{"id":"https://openalex.org/W2579352521","doi":"https://doi.org/10.1109/tvlsi.2016.2643618","title":"Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier","display_name":"Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier","publication_year":2017,"publication_date":"2017-01-16","ids":{"openalex":"https://openalex.org/W2579352521","doi":"https://doi.org/10.1109/tvlsi.2016.2643618","mag":"2579352521"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2016.2643618","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2016.2643618","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091657819","display_name":"Innocent Agbo","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Innocent Agbo","raw_affiliation_strings":["Computer Engineering Laboratory, Delft University of Technology, Delft, CD, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technology, Delft, CD, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042250419","display_name":"Mottaqiallah Taouil","orcid":"https://orcid.org/0000-0002-9911-4846"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Mottaqiallah Taouil","raw_affiliation_strings":["Computer Engineering Laboratory, Delft University of Technology, Delft, CD, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technology, Delft, CD, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021719030","display_name":"Dani\u00ebl Kraak","orcid":"https://orcid.org/0000-0001-6892-1859"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Daniel Kraak","raw_affiliation_strings":["Computer Engineering Laboratory, Delft University of Technology, Delft, CD, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technology, Delft, CD, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005739146","display_name":"Said Hamdioui","orcid":"https://orcid.org/0000-0002-8961-0387"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Said Hamdioui","raw_affiliation_strings":["Computer Engineering Laboratory, Delft University of Technology, Delft, CD, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technology, Delft, CD, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013749399","display_name":"Halil K\u00fckner","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136567","display_name":"GlobalFoundries (Singapore)","ror":"https://ror.org/03whnfd14","country_code":"SG","type":"company","lineage":["https://openalex.org/I35662394","https://openalex.org/I4210136567"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Halil Kukner","raw_affiliation_strings":["GLOBALFOUNDRIES, Singapore"],"affiliations":[{"raw_affiliation_string":"GLOBALFOUNDRIES, Singapore","institution_ids":["https://openalex.org/I4210136567"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087726615","display_name":"Pieter Weckx","orcid":"https://orcid.org/0000-0003-4579-0571"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Pieter Weckx","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium","Katholieke Universiteit Leuven, 3001 ESAT, Belgium"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Katholieke Universiteit Leuven, 3001 ESAT, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113820250","display_name":"Praveen Raghavan","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]},{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Praveen Raghavan","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium","Katholieke Universiteit Leuven, 3001 ESAT, Belgium"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Katholieke Universiteit Leuven, 3001 ESAT, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033235745","display_name":"Francky Catthoor","orcid":"https://orcid.org/0000-0002-3599-8515"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Francky Catthoor","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium","Katholieke Universiteit Leuven, 3001 ESAT, Belgium"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Katholieke Universiteit Leuven, 3001 ESAT, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5091657819"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":3.2969,"has_fulltext":false,"cited_by_count":32,"citation_normalized_percentile":{"value":0.92535876,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"25","issue":"4","first_page":"1444","last_page":"1454"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sense-amplifier","display_name":"Sense amplifier","score":0.8921085596084595},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7173590660095215},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.640068769454956},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.630797266960144},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5512359142303467},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5441568493843079},{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.5183890461921692},{"id":"https://openalex.org/keywords/sense","display_name":"Sense (electronics)","score":0.5160784125328064},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.49440526962280273},{"id":"https://openalex.org/keywords/workload","display_name":"Workload","score":0.47559604048728943},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45996126532554626},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4505902826786041},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.43147915601730347},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35129934549331665},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.33200347423553467},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.30479228496551514},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2892181873321533},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.28105825185775757},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14486023783683777},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08056241273880005}],"concepts":[{"id":"https://openalex.org/C32666082","wikidata":"https://www.wikidata.org/wiki/Q7450979","display_name":"Sense