{"id":"https://openalex.org/W3131087780","doi":"https://doi.org/10.1109/tvlsi.2021.3056674","title":"A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory","display_name":"A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory","publication_year":2021,"publication_date":"2021-02-20","ids":{"openalex":"https://openalex.org/W3131087780","doi":"https://doi.org/10.1109/tvlsi.2021.3056674","mag":"3131087780"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2021.3056674","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2021.3056674","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100422096","display_name":"Rui Zhang","orcid":"https://orcid.org/0000-0002-8273-5769"},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rui Zhang","raw_affiliation_strings":["Cadence Design Systems, Inc., San Jose, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-8273-5769","affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025591564","display_name":"Kexin Yang","orcid":"https://orcid.org/0000-0002-3630-1003"},"institutions":[{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kexin Yang","raw_affiliation_strings":["Synopsys Inc., Mountain View, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-3630-1003","affiliations":[{"raw_affiliation_string":"Synopsys Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070698492","display_name":"Zhaocheng Liu","orcid":"https://orcid.org/0000-0001-6623-9231"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhaocheng Liu","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0001-6623-9231","affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014655929","display_name":"Taizhi Liu","orcid":"https://orcid.org/0000-0001-5057-4916"},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Taizhi Liu","raw_affiliation_strings":["Cadence Design Systems, Inc., San Jose, CA, USA"],"raw_orcid":"https://orcid.org/0000-0001-5057-4916","affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003762748","display_name":"Wenshan Cai","orcid":"https://orcid.org/0000-0002-6367-3857"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wenshan Cai","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0002-6367-3857","affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032107826","display_name":"Linda Milor","orcid":"https://orcid.org/0000-0002-8244-4793"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Linda Milor","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0002-8244-4793","affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7119,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.68797226,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"29","issue":"5","first_page":"857","last_page":"870"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cache","display_name":"Cache","score":0.7513648271560669},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6440705060958862},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6163911819458008},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.49848461151123047},{"id":"https://openalex.org/keywords/cpu-cache","display_name":"CPU cache","score":0.48001164197921753},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4697675406932831},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44016560912132263},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42139649391174316},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3890971541404724},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.18945810198783875},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.17448773980140686},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17386385798454285},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.13344958424568176}],"concepts":[{"id":"https://openalex.org/C115537543","wikidata":"https://www.wikidata.org/wiki/Q165596","display_name":"Cache","level":2,"score":0.7513648271560669},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6440705060958862},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6163911819458008},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.49848461151123047},{"id":"https://openalex.org/C189783530","wikidata":"https://www.wikidata.org/wiki/Q352090","display_name":"CPU cache","level":3,"score":0.48001164197921753},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4697675406932831},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44016560912132263},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42139649391174316},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3890971541404724},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.18945810198783875},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.17448773980140686},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17386385798454285},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.13344958424568176},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2021.3056674","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2021.3056674","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.41999998688697815,"display_name":"Peace, Justice and strong institutions"}],"awards":[{"id":"https://openalex.org/G6738630795","display_name":"PFI:AIR - TT:  RelMaster:  Towards a Reliability Simulation