{"id":"https://openalex.org/W3199363867","doi":"https://doi.org/10.1109/tvlsi.2021.3110135","title":"A Highly Robust and Low-Power Real-Time Double Node Upset Self-Healing Latch for Radiation-Prone Applications","display_name":"A Highly Robust and Low-Power Real-Time Double Node Upset Self-Healing Latch for Radiation-Prone Applications","publication_year":2021,"publication_date":"2021-09-15","ids":{"openalex":"https://openalex.org/W3199363867","doi":"https://doi.org/10.1109/tvlsi.2021.3110135","mag":"3199363867"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2021.3110135","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2021.3110135","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101522862","display_name":"Sandeep Kumar","orcid":"https://orcid.org/0000-0002-1342-7658"},"institutions":[{"id":"https://openalex.org/I16292982","display_name":"National Institute of Technology Rourkela","ror":"https://ror.org/011gmn932","country_code":"IN","type":"education","lineage":["https://openalex.org/I16292982"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sandeep Kumar","raw_affiliation_strings":["Department of Electronics and Communication, National Institute of Technology Rourkela, Rourkela, Odisha, India"],"raw_orcid":"https://orcid.org/0000-0002-1342-7658","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication, National Institute of Technology Rourkela, Rourkela, Odisha, India","institution_ids":["https://openalex.org/I16292982"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070724857","display_name":"Atin Mukherjee","orcid":"https://orcid.org/0000-0002-5887-3563"},"institutions":[{"id":"https://openalex.org/I16292982","display_name":"National Institute of Technology Rourkela","ror":"https://ror.org/011gmn932","country_code":"IN","type":"education","lineage":["https://openalex.org/I16292982"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Atin Mukherjee","raw_affiliation_strings":["Department of Electronics and Communication, National Institute of Technology Rourkela, Rourkela, Odisha, India"],"raw_orcid":"https://orcid.org/0000-0002-5887-3563","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication, National Institute of Technology Rourkela, Rourkela, Odisha, India","institution_ids":["https://openalex.org/I16292982"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I16292982"],"apc_list":null,"apc_paid":null,"fwci":2.9504,"has_fulltext":false,"cited_by_count":46,"citation_normalized_percentile":{"value":0.91631699,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"29","issue":"12","first_page":"2076","last_page":"2085"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.7846314907073975},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.7255654335021973},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.628611147403717},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.5671190023422241},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5532525777816772},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.4650583863258362},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45324742794036865},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.4289969205856323},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.42504510283470154},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.27070608735084534},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23799735307693481},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.18459033966064453},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.1719786822795868}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.7846314907073975},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.7255654335021973},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.628611147403717},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.5671190023422241},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5532525777816772},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.4650583863258362},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45324742794036865},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.4289969205856323},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.42504510283470154},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.27070608735084534},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23799735307693481},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.18459033966064453},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.1719786822795868},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2021.3110135","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2021.3110135","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8199999928474426}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1659671481","https://openalex.org/W1899181454","https://openalex.org/W1969390180","https://openalex.org/W1980433502","https://openalex.org/W1993686617","https://openalex.org/W1996526778","https://openalex.org/W2015524290","https://openalex.org/W2023659251","https://openalex.org/W2042037542","https://openalex.org/W2059921100","https://openalex.org/W2138724413","https://openalex.org/W2277435279","https://openalex.org/W2293212301","https://openalex.org/W2443429837","https://openalex.org/W2558274594","https://openalex.org/W2574088239","https://openalex.org/W2578302800","https://openalex.org/W2587844224","https://openalex.org/W2753348980","https://openalex.org/W2769731910","https://openalex.org/W2808868355","https://openalex.org/W2894057114","https://openalex.org/W2908633424","https://openalex.org/W2908947028","https://openalex.org/W2954322948","https://openalex.org/W2984745851","https://openalex.org/W2997361554","https://openalex.org/W3000209635","https://openalex.org/W3003557214","https://openalex.org/W3010963881","https://openalex.org/W3088899692","https://openalex.org/W3092247271","https://openalex.org/W3135298190","https://openalex.org/W6665620092"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2123934961","https://openalex.org/W2765704306","https://openalex.org/W1540420234","https://openalex.org/W58658798","https://openalex.org/W2161646799","https://openalex.org/W2359969304","https://openalex.org/W2062230033","https://openalex.org/W2271512713","https://openalex.org/W2051487197"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,23],"single":[4],"event":[5],"double":[6],"node":[7],"upset":[8],"(SEDNU)":[9],"self-healing":[10,57],"(DNUSH)":[11],"latch":[12,29,62,80,109,141],"to":[13,46,101,127,152,158],"meet":[14],"the":[15,19,48,53,60,67,78,95,102,128,135,139,143,159],"high-robustness":[16],"requirement":[17],"of":[18,59,138],"applications":[20],"used":[21],"in":[22,115,119],"harsh":[24],"radiation":[25,54],"environment.":[26],"The":[27,56,107],"DNUSH":[28],"is":[30,63],"based":[31],"on":[32,111],"dual":[33],"modular":[34],"redundancy":[35],"and":[36,40,93,122,146],"mainly":[37],"employs":[38],"C-elements":[39],"inverters,":[41],"forming":[42],"multi-feedback":[43],"interlocked":[44],"loops":[45],"retain":[47],"correct":[49],"data":[50],"even":[51,89],"after":[52],"event.":[55],"capability":[58],"proposed":[61,79,108,140],"successfully":[64],"shown":[65],"by":[66],"fault":[68],"injection":[69],"simulation":[70],"using":[71],"Synopsys":[72],"HSPICE.":[73],"Simulation":[74],"results":[75],"show":[76],"that":[77],"can":[81],"self-heal":[82],"from":[83],"all":[84],"SEDNUs,":[85],"consumes":[86],"low":[87,155],"power":[88,120],"for":[90],"high-speed":[91],"operations,":[92],"has":[94],"least":[96],"power-delay-area":[97],"product":[98],"(PDAP)":[99],"compared":[100,126],"existing":[103,129],"SEDNU":[104,130],"resilient":[105,131],"latches.":[106,132,161],"offers":[110],"average":[112],"51.25%":[113],"improvement":[114],"speed,":[116],"22.67%":[117],"saving":[118],"consumption,":[121],"59.74%":[123],"lower":[124],"PDAP":[125],"In":[133],"addition,":[134],"sensitivity":[136],"assessment":[137],"against":[142],"process,":[144],"voltage,":[145],"temperature":[147],"(PVT)":[148],"variations":[149],"are":[150],"found":[151],"be":[153],"either":[154],"or":[156],"equivalent":[157],"reference":[160]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":13},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":14},{"year":2022,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}