{"id":"https://openalex.org/W4226261904","doi":"https://doi.org/10.1109/tvlsi.2022.3154535","title":"Test Methodology for Defect-Based Bridge Faults","display_name":"Test Methodology for Defect-Based Bridge Faults","publication_year":2022,"publication_date":"2022-03-10","ids":{"openalex":"https://openalex.org/W4226261904","doi":"https://doi.org/10.1109/tvlsi.2022.3154535"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2022.3154535","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2022.3154535","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067484298","display_name":"Shuo-Wen Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Shuo-Wen Chang","raw_affiliation_strings":["Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057582360","display_name":"Yu-Teng Nien","orcid":"https://orcid.org/0000-0002-6549-1918"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Teng Nien","raw_affiliation_strings":["Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017069623","display_name":"Yu-Pang Hu","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Pang Hu","raw_affiliation_strings":["Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109999808","display_name":"Kai\u2013Chiang Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kai-Chiang Wu","raw_affiliation_strings":["Department of Computer Science, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016218475","display_name":"Chi-Chun Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111328","display_name":"Novatek Microelectronics (Taiwan)","ror":"https://ror.org/02s6rdg38","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210111328"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chi-Chun Wang","raw_affiliation_strings":["Novatek Microelectronics Corporation, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Novatek Microelectronics Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210111328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043543809","display_name":"Fu-Sheng Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111328","display_name":"Novatek Microelectronics (Taiwan)","ror":"https://ror.org/02s6rdg38","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210111328"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Fu-Sheng Huang","raw_affiliation_strings":["Novatek Microelectronics Corporation, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Novatek Microelectronics Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210111328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013538157","display_name":"Yi-Lun Tang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111328","display_name":"Novatek Microelectronics (Taiwan)","ror":"https://ror.org/02s6rdg38","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210111328"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi-Lun Tang","raw_affiliation_strings":["Novatek Microelectronics Corporation, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Novatek Microelectronics Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210111328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007604847","display_name":"Yung-Chen Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111328","display_name":"Novatek Microelectronics (Taiwan)","ror":"https://ror.org/02s6rdg38","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210111328"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yung-Chen Chen","raw_affiliation_strings":["Novatek Microelectronics Corporation, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Novatek Microelectronics Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210111328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067004794","display_name":"Ming-Chien Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111328","display_name":"Novatek Microelectronics (Taiwan)","ror":"https://ror.org/02s6rdg38","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210111328"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Chien Chen","raw_affiliation_strings":["Novatek Microelectronics Corporation, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Novatek Microelectronics Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210111328"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045156360","display_name":"Mango C.-T. Chao","orcid":"https://orcid.org/0000-0002-7299-9015"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Mango C.-T. Chao","raw_affiliation_strings":["Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5067484298"],"corresponding_institution_ids":["https://openalex.org/I148366613"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04001489,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"30","issue":"7","first_page":"975","last_page":"988"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8118108510971069},{"id":"https://openalex.org/keywords/bridge","display_name":"Bridge (graph theory)","score":0.6438567042350769},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5338249206542969},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5154774785041809},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.48790213465690613},{"id":"https://openalex.org/keywords/fault-simulator","display_name":"Fault