{"id":"https://openalex.org/W3121036806","doi":"https://doi.org/10.1109/tvlsi.2020.3045417","title":"Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits","display_name":"Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits","publication_year":2021,"publication_date":"2021-01-10","ids":{"openalex":"https://openalex.org/W3121036806","doi":"https://doi.org/10.1109/tvlsi.2020.3045417","mag":"3121036806"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2020.3045417","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2020.3045417","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052051759","display_name":"Sanmitra Banerjee","orcid":"https://orcid.org/0000-0002-1136-9220"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanmitra Banerjee","raw_affiliation_strings":["Duke University, Durham, NC, USA"],"raw_orcid":"https://orcid.org/0000-0002-1136-9220","affiliations":[{"raw_affiliation_string":"Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090354528","display_name":"Arjun Chaudhuri","orcid":"https://orcid.org/0000-0001-9353-6397"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arjun Chaudhuri","raw_affiliation_strings":["Duke University, Durham, NC, USA"],"raw_orcid":"https://orcid.org/0000-0001-9353-6397","affiliations":[{"raw_affiliation_string":"Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001224648","display_name":"August Ning","orcid":"https://orcid.org/0000-0002-3331-7958"},"institutions":[{"id":"https://openalex.org/I20089843","display_name":"Princeton University","ror":"https://ror.org/00hx57361","country_code":"US","type":"education","lineage":["https://openalex.org/I20089843"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"August Ning","raw_affiliation_strings":["Princeton University, Princeton, NJ, USA"],"raw_orcid":"https://orcid.org/0000-0002-3331-7958","affiliations":[{"raw_affiliation_string":"Princeton University, Princeton, NJ, USA","institution_ids":["https://openalex.org/I20089843"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Duke University, Durham, NC, USA"],"raw_orcid":"https://orcid.org/0000-0003-4475-6435","affiliations":[{"raw_affiliation_string":"Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.3597,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.8797856,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"29","issue":"2","first_page":"409","last_page":"422"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7842200994491577},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.6499863862991333},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5886529088020325},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5761081576347351},{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.5571423172950745},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4638621211051941},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4479500651359558},{"id":"https://openalex.org/keywords/propagation-delay","display_name":"Propagation delay","score":0.4334458112716675},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.42758506536483765},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.418315589427948},{"id":"https://openalex.org/keywords/delay-calculation","display_name":"Delay calculation","score":0.4132216274738312},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4106155037879944},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40863117575645447},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3999547064304352},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.24276533722877502},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.22139966487884521},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2144359052181244},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12176698446273804},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10150456428527832},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09850013256072998}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7842200994491577},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.6499863862991333},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5886529088020325},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5761081576347351},{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.5571423172950745},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4638621211051941},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4479500651359558},{"id":"https://openalex.org/C90806461","wikidata":"https://www.wikidata.org/wiki/Q1144416","display_name":"Propagation delay","level":2,"score":0.4334458112716675},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.42758506536483765},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.418315589427948},{"id":"https://openalex.org/C174086752","wikidata":"https://www.wikidata.org/wiki/Q5253471","display_name":"Delay