{"id":"https://openalex.org/W2901644239","doi":"https://doi.org/10.1109/tvlsi.2018.2879341","title":"Radiation-Hardened 14T SRAM Bitcell With Speed and Power Optimized for Space Application","display_name":"Radiation-Hardened 14T SRAM Bitcell With Speed and Power Optimized for Space Application","publication_year":2018,"publication_date":"2018-11-20","ids":{"openalex":"https://openalex.org/W2901644239","doi":"https://doi.org/10.1109/tvlsi.2018.2879341","mag":"2901644239"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2018.2879341","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2018.2879341","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075966974","display_name":"Chunyu Peng","orcid":"https://orcid.org/0000-0003-2408-5048"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chunyu Peng","raw_affiliation_strings":["School of Electronic and Information Engineering, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109904257","display_name":"J. Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiati Huang","raw_affiliation_strings":["School of Electronic and Information Engineering, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078666701","display_name":"Changyong Liu","orcid":"https://orcid.org/0000-0003-3919-0713"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changyong Liu","raw_affiliation_strings":["School of Electronic and Information Engineering, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063284983","display_name":"Qiang Zhao","orcid":"https://orcid.org/0000-0002-0278-5804"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Zhao","raw_affiliation_strings":["School of Electronic and Information Engineering, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056761251","display_name":"Songsong Xiao","orcid":"https://orcid.org/0000-0003-3249-2401"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Songsong Xiao","raw_affiliation_strings":["School of Electronic and Information Engineering, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037391840","display_name":"Xiulong Wu","orcid":"https://orcid.org/0000-0002-5012-2570"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiulong Wu","raw_affiliation_strings":["School of Electronic and Information Engineering, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072637140","display_name":"Zhiting Lin","orcid":"https://orcid.org/0000-0002-3314-1606"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiting Lin","raw_affiliation_strings":["School of Electronic and Information Engineering, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066523003","display_name":"Junning Chen","orcid":"https://orcid.org/0000-0001-7121-0994"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junning Chen","raw_affiliation_strings":["School of Electronic and Information Engineering, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064213921","display_name":"Xuan Zeng","orcid":"https://orcid.org/0000-0002-8097-4053"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuan Zeng","raw_affiliation_strings":["ASIC & System State Key Laboratory, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"ASIC & System State Key Laboratory, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5075966974"],"corresponding_institution_ids":["https://openalex.org/I143868143"],"apc_list":null,"apc_paid":null,"fwci":7.197,"has_fulltext":false,"cited_by_count":168,"citation_normalized_percentile":{"value":0.9758726,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"27","issue":"2","first_page":"407","last_page":"415"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7827677726745605},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6604508757591248},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6152804493904114},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.525897204875946},{"id":"https://openalex.org/keywords/technology-cad","display_name":"Technology CAD","score":0.4520367383956909},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.4398554265499115},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.4396211802959442},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4331795275211334},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4261191487312317},{"id":"https://openalex.org/keywords/charge-sharing","display_name":"Charge sharing","score":0.42184534668922424},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.41279181838035583},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30339187383651733},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.23010951280593872},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16802620887756348},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15557622909545898},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.06512850522994995},{"id":"https://openalex.org/keywords/cad","display_name":"CAD","score":0.06287321448326111}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7827677726745605},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6604508757591248},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6152804493904114},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.525897204875946},{"id":"https://openalex.org/C34929307","wikidata":"https://www.wikidata.org/wiki/Q845636","display_name":"Technology CAD","level":3,"score":0.4520367383956909},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.4398554265499115},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.4396211802959442},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4331795275211334},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4261191487312317},{"id":"https://openalex.org/C2781179661","wikidata":"https://www.wikidata.org/wiki/Q5074272","display_name":"Charge sharing","level":3,"score":0.42184534668922424},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.41279181838035583},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30339187383651733},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.23010951280593872},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16802620887756348},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15557622909545898},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.06512850522994995},{"id":"https://openalex.org/C194789388","wikidata":"https://www.wikidata.org/wiki/Q17855283","display_name":"CAD","level":2,"score":0.06287321448326111},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2018.2879341","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2018.2879341","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8700000047683716}],"awards":[{"id":"https://openalex.org/G4503984353","display_name":null,"funder_award_id":"61474001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5606181573","display_name":null,"funder_award_id":"61674002","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1571320244","https://openalex.org/W1600862615","https://openalex.org/W1965462790","https://openalex.org/W1981970801","https://openalex.org/W2023659251","https://openalex.org/W2033453286","https://openalex.org/W2050431855","https://openalex.org/W2061643944","https://openalex.org/W2089197452","https://openalex.org/W2102290905","https://openalex.org/W2106900198","https://openalex.org/W2138815251","https://openalex.org/W2141068710","https://openalex.org/W2146543277","https://openalex.org/W2153751624","https://openalex.org/W2161549238","https://openalex.org/W2325687255","https://openalex.org/W2494978579","https://openalex.org/W2550596389","https://openalex.org/W2560047785","https://openalex.org/W2580445362","https://openalex.org/W2594664073","https://openalex.org/W2752159144"],"related_works":["https://openalex.org/W1629214335","https://openalex.org/W3216082192","https://openalex.org/W3099416085","https://openalex.org/W1979972974","https://openalex.org/W2095856099","https://openalex.org/W2333137665","https://openalex.org/W2589751677","https://openalex.org/W4296887773","https://openalex.org/W2129787593","https://openalex.org/W2580686250"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,33],"novel":[4,46],"radiation-hardened":[5],"14-transistor":[6],"SRAM":[7],"bitcell":[8],"with":[9,15,50,93],"speed":[10,16,77],"and":[11,17,28,78,89],"power":[12,18,79],"optimized":[13,19],"[radiation-hardened":[14],"(RSP)-14T]":[20],"for":[21],"space":[22],"application":[23],"is":[24,48],"proposed.":[25],"By":[26],"circuit-":[27],"layout-level":[29],"optimization":[30],"design":[31,99],"in":[32],"65-nm":[34],"CMOS":[35],"technology,":[36],"the":[37,45,63,69,75,82,96],"3-D":[38],"TCAD":[39],"mixed-mode":[40],"simulation":[41,71],"results":[42,72],"show":[43,73],"that":[44,74],"structure":[47],"provided":[49],"increased":[51],"resilience":[52],"to":[53,62],"single-event":[54],"upset":[55],"as":[56,58],"well":[57],"single-event-multiple-node":[59],"upsets":[60],"due":[61],"charge":[64],"sharing":[65],"among":[66],"OFF-transistors.":[67],"Moreover,":[68],"HSPICE":[70],"write":[76],"consumption":[80],"of":[81,95],"proposed":[83],"RSP-14T":[84],"are":[85],"improved":[86],"by":[87],"~65%":[88],"~50%,":[90],"respectively,":[91],"compared":[92],"those":[94],"radiation":[97],"hardened":[98],"(RHD)-12T":[100],"memory":[101],"cell.":[102]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":31},{"year":2024,"cited_by_count":26},{"year":2023,"cited_by_count":27},{"year":2022,"cited_by_count":24},{"year":2021,"cited_by_count":27},{"year":2020,"cited_by_count":19},{"year":2019,"cited_by_count":9}],"updated_date":"2026-04-18T07:56:08.524223","created_date":"2025-10-10T00:00:00"}