022.3158729"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2022.3158729","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2022.3158729","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102914016","display_name":"Youngwoo Ji","orcid":"https://orcid.org/0000-0002-4319-6619"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Youngwoo Ji","raw_affiliation_strings":["Department of Electrical Engineering, ETH Z&#x00FC;rich, Z&#x00FC;rich, Switzerland"],"raw_orcid":"https://orcid.org/0000-0002-4319-6619","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, ETH Z&#x00FC;rich, Z&#x00FC;rich, Switzerland","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033088278","display_name":"Jae\u2010Yoon Sim","orcid":"https://orcid.org/0000-0003-1814-6211"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jae-Yoon Sim","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-1814-6211","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5102914016"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9811,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.711377,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"30","issue":"6","first_page":"840","last_page":"843"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.901757001876831},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.8249647617340088},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5807275772094727},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5636066794395447},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5304229855537415},{"id":"https://openalex.org/keywords/limiting","display_name":"Limiting","score":0.4722565710544586},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4444630444049835},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.44043684005737305},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.4200728237628937},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.39136824011802673},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3791648745536804},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.37856632471084595},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.3529475927352905},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3393658697605133},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14237961173057556},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.13063722848892212},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.12152579426765442},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.11324483156204224}],"concepts":[{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.901757001876831},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.8249647617340088},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5807275772094727},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5636066794395447},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5304229855537415},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.4722565710544586},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4444630444049835},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.44043684005737305},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.4200728237628937},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.39136824011802673},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3791648745536804},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.37856632471084595},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3529475927352905},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3393658697605133},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14237961173057556},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.13063722848892212},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.12152579426765442},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.11324483156204224},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2022.3158729","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2022.3158729","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6499999761581421}],"awards":[{"id":"https://openalex.org/G1400508735","display_name":null,"funder_award_id":"2020M3F3A2A02082435","funder_id":"https://openalex.org/F4320322030","funder_display_name":"Ministry of Science, ICT and Future Planning"}],"funders":[{"id":"https://openalex.org/F4320322030","display_name":"Ministry of Science, ICT and Future Planning","ror":"https://ror.org/032e49973"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1597620877","https://openalex.org/W1984863066","https://openalex.org/W2146031070","https://openalex.org/W2592861018","https://openalex.org/W2744687811","https://openalex.org/W2899114861","https://openalex.org/W2978954010","https://openalex.org/W2999932876","https://openalex.org/W3039014275","https://openalex.org/W3041872181","https://openalex.org/W3093704974"],"related_works":["https://openalex.org/W2370820504","https://openalex.org/W2133199116","https://openalex.org/W2347289947","https://openalex.org/W2364640622","https://openalex.org/W2390376289","https://openalex.org/W2372270451","https://openalex.org/W1970992322","https://openalex.org/W2542178378","https://openalex.org/W2907906161","https://openalex.org/W2404318024"],"abstract_inverted_index":{"This":[0],"brief":[1],"proposes":[2],"a":[3,10,37,44,87],"resistor-less":[4],"bandgap":[5],"reference":[6,94],"(BGR)":[7],"based":[8],"on":[9,20,51],"leakage-based":[11],"proportional-to-absolute-temperature":[12],"(PTAT)":[13],"scheme.":[14],"The":[15,31,57],"effect":[16],"of":[17,53,74,90],"process":[18],"variations":[19],"the":[21,54],"current":[22],"is":[23],"mitigated":[24],"by":[25,47],"employing":[26],"self-biased":[27],"current-limiting":[28],"MOS":[29],"transistors.":[30],"bias":[32],"voltages":[33],"needed":[34],"for":[35],"approximating":[36],"large":[38],"resistance":[39],"can":[40],"be":[41],"obtained":[42],"from":[43],"single":[45],"branch":[46],"placing":[48],"threshold-sampling":[49],"transistors":[50],"top":[52],"BGR":[55,59],"output.":[56],"fabricated":[58],"in":[60],"0.18-":[61],"<inline-formula":[62],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[63,78],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[64],"<tex-math":[65],"notation=\"LaTeX\">$\\mu":[66],"\\text{m}$":[67],"</tex-math></inline-formula>":[68],"CMOS":[69],"occupies":[70],"an":[71],"active":[72],"area":[73],"0.035":[75],"mm":[76],"<sup":[77],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[79],"and":[80,84],"consumes":[81],"20.5":[82],"nW,":[83],"it":[85],"shows":[86],"standard":[88],"deviation":[89],"0.68%":[91],"at":[92],"untrimmed":[93],"voltages.":[95]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2}],"updated_date":"2026-04-25T08:17:42.794288","created_date":"2025-10-10T00:00:00"}