calculation","level":3,"score":0.4132216274738312},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4106155037879944},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40863117575645447},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3999547064304352},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.24276533722877502},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.22139966487884521},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2144359052181244},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12176698446273804},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10150456428527832},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09850013256072998},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2020.3045417","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2020.3045417","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.4099999964237213,"id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G7088081242","display_name":null,"funder_award_id":"HR001118C0096","funder_id":"https://openalex.org/F4320332180","funder_display_name":"Defense Advanced Research Projects Agency"}],"funders":[{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":51,"referenced_works":["https://openalex.org/W346138648","https://openalex.org/W770521010","https://openalex.org/W1526219215","https://openalex.org/W1792978019","https://openalex.org/W1804063983","https://openalex.org/W1967125811","https://openalex.org/W1977992106","https://openalex.org/W2037102348","https://openalex.org/W2040679505","https://openalex.org/W2048719801","https://openalex.org/W2095754347","https://openalex.org/W2100890870","https://openalex.org/W2103873102","https://openalex.org/W2111665637","https://openalex.org/W2113336541","https://openalex.org/W2118138621","https://openalex.org/W2119826888","https://openalex.org/W2120116751","https://openalex.org/W2123162799","https://openalex.org/W2125532363","https://openalex.org/W2138085193","https://openalex.org/W2140288260","https://openalex.org/W2148034305","https://openalex.org/W2150665550","https://openalex.org/W2154695555","https://openalex.org/W2166350871","https://openalex.org/W2171187927","https://openalex.org/W2243709097","https://openalex.org/W2291951321","https://openalex.org/W2293143078","https://openalex.org/W2293258669","https://openalex.org/W2314349665","https://openalex.org/W2328235892","https://openalex.org/W2503109220","https://openalex.org/W2509518188","https://openalex.org/W2534859347","https://openalex.org/W2775446393","https://openalex.org/W2785930429","https://openalex.org/W2903561922","https://openalex.org/W2970187632","https://openalex.org/W2979746556","https://openalex.org/W3001290849","https://openalex.org/W3010986276","https://openalex.org/W3089000715","https://openalex.org/W3140564856","https://openalex.org/W3144591591","https://openalex.org/W4254506919","https://openalex.org/W6638258417","https://openalex.org/W6638598955","https://openalex.org/W6690459523","https://openalex.org/W6696725276"],"related_works":["https://openalex.org/W1544420370","https://openalex.org/W2999380228","https://openalex.org/W3015599398","https://openalex.org/W2188730438","https://openalex.org/W2792778858","https://openalex.org/W2157230896","https://openalex.org/W2144939152","https://openalex.org/W2034656493","https://openalex.org/W1609925765","https://openalex.org/W2362904186"],"abstract_inverted_index":{"Sensitivity":[0],"to":[1,67,197],"process":[2,49,103],"variations":[3,50,75],"and":[4,25,53,123,192],"manufacturing":[5,13],"defects":[6],"are":[7,37],"major":[8],"showstoppers":[9],"for":[10,128],"the":[11,82,90,96,112,139,150,155,167,178,187],"high-volume":[12],"of":[14,92,135,149,180],"carbon":[15],"nanotube":[16],"field-effect":[17],"transistors":[18],"(CNFETs).":[19],"These":[20],"imperfections":[21],"affect":[22],"gate":[23],"delay":[24,93,114],"may":[26],"remain":[27],"undetected":[28],"when":[29,164],"test":[30,43,87,147,171,181],"patterns":[31,88,144,182],"obtained":[32],"using":[33],"conventional":[34,168],"test-generation":[35],"techniques":[36],"used.":[38],"We":[39,131,158],"propose":[40],"a":[41,63,78,120,124,133,146,174],"new":[42],"generation":[44],"method":[45,71,107,189],"that":[46,76,161],"takes":[47],"CNFET-specific":[48],"into":[51],"account":[52],"identifies":[54],"multiple":[55,129],"testable":[56],"long":[57],"paths":[58],"through":[59,95],"each":[60],"node":[61],"in":[62,111,138,177],"netlist.":[64],"In":[65],"contrast":[66],"state-of-the-art":[68,121],"techniques,":[69],"our":[70,143,162],"can":[72,193],"also":[73,159],"handle":[74],"have":[77],"nonlinear":[79],"impact":[80],"on":[81],"propagation":[83],"delay.":[84],"The":[85,105],"generated":[86,153],"ensure":[89],"detection":[91],"faults":[94],"longest":[97],"path,":[98],"even":[99],"under":[100,183],"random":[101,184],"CNFET":[102],"variations.":[104,185],"proposed":[106,188],"shows":[108],"significant":[109,175],"improvement":[110,137,176],"statistical":[113],"quality":[115,179],"level":[116],"(SDQL)":[117],"compared":[118],"with":[119,166],"technique":[122],"commercial":[125,156],"ATPG":[126],"tool":[127],"benchmarks.":[130],"observed":[132],"minimum":[134],"17.1%":[136],"SDQL":[140],"offered":[141],"by":[142,154],"over":[145],"set":[148],"same":[151],"size":[152],"tool.":[157],"show":[160],"method,":[163],"integrated":[165],"transition":[169],"fault":[170],"flow,":[172],"offers":[173],"Moreover,":[186],"is":[190],"flexible":[191],"be":[194],"easily":[195],"extended":[196],"other":[198],"emerging":[199],"device":[200],"technologies.":[201]},"counts_by_year":[{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}