{"id":"https://openalex.org/W2922461735","doi":"https://doi.org/10.1109/tvlsi.2019.2899890","title":"Modeling the Interdependences Between Voltage Fluctuation and BTI Aging","display_name":"Modeling the Interdependences Between Voltage Fluctuation and BTI Aging","publication_year":2019,"publication_date":"2019-03-12","ids":{"openalex":"https://openalex.org/W2922461735","doi":"https://doi.org/10.1109/tvlsi.2019.2899890","mag":"2922461735"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2019.2899890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2019.2899890","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.5445/ir/1000096491","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065141303","display_name":"Sami Salamin","orcid":"https://orcid.org/0000-0002-1044-7231"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sami Salamin","raw_affiliation_strings":["Chair of Embedded Systems, Karlsruhe Institute of Technology, Karlsruhe, Germany"],"raw_orcid":"https://orcid.org/0000-0002-1044-7231","affiliations":[{"raw_affiliation_string":"Chair of Embedded Systems, Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027765192","display_name":"Victor M. van Santen","orcid":"https://orcid.org/0000-0002-6629-4713"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Victor M. Van Santen","raw_affiliation_strings":["Chair of Embedded Systems, Karlsruhe Institute of Technology, Karlsruhe, Germany"],"raw_orcid":"https://orcid.org/0000-0002-6629-4713","affiliations":[{"raw_affiliation_string":"Chair of Embedded Systems, Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059133190","display_name":"Hussam Amrouch","orcid":"https://orcid.org/0000-0002-5649-3102"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["Chair of Embedded Systems, Karlsruhe Institute of Technology, Karlsruhe, Germany"],"raw_orcid":"https://orcid.org/0000-0002-5649-3102","affiliations":[{"raw_affiliation_string":"Chair of Embedded Systems, Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065901381","display_name":"Narendra Parihar","orcid":"https://orcid.org/0000-0003-3191-0333"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Narendra Parihar","raw_affiliation_strings":["Department of Electrical Engineering, IIT Bombay, Mumbai, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, IIT Bombay, Mumbai, India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057107600","display_name":"Souvik Mahapatra","orcid":"https://orcid.org/0000-0002-4516-766X"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Souvik Mahapatra","raw_affiliation_strings":["Department of Electrical Engineering, IIT Bombay, Mumbai, India"],"raw_orcid":"https://orcid.org/0000-0002-4516-766X","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, IIT Bombay, Mumbai, India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063508488","display_name":"J\u00f6rg Henkel","orcid":"https://orcid.org/0000-0001-9602-2922"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jorg Henkel","raw_affiliation_strings":["Chair of Embedded Systems, Karlsruhe Institute of Technology, Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chair of Embedded Systems, Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0898,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.77669394,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"27","issue":"7","first_page":"1652","last_page":"1665"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/duty-cycle","display_name":"Duty cycle","score":0.5933973789215088},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5673601031303406},{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.5662373304367065},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5479316115379333},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5369695425033569},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5154036283493042},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4891958236694336},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.48228719830513},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4786192774772644},{"id":"https://openalex.org/keywords/leverage","display_name":"Leverage (statistics)","score":0.47574377059936523},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46274664998054504},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4532802700996399},{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.4151581823825836},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38364312052726746},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.35174760222435},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32673805952072144},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3036842346191406},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.3005599081516266},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11154496669769287}],"concepts":[{"id":"https://openalex.org/C199822604","wikidata":"https://www.wikidata.org/wiki/Q557120","display_name":"Duty