{"id":"https://openalex.org/W2587448511","doi":"https://doi.org/10.1109/tvlsi.2017.2655730","title":"Automatic ReRAM SPICE Model Generation From Empirical Data for Fast ReRAM-Circuit Coevaluation","display_name":"Automatic ReRAM SPICE Model Generation From Empirical Data for Fast ReRAM-Circuit Coevaluation","publication_year":2017,"publication_date":"2017-02-07","ids":{"openalex":"https://openalex.org/W2587448511","doi":"https://doi.org/10.1109/tvlsi.2017.2655730","mag":"2587448511"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2017.2655730","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2017.2655730","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029631923","display_name":"Jae-Hyun Seo","orcid":"https://orcid.org/0000-0002-1587-788X"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehyun Seo","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100611404","display_name":"Sangheon Lee","orcid":"https://orcid.org/0000-0003-1725-3226"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangheon Lee","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea","Department of Material Science and Engineering, Pohang University of Science and Technology, Pohang, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]},{"raw_affiliation_string":"Department of Material Science and Engineering, Pohang University of Science and Technology, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100641630","display_name":"Kwangmin Kim","orcid":"https://orcid.org/0000-0001-6462-6166"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kwangmin Kim","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074731467","display_name":"Sooeun Lee","orcid":"https://orcid.org/0000-0003-4340-3312"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sooeun Lee","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea","Department of Material Science and Engineering, Pohang University of Science and Technology, Pohang, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]},{"raw_affiliation_string":"Department of Material Science and Engineering, Pohang University of Science and Technology, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059294163","display_name":"Hyunsang Hwang","orcid":"https://orcid.org/0000-0003-1930-1914"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunsang Hwang","raw_affiliation_strings":["Department of Material Science and Engineering, Pohang University of Science and Technology, Pohang, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Material Science and Engineering, Pohang University of Science and Technology, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052722005","display_name":"Byungsub Kim","orcid":"https://orcid.org/0000-0003-1528-6235"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byungsub Kim","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-1528-6235","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I123900574"],"apc_list":null,"apc_paid":null,"fwci":0.5632,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.67478425,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"25","issue":"6","first_page":"1821","last_page":"1830"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.9351213574409485},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.9283732175827026},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49996304512023926},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3476080596446991},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29382145404815674},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1467318832874298},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12817421555519104}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.9351213574409485},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.9283732175827026},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49996304512023926},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3476080596446991},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29382145404815674},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1467318832874298},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12817421555519104}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tvlsi.2017.2655730","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2017.2655730","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},{"id":"pmh:oai:oasis.postech.ac.kr:2014.oak/39076","is_oa":false,"landing_page_url":"https://oasis.postech.ac.kr/handle/2014.oak/39076","pdf_url":null,"source":{"id":"https://openalex.org/S4306401965","display_name":"Open Access System for Information Sharing (Pohang University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I123900574","host_organization_name":"Pohang University of Science and Technology","host_organization_lineage":["https://openalex.org/I123900574"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"},{"id":"pmh:oai:oasis.postech.ac.kr:2014.oak/39199","is_oa":false,"landing_page_url":"https://oasis.postech.ac.kr/handle/2014.oak/39199","pdf_url":null,"source":{"id":"https://openalex.org/S4306401965","display_name":"Open Access System for Information Sharing (Pohang University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I123900574","host_organization_name":"Pohang University of Science and Technology","host_organization_lineage":["https://openalex.org/I123900574"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G512249419","display_name":null,"funder_award_id":"2015R1A2A2A09001553","funder_id":"https://openalex.org/F4320332195","funder_display_name":"Samsung"}],"funders":[{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"},{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1964092902","https://openalex.org/W1988217857","https://openalex.org/W1993062803","https://openalex.org/W2010160963","https://openalex.org/W2021267417","https://openalex.org/W2033811947","https://openalex.org/W2039053368","https://openalex.org/W2063308652","https://openalex.org/W2067242107","https://openalex.org/W2072866522","https://openalex.org/W2116487539","https://openalex.org/W2126810113","https://openalex.org/W2132503037","https://openalex.org/W2167784970","https://openalex.org/W2809425929"],"related_works":["https://openalex.org/W3195722497","https://openalex.org/W2167784970","https://openalex.org/W1980301972","https://openalex.org/W2587448511","https://openalex.org/W2610849239","https://openalex.org/W2041608016","https://openalex.org/W2088504085","https://openalex.org/W2037642033","https://openalex.org/W2360388749","https://openalex.org/W1674491244"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3],"automatic":[4],"resistive":[5],"random":[6],"access":[7],"memory":[8],"(ReRAM)":[9],"SPICE":[10,27,63,101],"model":[11,23,47,84],"generator,":[12],"which":[13],"enables":[14,125],"fast":[15,93],"ReRAM":[16,30,50,57,97,117,127],"circuit":[17],"evaluation":[18,95],"with":[19,76,108],"standard":[20],"SPICE.":[21],"Our":[22],"generator":[24],"automatically":[25,69],"produces":[26],"models":[28,64,102],"of":[29,54,96,103],"devices":[31,51],"and":[32,52,74,91,105],"selectors":[33],"from":[34,71],"the":[35,55,88,112],"measured":[36,72],"I-V":[37],"data":[38,73,90],"to":[39],"reduce":[40],"too":[41],"much":[42],"time":[43],"consumption":[44],"in":[45,116],"manual":[46],"development":[48],"for":[49,65],"simulation":[53],"target":[56],"circuits.":[58,78,98],"To":[59],"verify":[60],"our":[61,83,123],"method,":[62],"diverse":[66],"ReRAMs":[67,104],"were":[68],"generated":[70],"simulated":[75],"various":[77],"The":[79],"results":[80,120],"show":[81,121],"that":[82,122],"can":[85],"accurately":[86],"describe":[87],"original":[89],"allows":[92],"quantitative":[94],"Because":[99],"developing":[100],"simulating":[106],"them":[107],"circuits":[109],"have":[110],"been":[111],"critical":[113],"time-consuming":[114],"procedure":[115],"research,":[118],"these":[119],"method":[124],"early":[126],"evaluation.":[128]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2017-02-17T00:00:00"}