{"id":"https://openalex.org/W2893414054","doi":"https://doi.org/10.1109/tvlsi.2018.2861818","title":"Phase Noise Analysis of Bipolar Class-C VCOs With Delay in Oscillator Loop","display_name":"Phase Noise Analysis of Bipolar Class-C VCOs With Delay in Oscillator Loop","publication_year":2018,"publication_date":"2018-09-24","ids":{"openalex":"https://openalex.org/W2893414054","doi":"https://doi.org/10.1109/tvlsi.2018.2861818","mag":"2893414054"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2018.2861818","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2018.2861818","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024535045","display_name":"Arpan Thakkar","orcid":"https://orcid.org/0000-0003-4775-4750"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Arpan Thakkar","raw_affiliation_strings":["Department of Electrical Engineering, IIT Madras, Chennai, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, IIT Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112364142","display_name":"Srinivas Theertham","orcid":null},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Srinivas Theertham","raw_affiliation_strings":["Texas Instruments (India) Pvt., Ltd., Bengaluru, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments (India) Pvt., Ltd., Bengaluru, India","institution_ids":["https://openalex.org/I4210109535"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021993134","display_name":"Sankaran Aniruddhan","orcid":"https://orcid.org/0000-0002-8513-0052"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sankaran Aniruddhan","raw_affiliation_strings":["Department of Electrical Engineering, IIT Madras, Chennai, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, IIT Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5024535045"],"corresponding_institution_ids":["https://openalex.org/I24676775"],"apc_list":null,"apc_paid":null,"fwci":0.3863,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.63409513,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"26","issue":"12","first_page":"2873","last_page":"2883"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.9155844449996948},{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.9058384895324707},{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.8853049874305725},{"id":"https://openalex.org/keywords/parasitic-extraction","display_name":"Parasitic extraction","score":0.5920503735542297},{"id":"https://openalex.org/keywords/bicmos","display_name":"BiCMOS","score":0.5421562790870667},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5192470550537109},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.48619383573532104},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.4542522728443146},{"id":"https://openalex.org/keywords/vack\u00e1\u0159-oscillator","display_name":"Vack\u00e1\u0159 oscillator","score":0.4132627844810486},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3745938539505005},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3501967489719391},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3211137652397156},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3024560809135437},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3020397424697876},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.13696476817131042}],"concepts":[{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.9155844449996948},{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.9058384895324707},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.8853049874305725},{"id":"https://openalex.org/C159818811","wikidata":"https://www.wikidata.org/wiki/Q7135947","display_name":"Parasitic extraction","level":2,"score":0.5920503735542297},{"id":"https://openalex.org/C62427370","wikidata":"https://www.wikidata.org/wiki/Q173416","display_name":"BiCMOS","level":4,"score":0.5421562790870667},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5192470550537109},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48619383573532104},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.4542522728443146},{"id":"https://openalex.org/C111657199","wikidata":"https://www.wikidata.org/wiki/Q2300256","display_name":"Vack\u00e1\u0159 oscillator","level":4,"score":0.4132627844810486},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3745938539505005},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3501967489719391},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3211137652397156},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3024560809135437},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3020397424697876},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.13696476817131042}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2018.2861818","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2018.2861818","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7799999713897705,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320307801","display_name":"Texas Instruments","ror":"https://ror.org/03vsmv677"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1522052415","https://openalex.org/W1606604241","https://openalex.org/W1983296537","https://openalex.org/W2008964143","https://openalex.org/W2013632533","https://openalex.org/W2016167819","https://openalex.org/W2031990567","https://openalex.org/W2032971883","https://openalex.org/W2043277076","https://openalex.org/W2050645980","https://openalex.org/W2061421126","https://openalex.org/W2067999683","https://openalex.org/W2091939874","https://openalex.org/W2108370022","https://openalex.org/W2114731048","https://openalex.org/W2121680459","https://openalex.org/W2125213398","https://openalex.org/W2128642286","https://openalex.org/W2135143797","https://openalex.org/W2141749418","https://openalex.org/W2150935719","https://openalex.org/W2169787175","https://openalex.org/W2173369572","https://openalex.org/W2321859177","https://openalex.org/W2516317949","https://openalex.org/W2543636785","https://openalex.org/W2771191960","https://openalex.org/W3147616483","https://openalex.org/W6631357633","https://openalex.org/W6684668002","https://openalex.org/W7074724126"],"related_works":["https://openalex.org/W2141726610","https://openalex.org/W2061664740","https://openalex.org/W2540766993","https://openalex.org/W4242529045","https://openalex.org/W2911266525","https://openalex.org/W2086169776","https://openalex.org/W2017334866","https://openalex.org/W2100673396","https://openalex.org/W1970939492","https://openalex.org/W1950287302"],"abstract_inverted_index":{"The":[0,26,74],"expression":[1],"for":[2],"phase":[3,60],"noise":[4,61],"of":[5,28,63],"a":[6,48,59],"bipolar":[7,42],"class-C":[8,43],"voltage":[9],"controlled":[10],"oscillator":[11,19],"(VCO)":[12],"with":[13,37],"an":[14],"ideal":[15],"delay":[16],"in":[17,23,47],"the":[18,54,80],"loop":[20],"is":[21,32,45,77],"derived":[22],"this":[24],"paper.":[25],"impact":[27],"internal":[29],"device":[30],"parasitics":[31],"then":[33],"quantified":[34],"and":[35,79,83,88],"supported":[36],"circuit":[38],"simulation":[39],"results.":[40],"A":[41],"VCO":[44],"fabricated":[46],"130-nm":[49],"BiCMOS":[50],"technology":[51],"to":[52],"validate":[53],"analytical":[55],"predictions.":[56],"It":[57],"exhibits":[58],"performance":[62],"-112.2":[64],"dBc/Hz":[65,87],"at":[66,71],"1-MHz":[67],"offset":[68],"when":[69],"running":[70],"19.2":[72],"GHz.":[73],"tuning":[75],"range":[76],"7%,":[78],"overall":[81],"FoM":[82],"FoMT":[84],"are":[85],"180.4":[86],"177.3":[89],"dBc/Hz,":[90],"respectively.":[91]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}