amplifier","level":3,"score":0.8921085596084595},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7173590660095215},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.640068769454956},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.630797266960144},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5512359142303467},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5441568493843079},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.5183890461921692},{"id":"https://openalex.org/C143141573","wikidata":"https://www.wikidata.org/wiki/Q7450971","display_name":"Sense (electronics)","level":2,"score":0.5160784125328064},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.49440526962280273},{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.47559604048728943},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45996126532554626},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4505902826786041},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43147915601730347},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35129934549331665},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.33200347423553467},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.30479228496551514},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2892181873321533},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.28105825185775757},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14486023783683777},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08056241273880005},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2016.2643618","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2016.2643618","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":45,"referenced_works":["https://openalex.org/W1600691640","https://openalex.org/W1956210796","https://openalex.org/W1991431227","https://openalex.org/W1991891926","https://openalex.org/W1997825961","https://openalex.org/W2009592036","https://openalex.org/W2025263033","https://openalex.org/W2041505859","https://openalex.org/W2046796401","https://openalex.org/W2047325217","https://openalex.org/W2095665333","https://openalex.org/W2098045174","https://openalex.org/W2107603213","https://openalex.org/W2113115586","https://openalex.org/W2113631194","https://openalex.org/W2117648153","https://openalex.org/W2125263803","https://openalex.org/W2127877371","https://openalex.org/W2134067926","https://openalex.org/W2134869654","https://openalex.org/W2136376683","https://openalex.org/W2137706187","https://openalex.org/W2139823492","https://openalex.org/W2140823559","https://openalex.org/W2142908374","https://openalex.org/W2152422320","https://openalex.org/W2153258655","https://openalex.org/W2156186785","https://openalex.org/W2170333286","https://openalex.org/W2412027738","https://openalex.org/W2516030650","https://openalex.org/W2527187129","https://openalex.org/W2540699116","https://openalex.org/W2542352837","https://openalex.org/W2542799880","https://openalex.org/W2544896567","https://openalex.org/W3143610959","https://openalex.org/W4229927883","https://openalex.org/W4239927061","https://openalex.org/W4251213825","https://openalex.org/W6648088779","https://openalex.org/W6649741387","https://openalex.org/W6679196521","https://openalex.org/W6727929658","https://openalex.org/W7044018692"],"related_works":["https://openalex.org/W1835913819","https://openalex.org/W2051363901","https://openalex.org/W3150866391","https://openalex.org/W2029990318","https://openalex.org/W2601845499","https://openalex.org/W2127348582","https://openalex.org/W2117344730","https://openalex.org/W2119312496","https://openalex.org/W2136142653","https://openalex.org/W2107909712"],"abstract_inverted_index":{"The":[0,94,136],"CMOS":[1],"technology":[2,85,118],"scaling":[3],"faced":[4],"over":[5],"the":[6,17,29,34,47,54,60,72,75,97,101,110,115,121,129,141,164],"past":[7],"recent":[8],"decades":[9],"severe":[10],"variability":[11],"and":[12,65,78,83,91,117,120],"reliability":[13,19],"challenges.":[14],"One":[15],"of":[16,31,37,46,50,62,74,99,157],"major":[18],"challenges":[20],"is":[21,44,56],"bias":[22],"temperature":[23,66],"instability":[24],"(BTI).":[25],"This":[26],"paper":[27],"analyzes":[28],"impact":[30,61,143],"BTI":[32,142],"on":[33,114],"sensing":[35,122],"delay":[36,123,153],"standard":[38],"latch-type":[39],"sense":[40],"amplifier":[41],"(SA),":[42],"which":[43],"one":[45],"critical":[48],"components":[49],"high":[51],"performance":[52],"memories;":[53],"analysis":[55],"done":[57],"by":[58,79],"incorporating":[59],"process,":[63],"voltage,":[64],"variations":[67],"(in":[68],"order":[69],"to":[70,169],"investigate":[71],"severity":[73],"integral":[76],"impact)":[77],"considering":[80],"different":[81],"workloads":[82],"four":[84],"nodes":[86],"(i.e.,":[87],"45,":[88],"32,":[89],"22,":[90],"16":[92,134,148,175],"nm).":[93],"results":[95,137],"show":[96,139],"importance":[98],"taking":[100],"SA":[102,111],"degradation":[103,112,165],"into":[104],"consideration":[105],"for":[106,128,144,174],"robust":[107],"memory":[108],"design;":[109],"depends":[113],"application":[116],"node,":[119],"can":[124,166],"increase":[125],"with":[126],"184.58%":[127],"worst":[130],"case":[131],"conditions":[132,146,161],"at":[133,147,171],"nm.":[135,176],"also":[138],"that":[140],"nominal":[145],"nm":[149],"reaches":[150],"a":[151],"12.10%":[152],"increment.":[154],"On":[155],"top":[156],"that,":[158],"when":[159],"extrinsic":[160],"are":[162],"considered,":[163],"reach":[167],"up":[168],"168.45%":[170],"398":[172],"K":[173]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":10},{"year":2018,"cited_by_count":8},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}