{"id":"https://openalex.org/W3027739090","doi":"https://doi.org/10.1109/tvlsi.2020.2992982","title":"HYFII: HYbrid Fault Injection Infrastructure for Accurate Runtime System Failure Analysis","display_name":"HYFII: HYbrid Fault Injection Infrastructure for Accurate Runtime System Failure Analysis","publication_year":2020,"publication_date":"2020-05-20","ids":{"openalex":"https://openalex.org/W3027739090","doi":"https://doi.org/10.1109/tvlsi.2020.2992982","mag":"3027739090"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2020.2992982","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2020.2992982","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051217701","display_name":"Sung-Min Jang","orcid":"https://orcid.org/0000-0002-4044-1965"},"institutions":[{"id":"https://openalex.org/I113825674","display_name":"Handong Global University","ror":"https://ror.org/00txhkt32","country_code":"KR","type":"education","lineage":["https://openalex.org/I113825674"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sungmin Jang","raw_affiliation_strings":["School of Computer Science and Electrical Engineering, Handong Global University, Pohang, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Electrical Engineering, Handong Global University, Pohang, South Korea","institution_ids":["https://openalex.org/I113825674"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100755794","display_name":"Jaeyoung Park","orcid":"https://orcid.org/0000-0003-0220-5977"},"institutions":[{"id":"https://openalex.org/I113825674","display_name":"Handong Global University","ror":"https://ror.org/00txhkt32","country_code":"KR","type":"education","lineage":["https://openalex.org/I113825674"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaeyoung Park","raw_affiliation_strings":["School of Computer Science and Electrical Engineering, Handong Global University, Pohang, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Electrical Engineering, Handong Global University, Pohang, South Korea","institution_ids":["https://openalex.org/I113825674"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5051217701"],"corresponding_institution_ids":["https://openalex.org/I113825674"],"apc_list":null,"apc_paid":null,"fwci":0.2055,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.49660773,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"28","issue":"8","first_page":"1893","last_page":"1900"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7228190898895264},{"id":"https://openalex.org/keywords/workload","display_name":"Workload","score":0.6136876940727234},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6077843308448792},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6049756407737732},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5968925952911377},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5653128027915955},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5306645035743713},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.48698195815086365},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45783188939094543},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.44164878129959106},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.43892166018486023},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.40586790442466736},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39021962881088257},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23277872800827026},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2158852517604828},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11818557977676392},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08283030986785889}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7228190898895264},{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.6136876940727234},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6077843308448792},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6049756407737732},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5968925952911377},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5653128027915955},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5306645035743713},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48698195815086365},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45783188939094543},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.44164878129959106},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.43892166018486023},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.40586790442466736},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39021962881088257},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23277872800827026},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2158852517604828},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11818557977676392},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08283030986785889},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2020.2992982","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2020.2992982","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6200000047683716,"display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G4459614738","display_name":null,"funder_award_id":"201901760001","funder_id":"https://openalex.org/F4320325831","funder_display_name":"Handong Global University"},{"id":"https://openalex.org/G7111856579","display_name":null,"funder_award_id":"P0008763","funder_id":"https://openalex.org/F4320322064","funder_display_name":"Korea Institute for Advancement of Technology"}],"funders":[{"id":"https://openalex.org/F4320322064","display_name":"Korea Institute for Advancement of Technology","ror":"https://ror.org/015w1qa96"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"},{"id":"https://openalex.org/F4320325831","display_name":"Handong Global University","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W188802254","https://openalex.org/W1590082925","https://openalex.org/W1793316485","https://openalex.org/W1858997460","https://openalex.org/W1964782602","https://openalex.org/W1971700309","https://openalex.org/W1972649107","https://openalex.org/W1981812191","https://openalex.org/W2010966375","https://openalex.org/W2038366891","https://openalex.org/W2044409420","https://openalex.org/W2046178430","https://openalex.org/W2095730858","https://openalex.org/W2103323734","https://openalex.org/W2105407012","https://openalex.org/W2121655299","https://openalex.org/W2130720335","https://openalex.org/W2133512509","https://openalex.org/W2134864637","https://openalex.org/W2152406824","https://openalex.org/W2159889776","https://openalex.org/W2169213530","https://openalex.org/W2337485678","https://openalex.org/W2399820558","https://openalex.org/W2522616335","https://openalex.org/W2543312069","https://openalex.org/W2952709376","https://openalex.org/W3103203472","https://openalex.org/W4251853244","https://openalex.org/W4253998042","https://openalex.org/W6712671749","https://openalex.org/W6729030688","https://openalex.org/W6948119516"],"related_works":["https://openalex.org/W2340957901","https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W2068571131","https://openalex.org/W2115005577","https://openalex.org/W2092357065","https://openalex.org/W1555400249","https://openalex.org/W2952274626","https://openalex.org/W2913077774","https://openalex.org/W3147038789"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"we":[3],"propose":[4],"an":[5,102,106],"efficient":[6],"circuit":[7,45],"reliability":[8],"analysis":[9],"infrastructure":[10],"utilizing":[11],"on-demand":[12],"transistor-accurate":[13],"fault":[14,41,67,71,94],"injection":[15,72,128],"based":[16,80],"on":[17,81,101,108],"workload-specific":[18,82],"distributional":[19],"properties.":[20],"A":[21,43],"novel":[22,66],"two-phase":[23],"approach":[24],"is":[25,47,56],"developed":[26],"to":[27,62],"achieve":[28],"circuit-level":[29,131],"accuracy,":[30],"via":[31,38],"careful":[32],"transistor-level":[33],"precharacterization,":[34],"and":[35,50,70,85],"gate-level":[36],"efficiency,":[37],"fast":[39],"runtime":[40,61],"generation.":[42],"time-consuming":[44],"characterization":[46],"performed":[48],"once,":[49],"the":[51,54,92,98,116,119],"result":[52],"of":[53],"precharacterization":[55],"used":[57],"multiple":[58],"times":[59],"at":[60],"inject":[63],"faults.":[64],"Also,":[65],"probability":[68],"estimation":[69],"methods":[73],"are":[74,78,87],"developed.":[75],"Fault":[76],"probabilities":[77],"computed":[79,93],"voltage/temperature":[83],"distribution,":[84],"faults":[86],"injected":[88],"efficiently":[89],"by":[90],"scaling":[91],"probabilities.":[95],"We":[96],"demonstrate":[97],"proposed":[99],"methodology":[100],"OpenSPARC":[103],"core":[104],"targeting":[105],"implementation":[107],"a":[109],"32-nm":[110],"technology":[111],"node.":[112],"Analysis":[113],"indicates":[114],"that":[115],"injector":[117],"computes":[118],"system":[120],"failure":[121],"rate":[122],"with":[123],"0.1-ms":[124],"simulation":[125],"overhead":[126],"per":[127],"while":[129],"having":[130],"accuracy.":[132]},"counts_by_year":[{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}