{"id":"https://openalex.org/W2801227755","doi":"https://doi.org/10.1109/tvlsi.2018.2822678","title":"A Linearity-Improved 8-bit 320-MS/s SAR ADC With Metastability Immunity Technique","display_name":"A Linearity-Improved 8-bit 320-MS/s SAR ADC With Metastability Immunity Technique","publication_year":2018,"publication_date":"2018-04-17","ids":{"openalex":"https://openalex.org/W2801227755","doi":"https://doi.org/10.1109/tvlsi.2018.2822678","mag":"2801227755"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2018.2822678","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2018.2822678","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083101939","display_name":"Daiguo Xu","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Daiguo Xu","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012469729","display_name":"Lei Qiu","orcid":"https://orcid.org/0000-0003-2980-2675"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Lei Qiu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103244879","display_name":"Zhengping Zhang","orcid":"https://orcid.org/0000-0002-6113-3072"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zhengping Zhang","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100338144","display_name":"Tao Liu","orcid":"https://orcid.org/0009-0005-5108-4309"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tao Liu","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102672721","display_name":"Lu Liu","orcid":"https://orcid.org/0009-0007-6882-6828"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lu Liu","raw_affiliation_strings":["School of Microelectronics and Solid-State Electronics, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics and Solid-State Electronics, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051406716","display_name":"Kairang Chen","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kairang Chen","raw_affiliation_strings":["Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103805459","display_name":"Shiliu Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiliu Xu","raw_affiliation_strings":["School of Microelectronics and Solid-State Electronics, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics and Solid-State Electronics, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5083101939"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4434,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.80335909,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"26","issue":"8","first_page":"1545","last_page":"1553"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.6724904775619507},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.6138916015625},{"id":"https://openalex.org/keywords/metastability","display_name":"Metastability","score":0.595790445804596},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4869779050350189},{"id":"https://openalex.org/keywords/noise-immunity","display_name":"Noise immunity","score":0.46491318941116333},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.45250898599624634},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4010542333126068},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.3024227023124695},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28992795944213867},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2887449264526367},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.25305092334747314},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18203413486480713},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16051465272903442}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.6724904775619507},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.6138916015625},{"id":"https://openalex.org/C89464430","wikidata":"https://www.wikidata.org/wiki/Q849516","display_name":"Metastability","level":2,"score":0.595790445804596},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4869779050350189},{"id":"https://openalex.org/C2988494973","wikidata":"https://www.wikidata.org/wiki/Q179448","display_name":"Noise immunity","level":3,"score":0.46491318941116333},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.45250898599624634},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4010542333126068},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.3024227023124695},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28992795944213867},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2887449264526367},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.25305092334747314},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18203413486480713},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16051465272903442},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2018.2822678","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2018.2822678","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6800000071525574,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1515994202","https://openalex.org/W1581171242","https://openalex.org/W1988269193","https://openalex.org/W2001773162","https://openalex.org/W2008952700","https://openalex.org/W2054931442","https://openalex.org/W2064938289","https://openalex.org/W2069436356","https://openalex.org/W2108909198","https://openalex.org/W2146977045","https://openalex.org/W2167161290","https://openalex.org/W2175390874","https://openalex.org/W2245685729","https://openalex.org/W2307392714","https://openalex.org/W2333594303","https://openalex.org/W2335530728","https://openalex.org/W2343222450","https://openalex.org/W2514013094","https://openalex.org/W2575550858","https://openalex.org/W2735106728","https://openalex.org/W2760245843","https://openalex.org/W6651046883","https://openalex.org/W6681309360"],"related_works":["https://openalex.org/W4307107610","https://openalex.org/W3213627526","https://openalex.org/W4226159838","https://openalex.org/W3138976155","https://openalex.org/W1992748572","https://openalex.org/W3102066851","https://openalex.org/W2082939555","https://openalex.org/W2790243943","https://openalex.org/W2411923897","https://openalex.org/W2088012056"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3,143],"8-bit":[4],"320-MS/s":[5],"successive":[6],"approximation":[7],"register":[8],"(SAR)":[9],"analog-to-digital":[10],"converter":[11],"(ADC)":[12],"with":[13,21,37,164],"the":[14,27,46,49,62,90,98,155],"linearity-improved":[15,18],"technique.":[16],"A":[17],"sampling":[19,31,51],"switch":[20,32],"parasitic":[22,28],"capacitance":[23,29],"compensation,":[24],"which":[25],"makes":[26],"of":[30,48,66,92,104,146,158],"to":[33,60,88],"be":[34],"almost":[35],"constant":[36],"varied":[38],"input":[39],"signal,":[40],"is":[41,58,86,107,160],"proposed.":[42],"It":[43,122],"also":[44],"improves":[45],"matching":[47],"differential":[50],"switches.":[52],"Moreover,":[53],"a":[54,75,101,110,118,124],"metastability":[55],"immunity":[56],"technique":[57],"provided":[59],"suppress":[61],"uncertain":[63],"decision":[64],"behavior":[65],"dynamic":[67,132],"comparator":[68,81],"at":[69,117,136],"high":[70],"conversion":[71],"rate.":[72,166],"In":[73],"addition,":[74],"bypass":[76],"SAR":[77,83,93,105],"logic":[78,84],"that":[79],"parallels":[80],"and":[82,129,154],"operations":[85],"exhibited":[87],"reduce":[89],"delay":[91],"feedback":[94],"loop.":[95],"To":[96],"demonstrate":[97],"proposed":[99],"techniques,":[100],"design":[102],"example":[103],"ADC":[106,140],"fabricated":[108],"in":[109],"55-nm":[111],"CMOS":[112],"technology,":[113],"consuming":[114],"1.2":[115],"mW":[116],"1-V":[119],"power":[120],"supply.":[121],"achieves":[123],"signal-to-noise-and-distortion":[125],"ratio":[126],">43.5":[127],"dB":[128,135],"spurious":[130],"free":[131],"range":[133],">54":[134],"320":[137],"MS/s.":[138],"The":[139],"core":[141],"occupies":[142],"active":[144],"area":[145],"only":[147],"0.02":[148],"mm":[149],"<sup":[150],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[151],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[152],",":[153],"corresponding":[156],"figure":[157],"merit":[159],"30":[161],"fJ/conversion":[162],"step":[163],"Nyquist":[165]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}