cycle","level":3,"score":0.5933973789215088},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5673601031303406},{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.5662373304367065},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5479316115379333},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5369695425033569},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5154036283493042},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4891958236694336},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.48228719830513},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4786192774772644},{"id":"https://openalex.org/C153083717","wikidata":"https://www.wikidata.org/wiki/Q6535263","display_name":"Leverage (statistics)","level":2,"score":0.47574377059936523},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46274664998054504},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4532802700996399},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.4151581823825836},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38364312052726746},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.35174760222435},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32673805952072144},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3036842346191406},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.3005599081516266},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11154496669769287},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/tvlsi.2019.2899890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2019.2899890","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},{"id":"pmh:oai:EVASTAR-Karlsruhe.de:1000096491","is_oa":false,"landing_page_url":"https://publikationen.bibliothek.kit.edu/1000096491","pdf_url":null,"source":{"id":"https://openalex.org/S4306401992","display_name":"Repository KITopen (Karlsruhe Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I102335020","host_organization_name":"Karlsruhe Institute of Technology","host_organization_lineage":["https://openalex.org/I102335020"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"IEEE transactions on very large scale integration (VLSI) systems, 27 (7), 1652-1665","raw_type":"doc-type:article"},{"id":"pmh:oai:dsapce.library.iitb.ac.in:100/25669","is_oa":false,"landing_page_url":"http://dspace.library.iitb.ac.in/xmlui/handle/100/25669","pdf_url":null,"source":{"id":"https://openalex.org/S4306400899","display_name":"DSpace (IIT Bombay)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I162827531","host_organization_name":"Indian Institute of Technology Bombay","host_organization_lineage":["https://openalex.org/I162827531"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"},{"id":"doi:10.5445/ir/1000096491","is_oa":true,"landing_page_url":"https://doi.org/10.5445/ir/1000096491","pdf_url":null,"source":{"id":"https://openalex.org/S7407052948","display_name":"KITopen","issn_l":null,"issn":[],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"article-journal"}],"best_oa_location":{"id":"doi:10.5445/ir/1000096491","is_oa":true,"landing_page_url":"https://doi.org/10.5445/ir/1000096491","pdf_url":null,"source":{"id":"https://openalex.org/S7407052948","display_name":"KITopen","issn_l":null,"issn":[],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article-journal"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W324409780","https://openalex.org/W581518716","https://openalex.org/W761701182","https://openalex.org/W1540821800","https://openalex.org/W1546318334","https://openalex.org/W1617907217","https://openalex.org/W1972661221","https://openalex.org/W1980043105","https://openalex.org/W1996545464","https://openalex.org/W2018849714","https://openalex.org/W2030228054","https://openalex.org/W2069411775","https://openalex.org/W2091163742","https://openalex.org/W2100925694","https://openalex.org/W2108880814","https://openalex.org/W2114648586","https://openalex.org/W2118700168","https://openalex.org/W2135277685","https://openalex.org/W2151118077","https://openalex.org/W2165190641","https://openalex.org/W2166089199","https://openalex.org/W2167021379","https://openalex.org/W2346485801","https://openalex.org/W2396345169","https://openalex.org/W2579352521","https://openalex.org/W2615761892","https://openalex.org/W2620861208","https://openalex.org/W2621017693","https://openalex.org/