Toolset","funder_award_id":"1700914","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":95,"referenced_works":["https://openalex.org/W1500230652","https://openalex.org/W1591251167","https://openalex.org/W1600691640","https://openalex.org/W1936959814","https://openalex.org/W1979684454","https://openalex.org/W1990737370","https://openalex.org/W1998798369","https://openalex.org/W2002612140","https://openalex.org/W2004965314","https://openalex.org/W2020404011","https://openalex.org/W2021708499","https://openalex.org/W2050206302","https://openalex.org/W2051258003","https://openalex.org/W2073818373","https://openalex.org/W2075614785","https://openalex.org/W2099135131","https://openalex.org/W2101234009","https://openalex.org/W2101307080","https://openalex.org/W2102201073","https://openalex.org/W2103234243","https://openalex.org/W2106339466","https://openalex.org/W2110092670","https://openalex.org/W2117076170","https://openalex.org/W2117608378","https://openalex.org/W2122497527","https://openalex.org/W2130038216","https://openalex.org/W2134777311","https://openalex.org/W2136393784","https://openalex.org/W2138595806","https://openalex.org/W2141126966","https://openalex.org/W2142796540","https://openalex.org/W2144512449","https://openalex.org/W2147657366","https://openalex.org/W2151218494","https://openalex.org/W2153258655","https://openalex.org/W2154654096","https://openalex.org/W2155275912","https://openalex.org/W2157447136","https://openalex.org/W2159087234","https://openalex.org/W2160285928","https://openalex.org/W2161648335","https://openalex.org/W2161812133","https://openalex.org/W2162734816","https://openalex.org/W2170382128","https://openalex.org/W2172037169","https://openalex.org/W2289536574","https://openalex.org/W2321543641","https://openalex.org/W2325092268","https://openalex.org/W2344272183","https://openalex.org/W2524051560","https://openalex.org/W2524971917","https://openalex.org/W2527063156","https://openalex.org/W2539566014","https://openalex.org/W2540920206","https://openalex.org/W2581035600","https://openalex.org/W2621017693","https://openalex.org/W2625049244","https://openalex.org/W2760037701","https://openalex.org/W2771106765","https://openalex.org/W2789777840","https://openalex.org/W2791293351","https://openalex.org/W2802502993","https://openalex.org/W2804691385","https://openalex.org/W2810791347","https://openalex.org/W2811152459","https://openalex.org/W2888422814","https://openalex.org/W2892329555","https://openalex.org/W2935281756","https://openalex.org/W2941465967","https://openalex.org/W2942925640","https://openalex.org/W2943359920","https://openalex.org/W2943604793","https://openalex.org/W2945363071","https://openalex.org/W2967902529","https://openalex.org/W2975552006","https://openalex.org/W2976960932","https://openalex.org/W2980495448","https://openalex.org/W2996635796","https://openalex.org/W3001416760","https://openalex.org/W3013914417","https://openalex.org/W3015086970","https://openalex.org/W3081624433","https://openalex.org/W3149249597","https://openalex.org/W4231535434","https://openalex.org/W4245661807","https://openalex.org/W4249144718","https://openalex.org/W6636104797","https://openalex.org/W6640183753","https://openalex.org/W6675354045","https://openalex.org/W6676171248","https://openalex.org/W6680178178","https://openalex.org/W6683588402","https://openalex.org/W6683923090","https://openalex.org/W6727453392","https://openalex.org/W6732342490"],"related_works":["https://openalex.org/W2119312496","https://openalex.org/W4247460323","https://openalex.org/W2537086382","https://openalex.org/W2107909712","https://openalex.org/W2153162275","https://openalex.org/W2079259690","https://openalex.org/W789543267","https://openalex.org/W2075972383","https://openalex.org/W2108986771","https://openalex.org/W2132842408"],"abstract_inverted_index":{"This":[0,101],"article":[1],"describes":[2],"a":[3,50],"comprehensive":[4],"framework":[5,29,102],"for":[6,56],"analysis":[7],"of":[8,12,31,40,44,117,159,172,178],"time-dependent":[9],"performance-reliability":[10,41,45],"degradation":[11,61],"an":[13],"SRAM":[14,109],"cache,":[15],"considering":[16],"cache":[17,111],"configurations,":[18,113],"process":[19],"parameters":[20,161],"and":[21,26,38,76,119,125,131,148,168,175,182],"their":[22],"variations,":[23],"supply":[24],"voltage,":[25],"aging.":[27],"The":[28,81],"consists":[30],"three":[32],"parts:":[33],"microprocessor":[34],"emulation,":[35],"activity":[36],"extraction,":[37],"evaluation":[39],"metrics.":[42],"Evaluation":[43],"metrics":[46],"is":[47],"implemented":[48],"with":[49,93],"prediction":[51],"engine":[52],"involving":[53],"regression":[54,82],"models":[55,83],"the":[57,129,157,163,169,173,176],"metrics,":[58],"which":[59],"evaluates":[60],"due":[62],"to":[63,106],"various":[64],"wearout":[65],"mechanisms,":[66],"including":[67],"bias":[68],"temperature":[69],"instability":[70],"(BTI),":[71],"hot":[72],"carrier":[73],"injection":[74],"(HCI),":[75],"random":[77],"telegraph":[78],"noise":[79,150],"(RTN).":[80],"not":[84],"only":[85],"enable":[86],"more":[87],"than":[88],"100\u00d7":[89],"faster":[90],"computation":[91],"compared":[92],"SPICE":[94],"simulations":[95],"but":[96],"also":[97,155],"protect":[98],"intellectual":[99],"property.":[100],"has":[103],"been":[104],"applied":[105],"study":[107],"how":[108],"instruction":[110],"(I-Cache)":[112],"cell":[114],"structure,":[115],"inclusion":[116],"RTN":[118],"gate":[120],"length":[121],"variation,":[122],"voltage":[123],"scaling,":[124],"stress":[126],"time":[127],"affect":[128],"performance":[130],"reliability":[132],"parameters,":[133],"such":[134],"as":[135],"access":[136],"time,":[137],"leakage":[138],"power,":[139],"critical":[140],"charge":[141],"(":[142],"Q":[143],"<sub":[144],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[145],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">crit</sub>":[146],"),":[147],"static":[149],"margin":[151],"(SNM).":[152],"We":[153],"have":[154],"studied":[156],"impact":[158,177],"configuration":[160],"on":[162],"soft":[164],"error":[165,180,184,187],"rate":[166,171],"(SER)":[167],"hit":[170],"I-Cache,":[174],"single":[179],"correction":[181],"double":[183],"detection":[185],"(SECDED)":[186],"correcting":[188],"codes":[189],"(ECCs).":[190]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-22T08:00:12.763002","created_date":"2025-10-10T00:00:00"}