{"id":"https://openalex.org/W4214849951","doi":"https://doi.org/10.1109/tvlsi.2022.3151500","title":"An Ultralow-Power 65-nm Standard Cell Library for Near/Subthreshold Digital Circuits","display_name":"An Ultralow-Power 65-nm Standard Cell Library for Near/Subthreshold Digital Circuits","publication_year":2022,"publication_date":"2022-03-02","ids":{"openalex":"https://openalex.org/W4214849951","doi":"https://doi.org/10.1109/tvlsi.2022.3151500"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2022.3151500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2022.3151500","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100436564","display_name":"Yu-Ting Chen","orcid":"https://orcid.org/0000-0002-1109-2022"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuting Chen","raw_affiliation_strings":["School of Electronic and Computer Engineering, Shenzhen Graduate School, Peking University, Shenzhen, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Computer Engineering, Shenzhen Graduate School, Peking University, Shenzhen, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024677122","display_name":"Yuxuan Nie","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuxuan Nie","raw_affiliation_strings":["School of Electronic and Computer Engineering, Shenzhen Graduate School, Peking University, Shenzhen, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Computer Engineering, Shenzhen Graduate School, Peking University, Shenzhen, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042636120","display_name":"Hailong Jiao","orcid":"https://orcid.org/0000-0002-2815-6168"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hailong Jiao","raw_affiliation_strings":["School of Electronic and Computer Engineering, Shenzhen Graduate School, Peking University, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0002-2815-6168","affiliations":[{"raw_affiliation_string":"School of Electronic and Computer Engineering, Shenzhen Graduate School, Peking University, Shenzhen, China","institution_ids":["https://openalex.org/I20231570"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I20231570"],"apc_list":null,"apc_paid":null,"fwci":0.6184,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.63946292,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"30","issue":"5","first_page":"676","last_page":"680"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.8626844882965088},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6963978409767151},{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.6692544221878052},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5099130868911743},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.5095870494842529},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5009307861328125},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.50040602684021},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4951912462711334},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.4746093153953552},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4694858193397522},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.44095584750175476},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.42681148648262024},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4141799509525299},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4133617579936981},{"id":"https://openalex.org/keywords/power\u2013delay-product","display_name":"Power\u2013delay product","score":0.41237300634384155},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40445828437805176},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3978225886821747},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3135468363761902},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22721725702285767},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15067732334136963},{"id":"https://openalex.org/keywords/adder","display_name":"Adder","score":0.1335289180278778}],"concepts":[{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.8626844882965088},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6963978409767151},{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.6692544221878052},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5099130868911743},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.5095870494842529},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5009307861328125},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.50040602684021},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4951912462711334},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.4746093153953552},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4694858193397522},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44095584750175476},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.42681148648262024},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4141799509525299},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4133617579936981},{"id":"https://openalex.org/C2776391166","wikidata":"https://www.wikidata.org/wiki/Q7236873","display_name":"Power\u2013delay product","level":4,"score":0.41237300634384155},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40445828437805176},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3978225886821747},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3135468363761902},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22721725702285767},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15067732334136963},{"id":"https://openalex.org/C164620267","wikidata":"https://www.wikidata.org/wiki/Q376953","display_name":"Adder","level":3,"score":0.1335289180278778},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2022.3151500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2022.3151500","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G4632641507","display_name":null,"funder_award_id":"JCYJ20200109140601691","funder_id":"https://openalex.org/F4320326705","funder_display_name":"Science, Technology and Innovation Commission of Shenzhen Municipality"},{"id":"https://openalex.org/G6781766220","display_name":null,"funder_award_id":"62074005","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326705","display_name":"Science, Technology and Innovation Commission of Shenzhen Municipality","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1571368811","https://openalex.org/W1967171495","https://openalex.org/W1975918566","https://openalex.org/W2004113442","https://openalex.org/W2008913623","https://openalex.org/W2010635096","https://openalex.org/W2013275447","https://openalex.org/W2163728097","https://openalex.org/W2477046388","https://openalex.org/W2609526441","https://openalex.org/W2766979214","https://openalex.org/W2804635567","https://openalex.org/W2899311452","https://openalex.org/W2966926151","https://openalex.org/W3034705689","https://openalex.org/W4249018771"],"related_works":["https://openalex.org/W2009852498","https://openalex.org/W3004587385","https://openalex.org/W1991521745","https://openalex.org/W2109147260","https://openalex.org/W2786811717","https://openalex.org/W4220771873","https://openalex.org/W2069364674","https://openalex.org/W2062767191","https://openalex.org/W2117738807","https://openalex.org/W4231458110"],"abstract_inverted_index":{"In":[0],"this":[1],"brief,":[2],"a":[3,14,73,94],"standard":[4,45],"cell":[5],"library":[6],"targeting":[7],"ultra-low":[8],"voltages":[9],"(ULVs)":[10],"is":[11,80,86],"designed":[12],"in":[13,36,43],"65-nm":[15],"low-power":[16],"CMOS":[17],"technology":[18,54],"to":[19,25,57,101],"enable":[20],"digital":[21],"integrated":[22],"circuits":[23],"(ICs)":[24],"achieve":[26],"good":[27],"tradeoff":[28],"among":[29],"speed,":[30],"power":[31],"consumption,":[32],"area,":[33],"and":[34,53,61,70],"reliability":[35],"the":[37,44,59,68,90,102,105,111],"near/subthreshold":[38],"region.":[39],"The":[40],"transistor":[41],"sizes":[42],"cells":[46],"are":[47],"optimized":[48],"by":[49,88,117],"threshold":[50],"voltage":[51,96],"tuning":[52],"feature":[55],"exploration":[56],"enhance":[58],"switching":[60],"area":[62],"efficiency":[63],"of":[64,97,104],"transistors.":[65],"To":[66],"balance":[67],"pull-up":[69],"pull-down":[71],"networks,":[72],"Monte":[74],"Carlo":[75],"(MC)":[76],"simulation-based":[77],"balancing":[78],"method":[79],"proposed.":[81],"An":[82],"AES-128":[83],"test":[84,108],"circuit":[85,109],"fabricated":[87],"using":[89],"proposed":[91],"library,":[92],"achieving":[93],"minimum":[95,112],"0.338":[98],"V.":[99],"Compared":[100],"state":[103],"art,":[106],"our":[107],"reduces":[110],"energy":[113],"delay":[114],"product":[115],"(EDP)":[116],"at":[118],"least":[119],"<inline-formula":[120],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[121],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[122],"<tex-math":[123],"notation=\"LaTeX\">$3.55\\times":[124],"$":[125],"</tex-math></inline-formula>":[126],".":[127]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}