{"id":"https://openalex.org/W2909991371","doi":"https://doi.org/10.1109/tvlsi.2018.2890601","title":"Determining Application-Specific Knowledge for Improving Robustness of Sequential Circuits","display_name":"Determining Application-Specific Knowledge for Improving Robustness of Sequential Circuits","publication_year":2019,"publication_date":"2019-01-18","ids":{"openalex":"https://openalex.org/W2909991371","doi":"https://doi.org/10.1109/tvlsi.2018.2890601","mag":"2909991371"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2018.2890601","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2018.2890601","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074091035","display_name":"Sebastian Huhn","orcid":"https://orcid.org/0000-0001-6950-7967"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sebastian Huhn","raw_affiliation_strings":["Institute of Computer Science, University of Bremen, Bremen, Germany"],"raw_orcid":"https://orcid.org/0000-0001-6950-7967","affiliations":[{"raw_affiliation_string":"Institute of Computer Science, University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046431867","display_name":"Stefan Frehse","orcid":null},"institutions":[{"id":"https://openalex.org/I33256026","display_name":"German Research Centre for Artificial Intelligence","ror":"https://ror.org/01ayc5b57","country_code":"DE","type":"funder","lineage":["https://openalex.org/I33256026"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stefan Frehse","raw_affiliation_strings":["Cyber-Physical Systems Group, German Research Center for Artificial Intelligence, Bremen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cyber-Physical Systems Group, German Research Center for Artificial Intelligence, Bremen, Germany","institution_ids":["https://openalex.org/I33256026"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004214923","display_name":"Robert Wille","orcid":"https://orcid.org/0000-0002-4993-7860"},"institutions":[{"id":"https://openalex.org/I121883995","display_name":"Johannes Kepler University of Linz","ror":"https://ror.org/052r2xn60","country_code":"AT","type":"education","lineage":["https://openalex.org/I121883995"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Robert Wille","raw_affiliation_strings":["Institute for Integrated Circuits, Johannes Kepler University Linz, Linz, Austria"],"raw_orcid":"https://orcid.org/0000-0002-4993-7860","affiliations":[{"raw_affiliation_string":"Institute for Integrated Circuits, Johannes Kepler University Linz, Linz, Austria","institution_ids":["https://openalex.org/I121883995"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071742136","display_name":"Rolf Drechsler","orcid":"https://orcid.org/0000-0002-9872-1740"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Rolf Drechsler","raw_affiliation_strings":["Institute of Computer Science, University of Bremen, Bremen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Science, University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4365,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.79291589,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"27","issue":"4","first_page":"875","last_page":"887"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6575775146484375},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.609367311000824},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5460891127586365},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.47586387395858765},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4560905992984772},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3530859351158142},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.28682583570480347},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1707262396812439},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1632084846496582}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6575775146484375},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.609367311000824},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5460891127586365},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.47586387395858765},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4560905992984772},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3530859351158142},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.28682583570480347},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1707262396812439},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1632084846496582},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2018.2890601","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2018.2890601","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2619117107","display_name":"SFB 1232: Von farbigen Zust\u00e4nden zu evolution\u00e4ren Konstruktionswerkstoffen","funder_award_id":"276397488","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"}],"funders":[{"id":"https://openalex.org/F4320318429","display_name":"Deutsches Forschungszentrum f\u00fcr K\u00fcnstliche