W2729749234","https://openalex.org/W2765199991","https://openalex.org/W2768495718","https://openalex.org/W2780706692","https://openalex.org/W2785938157","https://openalex.org/W2799677856","https://openalex.org/W2799722772","https://openalex.org/W2801031576","https://openalex.org/W2802580967","https://openalex.org/W2893394176","https://openalex.org/W3145030156","https://openalex.org/W3146045665","https://openalex.org/W3149694916","https://openalex.org/W4299057040","https://openalex.org/W6632716941","https://openalex.org/W6643305534","https://openalex.org/W6675222231","https://openalex.org/W6677006570","https://openalex.org/W6684495112","https://openalex.org/W6745455408"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2020916702","https://openalex.org/W2081199158","https://openalex.org/W4360585747","https://openalex.org/W2043496087","https://openalex.org/W1668617092","https://openalex.org/W2001372352","https://openalex.org/W2130020050","https://openalex.org/W1976621533","https://openalex.org/W2001064859"],"abstract_inverted_index":{"With":[0],"technology":[1],"scaling,":[2],"the":[3,27,37,47,66,76,84,95,110,115,121,142,193,199,213,233,242,265,268,280],"susceptibility":[4],"of":[5,31,69,78,112,124,148,169,196,202,236,267,279],"circuits":[6,32],"to":[7,18,34,93,108,181,239,271,287],"different":[8],"reliability":[9,111,179],"degradations":[10],"is":[11,89,99,159],"steadily":[12],"increasing.":[13],"Aging":[14],"in":[15,26,91,264,308],"transistors":[16],"due":[17,33],"bias":[19],"temperature":[20],"instability":[21],"(BTI)":[22],"and":[23,57,64,72,145,173,204,227,258,274,285,295],"voltage":[24,55,70],"fluctuation":[25,56,71],"power":[28],"delivery":[29],"network":[30],"IR-drops":[35],"are":[36,44,52,61,219],"most":[38],"prominent.":[39],"In":[40],"this":[41,125,155],"paper,":[42],"we":[43,186],"reporting":[45],"for":[46,114,246],"first":[48],"time":[49],"that":[50,60,128,139,191,255],"there":[51],"interdependences":[53,292],"between":[54,293],"BTI":[58,73,137],"aging":[59,74,203,257,294],"nonnegligible.":[62],"Modeling":[63],"investigating":[65],"joint":[67,200],"impact":[68,201],"on":[75],"delay":[77,194],"circuits,":[79],"while":[80],"remaining":[81],"compatible":[82,220],"with":[83,221],"existing":[85,182,222],"standard":[86,188,214],"design":[87,215],"flow,":[88],"indispensable":[90],"order":[92],"answer":[94],"vital":[96],"question,":[97],"\u201cwhat":[98],"an":[100],"efficient":[101,311],"(i.e.,":[102],"small,":[103],"yet":[104],"sufficient)":[105],"timing":[106,244],"guardband":[107,302],"sustain":[109],"circuit":[113,248],"projected":[116],"lifetime?\u201d":[117],"This":[118],"is,":[119],"concisely,":[120],"key":[122],"goal":[123],"paper.":[126],"Achieving":[127],"would":[129],"not":[130,298],"be":[131,209],"possible":[132],"without":[133],"employing":[134,272,309],"a":[135,166],"physics-based":[136],"model":[138,158],"precisely":[140],"describes":[141],"underlying":[143],"generation":[144],"recovery":[146],"mechanisms":[147],"defects":[149],"under":[150,198],"arbitrary":[151],"stress":[152],"waveforms.":[153],"For":[154],"purpose,":[156],"our":[157],"validated":[160],"against":[161],"varied":[162],"semiconductor":[163],"measurements":[164],"covering":[165],"wide":[167],"range":[168],"voltage,":[170],"temperature,":[171],"frequency,":[172],"duty":[174],"cycle":[175],"conditions.":[176],"To":[177],"bring":[178],"awareness":[180],"EDA":[183],"tool":[184],"flows,":[185],"create":[187],"cell":[189],"libraries":[190,207],"contain":[192],"information":[195],"cells":[197],"IR-drop.":[205],"Our":[206,252],"can":[208,231],"directly":[210],"deployed":[211],"within":[212],"flow":[216],"because":[217,278],"they":[218],"commercial":[223],"tools":[224,238],"(e.g.,":[225],"Synopsys":[226],"Cadence).":[228],"Hence,":[229],"designers":[230],"leverage":[232],"mature":[234],"algorithms":[235],"these":[237],"accurately":[240],"estimate":[241],"required":[243],"guardbands":[245,277],"any":[247],"despite":[249],"its":[250],"complexity.":[251],"investigation":[253],"demonstrates":[254],"considering":[256,291],"IR-drop":[259,296],"effects":[260],"independently,":[261],"as":[262],"done":[263],"state":[266],"art,":[269],"leads":[270],"insufficient":[273],"thus":[275],"unreliable":[276],"nonnegligible":[281],"(on":[282],"average":[283],"15%":[284],"up":[286],"25%)":[288],"underestimations.":[289],"Importantly,":[290],"does":[297],"only":[299],"allow":[300],"correct":[301],"estimations,":[303],"but":[304],"it":[305],"also":[306],"results":[307],"more":[310],"guardbands.":[312]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":5},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}