{"id":"https://openalex.org/W2577238813","doi":"https://doi.org/10.1109/tvlsi.2016.2642055","title":"Data-Pattern-Aware Error Prevention Technique to Improve System Reliability","display_name":"Data-Pattern-Aware Error Prevention Technique to Improve System Reliability","publication_year":2017,"publication_date":"2017-01-11","ids":{"openalex":"https://openalex.org/W2577238813","doi":"https://doi.org/10.1109/tvlsi.2016.2642055","mag":"2577238813"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2016.2642055","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2016.2642055","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101687426","display_name":"Jie Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I170201317","display_name":"University of Pittsburgh","ror":"https://ror.org/01an3r305","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jie Guo","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA","Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA,,"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I170201317"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA,,","institution_ids":["https://openalex.org/I170201317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003409994","display_name":"Danghui Wang","orcid":"https://orcid.org/0000-0002-2783-9987"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Danghui Wang","raw_affiliation_strings":["School of Computer Science, Northwestern Polytechnical University, Xi\u2019an, China","School of Computer Science, Northwestern Polytechnical University, Xi'An, China#TAB#"],"affiliations":[{"raw_affiliation_string":"School of Computer Science, Northwestern Polytechnical University, Xi\u2019an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"School of Computer Science, Northwestern Polytechnical University, Xi'An, China#TAB#","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101639532","display_name":"Zili Shao","orcid":"https://orcid.org/0000-0002-2173-2847"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Zili Shao","raw_affiliation_strings":["School of Department of Computing, The Hong Kong Polytechnic University, Kowloon, Hong Kong","[School of Department of Computing, The Hong Kong Polytechnic University, Kowloon, Hong Kong]"],"affiliations":[{"raw_affiliation_string":"School of Department of Computing, The Hong Kong Polytechnic University, Kowloon, Hong Kong","institution_ids":["https://openalex.org/I14243506"]},{"raw_affiliation_string":"[School of Department of Computing, The Hong Kong Polytechnic University, Kowloon, Hong Kong]","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058073627","display_name":"Yiran Chen","orcid":"https://orcid.org/0000-0002-1486-8412"},"institutions":[{"id":"https://openalex.org/I170201317","display_name":"University of Pittsburgh","ror":"https://ror.org/01an3r305","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yiran Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA","Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA,,"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I170201317"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA,,","institution_ids":["https://openalex.org/I170201317"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101687426"],"corresponding_institution_ids":["https://openalex.org/I170201317"],"apc_list":null,"apc_paid":null,"fwci":1.036,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.78810119,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"25","issue":"4","first_page":"1433","last_page":"1443"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11478","display_name":"Caching and Content Delivery","score":0.9854999780654907,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9829000234603882,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6720433235168457},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6352776288986206},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6245741844177246},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.45748984813690186},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.19764387607574463},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19317415356636047}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6720433235168457},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6352776288986206},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6245741844177246},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.45748984813690186},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.19764387607574463},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19317415356636047},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2016.2642055","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2016.2642055","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7674620529","display_name":null,"funder_award_id":"CNS-1253424","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":52,"referenced_works":["https://openalex.org/W142764049","https://openalex.org/W1544971428","https://openalex.org/W1553622981","https://openalex.org/W1568181892","https://openalex.org/W1608061514","https://openalex.org/W1678883715","https://openalex.org/W1970154407","https://openalex.org/W1977139020","https://openalex.org/W1989221929","https://openalex.org/W2002129922","https://openalex.org/W2006637270","https://openalex.org/W2009487976","https://openalex.org/W2010390358","https://openalex.org/W2014536047","https://openalex.org/W2017904468","https://openalex.org/W2027725040","https://openalex.org/W2028260500","https://openalex.org/W2029719094","https://openalex.org/W2040880793","https://openalex.org/W2053376043","https://openalex.org/W2054973977","https://openalex.org/W2064435670","https://openalex.org/W2072766183","https://openalex.org/W2075026597","https://openalex.org/W2109190450","https://openalex.org/W2124570687","https://openalex.org/W2129821171","https://openalex.org/W2138643307","https://openalex.org/W2148114016","https://openalex.org/W2149359255","https://openalex.org/W2149539560","https://openalex.org/W2150714271","https://openalex.org/W2154809801","https://openalex.org/W2166538764","https://openalex.org/W2166741137","https://openalex.org/W2167514198","https://openalex.org/W2179360174","https://openalex.org/W2219142176","https://openalex.org/W2343421128","https://openalex.org/W2429046910","https://openalex.org/W2510018652","https://openalex.org/W2530888356","https://openalex.org/W4254522599","https://openalex.org/W4256191563","https://openalex.org/W6605716994","https://openalex.org/W6633130854","https://openalex.org/W6633954485","https://openalex.org/W6637448163","https://openalex.org/W6657870206","https://openalex.org/W6679248497","https://openalex.org/W6684586841","https://openalex.org/W6688776908"],"related_works":["https://openalex.org/W2374901194","https://openalex.org/W2764722704","https://openalex.org/W3147033875","https://openalex.org/W2355543518","https://openalex.org/W4233600955","https://openalex.org/W3005535424","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3116237489","https://openalex.org/W2490524130"],"abstract_inverted_index":{"Program":[0],"disturb,":[1,3],"read":[2],"and":[4,26,77,110],"retention":[5],"time":[6],"noise":[7],"are":[8,92],"identified":[9],"as":[10],"three":[11],"major":[12],"contributors":[13],"to":[14,62,83,94,124,144],"multilevel":[15],"cell":[16],"(MLC)":[17],"NAND":[18,35,67],"flash":[19,36,138],"memory":[20,37],"bit":[21,29],"errors.":[22],"With":[23],"program/erase":[24],"cycling":[25],"technology":[27],"scaling,":[28],"error":[30,59],"rate":[31],"(BER)":[32],"of":[33,66,75,87],"MLC":[34],"rapidly":[38],"increases.":[39],"Previous":[40],"works":[41],"revealed":[42],"that":[43,133],"BER":[44,109],"is":[45],"heavily":[46],"dependent":[47],"on":[48,52],"data":[49,82,89,101,121],"patterns.":[50],"Based":[51],"this":[53],"observation,":[54],"we":[55],"propose":[56],"data-pattern-aware":[57],"(DPA)":[58],"protection":[60],"technique":[61],"extend":[63],"the":[64,73,80,85,88,99,108,112,126],"lifespan":[65],"flash-based":[68],"storage":[69],"systems.":[70],"DPA":[71,116],"manipulates":[72],"ratios":[74],"0's":[76],"1's":[78],"in":[79],"stored":[81],"reduce":[84,107],"probability":[86],"patterns,":[90,102],"which":[91],"susceptible":[93],"device":[95],"noises.":[96],"By":[97],"minimizing":[98],"vulnerable":[100],"our":[103,134],"scheme":[104,117,123,135],"can":[105,136],"effectively":[106],"improves":[111],"system":[113,139],"endurance.":[114],"Our":[115],"also":[118],"incorporates":[119],"a":[120],"management":[122],"minimize":[125],"redundancy-induced":[127],"performance":[128],"overhead.":[129],"Simulation":[130],"results":[131],"show":[132],"increase":[137],"life":[140],"expectancy":[141],"by":[142],"up":[143],"4\u00d7.":[145]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}