Intelligenz","ror":"https://ror.org/01ayc5b57"},{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":57,"referenced_works":["https://openalex.org/W142178511","https://openalex.org/W1497632410","https://openalex.org/W1510368738","https://openalex.org/W1518705996","https://openalex.org/W1579329775","https://openalex.org/W1583437159","https://openalex.org/W1889085354","https://openalex.org/W1979520342","https://openalex.org/W1980073965","https://openalex.org/W1981151256","https://openalex.org/W1996832037","https://openalex.org/W2003233756","https://openalex.org/W2024148935","https://openalex.org/W2030660537","https://openalex.org/W2031279738","https://openalex.org/W2048503119","https://openalex.org/W2054149682","https://openalex.org/W2063935491","https://openalex.org/W2080267935","https://openalex.org/W2087360016","https://openalex.org/W2096785857","https://openalex.org/W2098426274","https://openalex.org/W2099569658","https://openalex.org/W2104677471","https://openalex.org/W2107672210","https://openalex.org/W2111994103","https://openalex.org/W2119474775","https://openalex.org/W2124729849","https://openalex.org/W2130108594","https://openalex.org/W2146907344","https://openalex.org/W2146944503","https://openalex.org/W2151802820","https://openalex.org/W2153185479","https://openalex.org/W2156143705","https://openalex.org/W2156787298","https://openalex.org/W2156837195","https://openalex.org/W2160444875","https://openalex.org/W2165929878","https://openalex.org/W2170795408","https://openalex.org/W2342204193","https://openalex.org/W2427136657","https://openalex.org/W2588195724","https://openalex.org/W3143836256","https://openalex.org/W3149410719","https://openalex.org/W3188125569","https://openalex.org/W4206807714","https://openalex.org/W4210836009","https://openalex.org/W4213132743","https://openalex.org/W4231640108","https://openalex.org/W4236432903","https://openalex.org/W4246166885","https://openalex.org/W4250225510","https://openalex.org/W4252185756","https://openalex.org/W4256313551","https://openalex.org/W4303101694","https://openalex.org/W6629543881","https://openalex.org/W6656308666"],"related_works":["https://openalex.org/W4241196849","https://openalex.org/W2746929098","https://openalex.org/W1970410908","https://openalex.org/W4296473373","https://openalex.org/W2515747490","https://openalex.org/W2782719366","https://openalex.org/W1518382973","https://openalex.org/W2542280163","https://openalex.org/W2533122910","https://openalex.org/W1976440785"],"abstract_inverted_index":{"Due":[0],"to":[1,26,31,134,144,205],"their":[2,141],"shrinking":[3],"feature":[4],"sizes":[5],"as":[6,8,12,83,162],"well":[7],"environmental":[9],"influences,":[10],"such":[11,82,161],"high-energy":[13],"radiation,":[14],"electrical":[15],"noise,":[16],"and":[17,110,171,201],"particle":[18],"strikes,":[19],"integrated":[20],"circuits":[21,34,51,81,128],"are":[22,77,124,175],"getting":[23],"more":[24,35],"vulnerable":[25],"transient":[27],"faults.":[28],"Accordingly,":[29],"how":[30],"make":[32],"those":[33],"robust":[36],"has":[37],"become":[38],"an":[39,91,145],"essential":[40],"step":[41],"in":[42,126,188],"today's":[43],"design":[44],"flows.":[45],"Methods":[46],"increasing":[47],"the":[48,70,74,103,106,114,131,137,150,194,198],"robustness":[49],"of":[50,61,73,102,108,197],"against":[52],"these":[53,96,211],"faults":[54],"already":[55],"exist":[56],"for":[57,79,140,177],"a":[58,155,185],"long":[59],"period":[60],"time":[62],"but":[63],"either":[64],"introduce":[65],"huge":[66],"additional":[67,189],"logic,":[68],"change":[69],"timing":[71,195],"behavior":[72,196],"circuit,":[75,104],"or":[76],"applicable":[78,204],"dedicated":[80],"microprocessors":[84],"only.":[85],"In":[86],"this":[87,178],"paper,":[88],"we":[89,119],"propose":[90],"alternative":[92],"method,":[93],"which":[94,123],"overcomes":[95],"drawbacks":[97],"by":[98],"determining":[99,149],"application-specific":[100],"knowledge":[101],"namely":[105],"relations":[107],"flip-flops":[109],"when":[111],"they":[112],"assume":[113],"same":[115],"value.":[116],"By":[117],"this,":[118],"exploit":[120],"partial":[121],"redundancies,":[122],"inherent":[125],"most":[127],"anyway":[129],"(even":[130],"optimized":[132],"ones),":[133],"frequently":[135],"compare":[136],"circuit":[138,199],"signals":[139],"correctness-eventually":[142],"leading":[143],"increased":[146],"robustness.":[147],"Since":[148],"correspondingly":[151],"needed":[152],"information":[153],"is":[154,202],"computationally":[156],"hard":[157],"task,":[158],"formal":[159],"methods,":[160],"bounded":[163],"model":[164],"checking,":[165],"satisfiability-based":[166],"automatic":[167],"test":[168],"pattern":[169],"generation,":[170],"binary":[172],"decision":[173],"diagrams,":[174],"utilized":[176],"purpose.":[179],"The":[180],"resulting":[181],"methodology":[182],"requires":[183],"only":[184,192],"slight":[186],"increase":[187],"hardware,":[190],"does":[191],"influence":[193],"negligibly,":[200],"automatically":[203],"arbitrary":[206],"circuits.":[207],"Experimental":[208],"evaluations":[209],"confirm":[210],"benefits.":[212]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}