Simulator","score":0.4771918058395386},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.47649043798446655},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4649677574634552},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4260373115539551},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.338592529296875},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3249847888946533},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3196656107902527},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16135817766189575},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.13788330554962158},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1081281304359436}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8118108510971069},{"id":"https://openalex.org/C100776233","wikidata":"https://www.wikidata.org/wiki/Q2532492","display_name":"Bridge (graph theory)","level":2,"score":0.6438567042350769},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5338249206542969},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5154774785041809},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.48790213465690613},{"id":"https://openalex.org/C2776365744","wikidata":"https://www.wikidata.org/wiki/Q5438149","display_name":"Fault Simulator","level":5,"score":0.4771918058395386},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.47649043798446655},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4649677574634552},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4260373115539551},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.338592529296875},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3249847888946533},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3196656107902527},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16135817766189575},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.13788330554962158},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1081281304359436},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2022.3154535","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2022.3154535","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1625402502","https://openalex.org/W1853776572","https://openalex.org/W1979502538","https://openalex.org/W2037926253","https://openalex.org/W2041090186","https://openalex.org/W2082909429","https://openalex.org/W2101637552","https://openalex.org/W2109768518","https://openalex.org/W2112559786","https://openalex.org/W2117312779","https://openalex.org/W2118941539","https://openalex.org/W2119779484","https://openalex.org/W2120518773","https://openalex.org/W2121440068","https://openalex.org/W2135018455","https://openalex.org/W2147106466","https://openalex.org/W2170907629","https://openalex.org/W2171020103","https://openalex.org/W2171106257","https://openalex.org/W2616575701","https://openalex.org/W2735572146","https://openalex.org/W2782177023","https://openalex.org/W2810128013","https://openalex.org/W2911433171","https://openalex.org/W2911724039","https://openalex.org/W2962664404"],"related_works":["https://openalex.org/W2031110496","https://openalex.org/W2157154381","https://openalex.org/W3147038789","https://openalex.org/W2913077774","https://openalex.org/W4253743993","https://openalex.org/W2288548055","https://openalex.org/W1923485359","https://openalex.org/W4248287414","https://openalex.org/W1896809008","https://openalex.org/W3016508983"],"abstract_inverted_index":{"A":[0,57],"defect-based":[1,37,58,90,142,167,191],"bridge":[2,38,59,91,112,143,154,168,192],"fault":[3,60,92,113],"represents":[4],"the":[5,17,22,66,138,148,186],"faulty":[6,67],"behavior":[7,68],"of":[8,69],"an":[9],"interconnect":[10],"short":[11,23,71,131],"defect":[12,24,72],"obtained":[13],"by":[14,137,147],"SPICE":[15],"simulating":[16],"two":[18],"shorted":[19,82,121],"cells":[20],"with":[21,107,156],"injected.":[25],"In":[26,128],"this":[27,197],"article,":[28],"we":[29],"have":[30],"developed":[31],"a":[32,54,70,86,89,99,108],"framework":[33],"to":[34,48,98,183],"automatically":[35],"extract":[36],"faults":[39,79,118,144,155,169],"and":[40,177],"utilize":[41],"commercial":[42],"automatic":[43],"test":[44,51,103,139,149,158],"pattern":[45],"generation":[46],"(ATPG)":[47],"generate":[49],"corresponding":[50],"patterns":[52],"for":[53,94,126,141,151,163,188],"given":[55],"design.":[56],"model":[61,93],"can":[62,96,133],"not":[63,146],"only":[64,134],"describe":[65],"precisely":[73],"but":[74,145],"also":[75,181],"result":[76],"in":[77,196],"collapsible":[78],"at":[80,119],"one":[81,120],"cell":[83,122],"pair.":[84],"As":[85],"result,":[87],"using":[88],"ATPG":[95],"lead":[97],"significantly":[100],"smaller":[101],"bridge-fault":[102],"set":[104,140,150],"when":[105],"compared":[106],"conventional":[109],"four-way":[110,152],"dominance":[111,153],"model,":[114],"where":[115],"four":[116],"noncollapsible":[117],"pair":[123],"are":[124,199],"considered":[125],"ATPG.":[127],"addition,":[129],"some":[130,178],"defects":[132],"be":[135],"detected":[136],"more":[157],"patterns.":[159],"The":[160],"runtime":[161,187],"required":[162],"extracting":[164,189],"1-time-frame":[165],"(1tf)":[166],"has":[170],"been":[171],"proven":[172],"acceptable":[173],"on":[174,202],"industrial":[175,203],"designs":[176],"techniques":[179],"were":[180],"proposed":[182],"speed":[184],"up":[185],"2tf":[190],"faults.":[193],"All":[194],"experiments":[195],"article":[198],"conducted":[200],"based":[201],"designs.":[204]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}