{"id":"https://openalex.org/W4206400559","doi":"https://doi.org/10.1109/tvlsi.2021.3138303","title":"A Pre-Activation, Golden IC Free, Hardware Trojan Detection Approach","display_name":"A Pre-Activation, Golden IC Free, Hardware Trojan Detection Approach","publication_year":2022,"publication_date":"2022-01-07","ids":{"openalex":"https://openalex.org/W4206400559","doi":"https://doi.org/10.1109/tvlsi.2021.3138303"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2021.3138303","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2021.3138303","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049014584","display_name":"Hamidreza Esmaeili Taheri","orcid":"https://orcid.org/0000-0002-0738-8218"},"institutions":[{"id":"https://openalex.org/I74413500","display_name":"University of Windsor","ror":"https://ror.org/01gw3d370","country_code":"CA","type":"education","lineage":["https://openalex.org/I74413500"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Hamidreza Esmaeili Taheri","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Windsor, Windsor, ON, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Windsor, Windsor, ON, Canada","institution_ids":["https://openalex.org/I74413500"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042170452","display_name":"Mitra Mirhassani","orcid":"https://orcid.org/0000-0001-8512-6427"},"institutions":[{"id":"https://openalex.org/I74413500","display_name":"University of Windsor","ror":"https://ror.org/01gw3d370","country_code":"CA","type":"education","lineage":["https://openalex.org/I74413500"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mitra Mirhassani","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Windsor, Windsor, ON, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Windsor, Windsor, ON, Canada","institution_ids":["https://openalex.org/I74413500"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5049014584"],"corresponding_institution_ids":["https://openalex.org/I74413500"],"apc_list":null,"apc_paid":null,"fwci":3.1771,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.91997022,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"30","issue":"3","first_page":"315","last_page":"324"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5757876634597778},{"id":"https://openalex.org/keywords/hardware-trojan","display_name":"Hardware Trojan","score":0.5569940805435181},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5302205681800842},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4880200922489166},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.4511583745479584},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.43851232528686523},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.428960919380188},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41579392552375793},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.377055823802948},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3492555022239685},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3245809078216553},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2442496418952942},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10831663012504578}],"concepts":[{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5757876634597778},{"id":"https://openalex.org/C2780873074","wikidata":"https://www.wikidata.org/wiki/Q5656397","display_name":"Hardware Trojan","level":3,"score":0.5569940805435181},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5302205681800842},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4880200922489166},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.4511583745479584},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43851232528686523},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.428960919380188},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41579392552375793},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.377055823802948},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3492555022239685},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3245809078216553},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2442496418952942},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10831663012504578},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2021.3138303","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2021.3138303","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5600000023841858}],"awards":[],"funders":[{"id":"https://openalex.org/F4320333597","display_name":"FedDev Ontario","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1972647831","https://openalex.org/W1998461107","https://openalex.org/W2001441503","https://openalex.org/W2011712479","https://openalex.org/W2065858973","https://openalex.org/W2088380002","https://openalex.org/W2117782804","https://openalex.org/W2126601413","https://openalex.org/W2145937629","https://openalex.org/W2150928734","https://openalex.org/W2158302200","https://openalex.org/W2161998562","https://openalex.org/W2484040524","https://openalex.org/W2485074729","https://openalex.org/W2511192821","https://openalex.org/W2566015346","https://openalex.org/W2606854262","https://openalex.org/W2801379610","https://openalex.org/W2905755717","https://openalex.org/W3008093014","https://openalex.org/W3115588833"],"related_works":["https://openalex.org/W2348740411","https://openalex.org/W1966596465","https://openalex.org/W2051563071","https://openalex.org/W4386858602","https://openalex.org/W2337947459","https://openalex.org/W2118205267","https://openalex.org/W2126912594","https://openalex.org/W1988444705","https://openalex.org/W4292622326","https://openalex.org/W2485567185"],"abstract_inverted_index":{"The":[0,44,70,89,103,120,182,214],"increasing":[1],"concern":[2],"about":[3],"the":[4,40,65,96,125,129,132,153,162,177,192,210,224,228],"security":[5],"and":[6,17,98,113,174,198,223,227],"reliability":[7],"of":[8,49,67,131,195],"abroad":[9],"manufactured":[10],"integrated":[11,31,41],"circuits":[12],"(ICs)":[13],"has":[14],"attracted":[15],"academia":[16],"industries":[18],"to":[19,109],"develop":[20],"hardware":[21],"Trojan":[22],"(HT)":[23],"detection":[24,33,46,72,90,173,189,212,225],"approaches.":[25],"This":[26,202],"article":[27],"presents":[28],"an":[29,196],"efficient":[30],"HT":[32,45,71,126,172,178],"technique":[34,122,136],"based":[35,93,117],"on":[36,94,118,219],"evaluating":[37],"changes":[38],"in":[39,64,85,141,152,204,209],"parasitic":[42,111],"capacitors.":[43],"circuit":[47,73,106,127],"consists":[48],"a":[50,149,168,186,199,205],"capacitively":[51],"coupled,":[52],"low-power,":[53],"low-noise,":[54],"operational":[55],"transconductance":[56],"amplifier":[57],"(OTA),":[58],"which":[59,147],"can":[60,123,175],"detect":[61,124,176],"capacitance":[62,112],"fluctuations":[63],"range":[66],"10":[68],"aF.":[69],"consumes":[74],"<inline-formula>":[75],"<tex-math":[76],"notation=\"LaTeX\">$5.88~\\mu":[77],"\\text":[78],"{W}$":[79],"</tex-math></inline-formula>":[80],"from":[81],"1.8-V":[82],"power":[83],"supply":[84],"180-nm":[86],"CMOS":[87],"technology.":[88],"method":[91,164,184],"is":[92,107,148,217],"clustering":[95],"IC":[97,170],"monitoring":[99],"each":[100],"cluster&#x2019;s":[101],"flag.":[102],"flag":[104],"set":[105],"designed":[108],"sense":[110],"change":[114],"its":[115],"status":[116],"it.":[119],"proposed":[121,163,183,211,215],"before":[128],"activation":[130],"IC.":[133,201],"Moreover,":[134],"this":[135],"shows":[137],"very":[138],"promising":[139],"results":[140,203],"detecting":[142],"HTs":[143],"with":[144],"zero-delay":[145],"effect,":[146],"challenging":[150],"issue":[151],"conventional":[154],"delay-based":[155],"side-channel":[156],"signal":[157,190],"analysis":[158],"method.":[159,213],"More":[160],"significantly,":[161],"does":[165],"not":[166],"require":[167],"golden":[169],"for":[171],"using":[179],"simulation-based":[180],"data.":[181],"creates":[185],"recognizable":[187],"difference":[188],"between":[191],"capacitive":[193],"behavior":[194],"infected":[197],"pure":[200],"high":[206],"confidence":[207],"level":[208],"idea":[216],"implemented":[218],"ISCAS&#x2019;85":[220],"benchmark":[221],"circuits,":[222],"outcomes":[226],"statistical":[229],"simulations":[230],"are":[231],"presented.":[232]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}