{"id":"https://openalex.org/W2562125644","doi":"https://doi.org/10.1109/tvlsi.2016.2634589","title":"Fast Bit Screening of Automotive Grade EEPROMs\u2014Continuous Improvement Exercise","display_name":"Fast Bit Screening of Automotive Grade EEPROMs\u2014Continuous Improvement Exercise","publication_year":2016,"publication_date":"2016-12-24","ids":{"openalex":"https://openalex.org/W2562125644","doi":"https://doi.org/10.1109/tvlsi.2016.2634589","mag":"2562125644"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2016.2634589","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2016.2634589","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006256979","display_name":"Peter Sarson","orcid":"https://orcid.org/0000-0002-7150-2281"},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Peter G. Sarson","raw_affiliation_strings":["ams AG, Premstaetten, Austria"],"affiliations":[{"raw_affiliation_string":"ams AG, Premstaetten, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041976550","display_name":"Gregor Schatzberger","orcid":null},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Gregor Schatzberger","raw_affiliation_strings":["ams AG, Premstaetten, Austria"],"affiliations":[{"raw_affiliation_string":"ams AG, Premstaetten, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002804696","display_name":"F.P. Leisenberger","orcid":null},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Friedrich Peter Leisenberger","raw_affiliation_strings":["ams AG, Premstaetten, Austria"],"affiliations":[{"raw_affiliation_string":"ams AG, Premstaetten, Austria","institution_ids":["https://openalex.org/I154481106"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5006256979"],"corresponding_institution_ids":["https://openalex.org/I154481106"],"apc_list":null,"apc_paid":null,"fwci":0.6307,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.69390634,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":"25","issue":"4","first_page":"1250","last_page":"1260"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eeprom","display_name":"EEPROM","score":0.980388879776001},{"id":"https://openalex.org/keywords/eprom","display_name":"EPROM","score":0.7486043572425842},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5546090006828308},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5171300768852234},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5146554708480835},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.48486241698265076},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4503515958786011},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4470142424106598},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4208933711051941},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3883058428764343},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3589155077934265}],"concepts":[{"id":"https://openalex.org/C27699510","wikidata":"https://www.wikidata.org/wiki/Q205908","display_name":"EEPROM","level":2,"score":0.980388879776001},{"id":"https://openalex.org/C163980746","wikidata":"https://www.wikidata.org/wiki/Q378210","display_name":"EPROM","level":2,"score":0.7486043572425842},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5546090006828308},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5171300768852234},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5146554708480835},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.48486241698265076},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4503515958786011},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4470142424106598},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4208933711051941},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3883058428764343},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3589155077934265},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2016.2634589","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2016.2634589","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1529376452","https://openalex.org/W1552060644","https://openalex.org/W1564628567","https://openalex.org/W1974778496","https://openalex.org/W1980584607","https://openalex.org/W2011465881","https://openalex.org/W2051326582","https://openalex.org/W2082455736","https://openalex.org/W2109201401","https://openalex.org/W2125662822","https://openalex.org/W2134749475","https://openalex.org/W2164177689","https://openalex.org/W2259684755","https://openalex.org/W2399695735","https://openalex.org/W2407324296","https://openalex.org/W2462710487","https://openalex.org/W2542795754","https://openalex.org/W6645357560","https://openalex.org/W6653447723","https://openalex.org/W6678529707","https://openalex.org/W6712343069"],"related_works":["https://openalex.org/W2083975737","https://openalex.org/W2053931924","https://openalex.org/W1853632475","https://openalex.org/W2142133575","https://openalex.org/W2028906339","https://openalex.org/W1870416553","https://openalex.org/W2134529477","https://openalex.org/W2510382096","https://openalex.org/W2032705268","https://openalex.org/W2036350002"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"the":[3,23,27,36,48,55,86,113,130,141,145,153,156,161,166,170],"optimization":[4],"of":[5,19,22,88,140,155,169,173],"an":[6,33,89],"existing":[7],"electrically":[8],"eraseable":[9],"programmable":[10],"read-only":[11],"memory":[12,91],"(EEPROM)":[13],"production":[14,104,117],"test":[15,28,42,105,118,147],"flow":[16,119,148],"by":[17],"means":[18],"thorough":[20],"analysis":[21],"faulty":[24],"dice":[25],"and":[26,44,63,97,178],"flow,":[29],"which":[30,159],"leads":[31],"to":[32,59,80,108,125,151,164],"increase":[34],"in":[35,41,47,51,103,112,129,144],"yield,":[37],"a":[38,45,81,98],"significant":[39],"decrease":[40,46],"time,":[43],"dppm":[49],"(increase":[50],"quality)":[52],"level":[53],"leaving":[54],"factory.":[56],"In":[57,78],"order":[58],"manufacture":[60],"high":[61,82,110],"quality":[62,111,154],"cost-effective":[64],"EEPROMs":[65],"suitable":[66],"for":[67],"automotive":[68],"underhood":[69],"applications,":[70],"several":[71],"topics":[72],"must":[73,120,133],"be":[74,123,135],"taken":[75],"into":[76],"account.":[77],"addition":[79],"reliability":[83],"EEPROM":[84,116,146,167],"technology,":[85],"choice":[87],"advanced":[90],"architecture":[92],"including":[93],"error":[94],"correction":[95],"code":[96],"highly":[99],"sophisticated":[100],"screening":[101],"methodology":[102],"is":[106],"necessary":[107],"achieve":[109],"field.":[114],"The":[115],"not":[121],"only":[122],"able":[124],"screen":[126],"out":[127],"weaknesses":[128],"process":[131],"but":[132],"also":[134],"cost":[136],"efficient.":[137],"A":[138],"majority":[139],"tests":[142,175],"executed":[143],"are":[149,160,176],"needed":[150],"check":[152],"processed":[157],"oxides,":[158],"basic":[162],"elements":[163],"realize":[165],"function":[168],"memory.":[171],"Most":[172],"these":[174],"complex":[177],"time-consuming.":[179]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}