{"id":"https://openalex.org/W2945153161","doi":"https://doi.org/10.1109/tvlsi.2019.2912504","title":"A Linearity-Enhanced 10-Bit 160-MS/s SAR ADC With Low-Noise Comparator Technique","display_name":"A Linearity-Enhanced 10-Bit 160-MS/s SAR ADC With Low-Noise Comparator Technique","publication_year":2019,"publication_date":"2019-05-24","ids":{"openalex":"https://openalex.org/W2945153161","doi":"https://doi.org/10.1109/tvlsi.2019.2912504","mag":"2945153161"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2019.2912504","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2019.2912504","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083101939","display_name":"Daiguo Xu","orcid":"https://orcid.org/0000-0003-1461-599X"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Daiguo Xu","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0003-1461-599X","affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"Hequan Jiang","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hequan Jiang","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012469729","display_name":"Lei Qiu","orcid":"https://orcid.org/0000-0002-5688-7486"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Qiu","raw_affiliation_strings":["College of Electrical Information and Engineering, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-5688-7486","affiliations":[{"raw_affiliation_string":"College of Electrical Information and Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088403672","display_name":"Xiaoquan Yu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xiaoquan Yu","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015242933","display_name":"Jianan Wang","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jianan Wang","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085462947","display_name":"Zhengping Zhang","orcid":"https://orcid.org/0000-0002-2841-4868"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zhengping Zhang","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109705439","display_name":"Can Zhu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Can Zhu","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103805459","display_name":"Shiliu Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiliu Xu","raw_affiliation_strings":["School of Microelectronics and Solid-State Electronics, University of Electronic Science and Technology of China (UESTC), Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics and Solid-State Electronics, University of Electronic Science and Technology of China (UESTC), Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5083101939"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8972,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.71878624,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"27","issue":"9","first_page":"1990","last_page":"1997"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.8961980938911438},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.8792688846588135},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.8113667964935303},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.6496122479438782},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5602362155914307},{"id":"https://openalex.org/keywords/nyquist-rate","display_name":"Nyquist rate","score":0.5446840524673462},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5292990207672119},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.4965973496437073},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.4911003112792969},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4822986125946045},{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.47795677185058594},{"id":"https://openalex.org/keywords/12-bit","display_name":"12-bit","score":0.46173274517059326},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.43318748474121094},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.432951956987381},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32688283920288086},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2596081793308258},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.22494307160377502},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.10873249173164368},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10179808735847473}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.8961980938911438},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.8792688846588135},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.8113667964935303},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.6496122479438782},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5602362155914307},{"id":"https://openalex.org/C65914096","wikidata":"https://www.wikidata.org/wiki/Q6273772","display_name":"Nyquist rate","level":4,"score":0.5446840524673462},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5292990207672119},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.4965973496437073},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.4911003112792969},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4822986125946045},{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.47795677185058594},{"id":"https://openalex.org/C2776310492","wikidata":"https://www.wikidata.org/wiki/Q3271420","display_name":"12-bit","level":3,"score":0.46173274517059326},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.43318748474121094},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.432951956987381},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32688283920288086},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2596081793308258},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.22494307160377502},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.10873249173164368},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10179808735847473},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2019.2912504","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2019.2912504","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8500000238418579,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1515994202","https://openalex.org/W1896349585","https://openalex.org/W2001773162","https://openalex.org/W2048919215","https://openalex.org/W2053451635","https://openalex.org/W2054931442","https://openalex.org/W2064938289","https://openalex.org/W2078041332","https://openalex.org/W2101004723","https://openalex.org/W2110880033","https://openalex.org/W2146977045","https://openalex.org/W2167161290","https://openalex.org/W2169707891","https://openalex.org/W2175390874","https://openalex.org/W2335530728","https://openalex.org/W2343222450","https://openalex.org/W2343728099","https://openalex.org/W2529031619","https://openalex.org/W2587931883","https://openalex.org/W2760245843","https://openalex.org/W2763159958","https://openalex.org/W2801227755","https://openalex.org/W6651046883","https://openalex.org/W6662734339","https://openalex.org/W6663796909","https://openalex.org/W6666345469","https://openalex.org/W6676599623","https://openalex.org/W6681309360"],"related_works":["https://openalex.org/W2739351926","https://openalex.org/W2054018984","https://openalex.org/W2542593952","https://openalex.org/W1980428113","https://openalex.org/W3116897448","https://openalex.org/W1543240300","https://openalex.org/W2565946164","https://openalex.org/W4307567705","https://openalex.org/W2311845547","https://openalex.org/W4316660410"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,15,55,69,128,134],"linearity-enhanced":[4],"10-bit":[5],"160-MS/s":[6],"successive":[7],"approximation":[8],"register":[9],"(SAR)":[10],"analog-to-digital":[11],"converter":[12,96],"(ADC)":[13],"with":[14],"high-speed":[16],"and":[17,90,141,165],"low-noise":[18],"comparator.":[19],"A":[20],"p-well":[21],"floating":[22],"technique":[23,59,102],"for":[24],"linearity":[25],"improvement":[26],"of":[27,36,49,66,86,94,110,158],"sampling":[28,38,101,108],"switch":[29,39],"is":[30,40,52,60,80,103,117,170],"proposed.":[31],"The":[32,113,151],"total":[33],"parasitic":[34,50],"capacitance":[35,51],"the":[37,47,64,84,92,107,120,166],"depressed":[41],"compared":[42],"to":[43,62,82,105],"conventional":[44],"structures.":[45],"Also,":[46],"variation":[48],"reduced.":[53],"Furthermore,":[54],"substrate":[56],"voltage":[57],"boosting":[58],"proposed":[61,114],"depress":[63],"noise":[65],"comparator":[67],"at":[68,127,148,173],"high":[70],"conversion":[71],"rate.":[72],"In":[73],"addition,":[74],"an":[75,99,155],"improved":[76],"parallel":[77],"SAR":[78,87,111,115],"logic":[79],"exhibited":[81],"increase":[83,106],"speed":[85],"feedback":[88],"loop":[89],"enhance":[91],"settling":[93],"digital-to-analog":[95],"(DAC).":[97],"Last,":[98],"adaptive":[100],"utilized":[104],"time":[109],"ADC.":[112],"ADC":[116,152],"fabricated":[118],"in":[119],"65-nm":[121],"CMOS":[122],"process,":[123],"consuming":[124],"2":[125],"mW":[126],"1.2-V":[129],"power":[130],"supply.":[131],"It":[132],"achieves":[133],"signal-to-noise":[135],"distortion":[136],"ratio":[137],"(SNDR)":[138],">55.6":[139],"dB":[140,147],"spurious-free":[142],"dynamic":[143],"range":[144],"(SFDR)":[145],">69":[146],"160":[149],"MS/s.":[150],"core":[153],"occupies":[154],"active":[156],"area":[157],"0.023":[159],"mm":[160],"<sup":[161],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[162],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[163],",":[164],"corresponding":[167],"figure-of-merit":[168],"(FoM)":[169],"25.4":[171],"fJ/conversion-step":[172],"Nyquist":[174],"input.":[175]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}