{"id":"https://openalex.org/W3022450020","doi":"https://doi.org/10.1109/tvlsi.2020.2988204","title":"Error Probability Models for Voltage-Scaled Multiply-Accumulate Units","display_name":"Error Probability Models for Voltage-Scaled Multiply-Accumulate Units","publication_year":2020,"publication_date":"2020-05-07","ids":{"openalex":"https://openalex.org/W3022450020","doi":"https://doi.org/10.1109/tvlsi.2020.2988204","mag":"3022450020"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2020.2988204","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2020.2988204","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040915860","display_name":"Mallika Rathore","orcid":"https://orcid.org/0000-0002-3829-3887"},"institutions":[{"id":"https://openalex.org/I59553526","display_name":"Stony Brook University","ror":"https://ror.org/05qghxh33","country_code":"US","type":"education","lineage":["https://openalex.org/I59553526"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mallika Rathore","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Stony Brook University, Stony Brook, USA"],"raw_orcid":"https://orcid.org/0000-0002-3829-3887","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Stony Brook University, Stony Brook, USA","institution_ids":["https://openalex.org/I59553526"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061612911","display_name":"Peter Milder","orcid":"https://orcid.org/0000-0003-1146-3011"},"institutions":[{"id":"https://openalex.org/I59553526","display_name":"Stony Brook University","ror":"https://ror.org/05qghxh33","country_code":"US","type":"education","lineage":["https://openalex.org/I59553526"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peter Milder","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Stony Brook University, Stony Brook, USA"],"raw_orcid":"https://orcid.org/0000-0003-1146-3011","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Stony Brook University, Stony Brook, USA","institution_ids":["https://openalex.org/I59553526"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061262597","display_name":"Emre Salman","orcid":"https://orcid.org/0000-0001-6538-6803"},"institutions":[{"id":"https://openalex.org/I59553526","display_name":"Stony Brook University","ror":"https://ror.org/05qghxh33","country_code":"US","type":"education","lineage":["https://openalex.org/I59553526"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Emre Salman","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Stony Brook University, Stony Brook, USA"],"raw_orcid":"https://orcid.org/0000-0001-6538-6803","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Stony Brook University, Stony Brook, USA","institution_ids":["https://openalex.org/I59553526"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I59553526"],"apc_list":null,"apc_paid":null,"fwci":0.9085,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.73602503,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"28","issue":"7","first_page":"1665","last_page":"1675"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.7058154940605164},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6620169878005981},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.5588661432266235},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5477534532546997},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5097331404685974},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.47323310375213623},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.47182732820510864},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4622492492198944},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.4537522792816162},{"id":"https://openalex.org/keywords/efficient-energy-use","display_name":"Efficient energy use","score":0.4407191276550293},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.41527071595191956},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21084770560264587},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15833264589309692},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11333942413330078},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10541316866874695}],"concepts":[{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.7058154940605164},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6620169878005981},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.5588661432266235},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5477534532546997},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5097331404685974},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.47323310375213623},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.47182732820510864},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4622492492198944},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.4537522792816162},{"id":"https://openalex.org/C2742236","wikidata":"https://www.wikidata.org/wiki/Q924713","display_name":"Efficient energy use","level":2,"score":0.4407191276550293},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.41527071595191956},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21084770560264587},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15833264589309692},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11333942413330078},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10541316866874695},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2020.2988204","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2020.2988204","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8299999833106995,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":45,"referenced_works":["https://openalex.org/W587794757","https://openalex.org/W601886942","https://openalex.org/W658677875","https://openalex.org/W1641485181","https://openalex.org/W2026005150","https://openalex.org/W2030922317","https://openalex.org/W2038840127","https://openalex.org/W2054591439","https://openalex.org/W2069345435","https://openalex.org/W2094935094","https://openalex.org/W2116739712","https://openalex.org/W2119144962","https://openalex.org/W2135100177","https://openalex.org/W2136103183","https://openalex.org/W2289252105","https://openalex.org/W2319920447","https://openalex.org/W2326765630","https://openalex.org/W2406293284","https://openalex.org/W2466675884","https://openalex.org/W2516141709","https://openalex.org/W2562773490","https://openalex.org/W2606722458","https://openalex.org/W2629157711","https://openalex.org/W2767260595","https://openalex.org/W2774688396","https://openalex.org/W2799026378","https://openalex.org/W2801707638","https://openalex.org/W2908707593","https://openalex.org/W2963024689","https://openalex.org/W2963640628","https://openalex.org/W2963674932","https://openalex.org/W2964299589","https://openalex.org/W2966644307","https://openalex.org/W2997828269","https://openalex.org/W3139678091","https://openalex.org/W4231727700","https://openalex.org/W4238485759","https://openalex.org/W4242577057","https://openalex.org/W4301756919","https://openalex.org/W6617368339","https://openalex.org/W6674491542","https://openalex.org/W6677580257","https://openalex.org/W6700264148","https://openalex.org/W6713184358","https://openalex.org/W6766666643"],"related_works":["https://openalex.org/W4378770497","https://openalex.org/W2049584446","https://openalex.org/W2079781215","https://openalex.org/W4385571583","https://openalex.org/W2064404759","https://openalex.org/W4389519396","https://openalex.org/W4308245303","https://openalex.org/W2014033564","https://openalex.org/W2910573937","https://openalex.org/W1503315192"],"abstract_inverted_index":{"Energy":[0],"efficiency":[1],"is":[2,74],"a":[3],"critical":[4],"design":[5],"objective":[6],"in":[7,48],"deep":[8],"learning":[9,15],"hardware,":[10],"particularly":[11],"for":[12],"real-time":[13],"machine":[14],"applications":[16,30],"where":[17],"the":[18,54,71,87,110,113],"processing":[19],"takes":[20],"place":[21],"on":[22,59,92,118],"resource-constrained":[23],"platforms.":[24],"The":[25,68],"inherent":[26],"resilience":[27],"of":[28,56,65,70,112,115],"these":[29,119],"to":[31,39,51,85,108],"error":[32,43,60],"makes":[33],"voltage":[34,57,116],"scaling":[35,58,117],"an":[36],"attractive":[37],"method":[38],"enhance":[40],"efficiency.":[41],"Timing":[42],"probability":[44],"models":[45,73,81],"are":[46,82,106],"proposed":[47,72],"this":[49],"article":[50],"better":[52],"understand":[53],"effects":[55,114],"rates":[61],"and":[62,99],"power":[63],"consumption":[64],"multiply-accumulate":[66],"units.":[67],"accuracy":[69],"demonstrated":[75],"via":[76],"Monte":[77],"Carlo":[78],"simulations.":[79,95],"These":[80],"then":[83],"used":[84],"quantify":[86],"related":[88],"tradeoffs":[89],"without":[90],"relying":[91],"time-consuming":[93],"hardware-level":[94],"Both":[96],"modern":[97],"FinFET":[98],"emerging":[100],"tunneling":[101],"field-effect":[102],"transistor":[103],"(TFET)":[104],"technologies":[105],"considered":[107],"explore":[109],"dependence":[111],"two":[120],"technologies.":[121]},"counts_by_year":[{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}