{"id":"https://openalex.org/W2748943309","doi":"https://doi.org/10.1109/tvlsi.2017.2736782","title":"A Dynamic Leakage and Slew Rate Compensation Circuit for 40-nm CMOS Mixed-Voltage Output Buffer","display_name":"A Dynamic Leakage and Slew Rate Compensation Circuit for 40-nm CMOS Mixed-Voltage Output Buffer","publication_year":2017,"publication_date":"2017-08-18","ids":{"openalex":"https://openalex.org/W2748943309","doi":"https://doi.org/10.1109/tvlsi.2017.2736782","mag":"2748943309"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2017.2736782","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2017.2736782","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070314228","display_name":"Tzung-Je Lee","orcid":"https://orcid.org/0000-0001-6870-7406"},"institutions":[{"id":"https://openalex.org/I91951123","display_name":"Cheng Shiu University","ror":"https://ror.org/011bdtx65","country_code":"TW","type":"education","lineage":["https://openalex.org/I91951123"]},{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Tzung-Je Lee","raw_affiliation_strings":["Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung, Taiwan","Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I91951123"]},{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105989439","display_name":"Tsung-Yi Tsai","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tsung-Yi Tsai","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111463083","display_name":"Wei Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wei Lin","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090544537","display_name":"U-Fat Chio","orcid":"https://orcid.org/0000-0001-5846-1844"},"institutions":[{"id":"https://openalex.org/I204512498","display_name":"University of Macau","ror":"https://ror.org/01r4q9n85","country_code":"MO","type":"education","lineage":["https://openalex.org/I204512498"]}],"countries":["MO"],"is_corresponding":false,"raw_author_name":"U-Fat Chio","raw_affiliation_strings":["State Key Laboratory of Analog and Mixed Signal VLSI, University of Macau, Macao, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Analog and Mixed Signal VLSI, University of Macau, Macao, China","institution_ids":["https://openalex.org/I204512498"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077220045","display_name":"Chua\u2010Chin Wang","orcid":"https://orcid.org/0000-0002-2426-2879"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chua-Chin Wang","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5070314228"],"corresponding_institution_ids":["https://openalex.org/I142974352","https://openalex.org/I91951123"],"apc_list":null,"apc_paid":null,"fwci":0.7167,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.7307811,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"25","issue":"11","first_page":"3166","last_page":"3174"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/slew-rate","display_name":"Slew rate","score":0.769611120223999},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.709896445274353},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5799754858016968},{"id":"https://openalex.org/keywords/buffer","display_name":"Buffer (optical fiber)","score":0.5543128252029419},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5353932976722717},{"id":"https://openalex.org/keywords/buffer-amplifier","display_name":"Buffer amplifier","score":0.5101935863494873},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5028960108757019},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4525850713253021},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4291410446166992},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4129564166069031},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.34309840202331543},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2024511992931366}],"concepts":[{"id":"https://openalex.org/C82517063","wikidata":"https://www.wikidata.org/wiki/Q1591315","display_name":"Slew rate","level":3,"score":0.769611120223999},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.709896445274353},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5799754858016968},{"id":"https://openalex.org/C145018004","wikidata":"https://www.wikidata.org/wiki/Q4985944","display_name":"Buffer (optical fiber)","level":2,"score":0.5543128252029419},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5353932976722717},{"id":"https://openalex.org/C127749002","wikidata":"https://www.wikidata.org/wiki/Q978470","display_name":"Buffer amplifier","level":4,"score":0.5101935863494873},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5028960108757019},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4525850713253021},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4291410446166992},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4129564166069031},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.34309840202331543},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2024511992931366},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2017.2736782","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2017.2736782","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7400000095367432,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G3849082996","display_name":null,"funder_award_id":"MOST 104-2622-E-006-040-CC2","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"},{"id":"https://openalex.org/G6897785083","display_name":null,"funder_award_id":"105-2221-E-110-058","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"},{"id":"https://openalex.org/G7469987219","display_name":null,"funder_award_id":"105-2218-E-110-006","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"}],"funders":[{"id":"https://openalex.org/F4320322795","display_name":"Ministry of Science and Technology, Taiwan","ror":"https://ror.org/02kv4zf79"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1561782264","https://openalex.org/W2032255010","https://openalex.org/W2055283523","https://openalex.org/W2072102935","https://openalex.org/W2100581498","https://openalex.org/W2101428762","https://openalex.org/W2106750098","https://openalex.org/W2115834537","https://openalex.org/W2120030291","https://openalex.org/W2121846737","https://openalex.org/W2132220603","https://openalex.org/W2140229217","https://openalex.org/W2143738690","https://openalex.org/W2144725761","https://openalex.org/W2152525104","https://openalex.org/W2164902374","https://openalex.org/W2169676602","https://openalex.org/W3047826795"],"related_works":["https://openalex.org/W2055638955","https://openalex.org/W1988628021","https://openalex.org/W1966592360","https://openalex.org/W1979513864","https://openalex.org/W1976372212","https://openalex.org/W170188723","https://openalex.org/W2138099004","https://openalex.org/W2024755917","https://openalex.org/W3107897010","https://openalex.org/W3201606877"],"abstract_inverted_index":{"This":[0,73],"paper":[1],"proposes":[2],"a":[3],"40-nm":[4,81],"CMOS":[5,82],"2\u00d7VDD":[6],"buffer":[7,74],"with":[8],"slew":[9],"rate":[10],"(SR)":[11],"variation":[12,25,103],"compensated":[13],"and":[14,33,107,113,125,129],"dynamic":[15,66,119],"leakage":[16,56,67,120],"reduction":[17,57],"during":[18],"signal":[19,69],"transitions.":[20],"By":[21],"using":[22,78],"the":[23,39,48,51,79,85],"dual":[24],"detectors,":[26],"five":[27],"process":[28],"corners":[29],"for":[30],"both":[31],"nMOS":[32],"pMOS":[34],"could":[35],"be":[36,43],"detected.":[37],"Thus,":[38],"SR":[40,102],"deviations":[41],"will":[42,59],"significantly":[44],"reduced":[45,122],"by":[46],"controlling":[47],"switches":[49],"of":[50,101],"output":[52],"stage":[53],"accordingly.":[54],"Besides,":[55],"circuit":[58],"shut":[60],"down":[61],"current":[62],"paths":[63],"to":[64,123],"reduce":[65],"after":[68],"transitions":[70],"are":[71],"completed.":[72],"design":[75],"is":[76,88,105,111,121],"implemented":[77],"typical":[80],"process,":[83],"where":[84],"active":[86],"area":[87],"0.052":[89],"\u00d7":[90],"0.213":[91],"mm":[92],"<sup":[93],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[94],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[95],".":[96],"The":[97,117],"measured":[98],"worst":[99],"case":[100],"improvement":[104],"20.8%":[106],"54.9%":[108],"when":[109],"VDDIO":[110],"0.9":[112,128],"1.8":[114,130],"V,":[115,131],"respectively.":[116,132],"peak":[118],"41.0%":[124],"37.5%":[126],"at":[127]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}