{"id":"https://openalex.org/W2554231239","doi":"https://doi.org/10.1109/tvlsi.2016.2625598","title":"&lt;italic&gt;In Situ&lt;/italic&gt; Error Detection Techniques in Ultralow Voltage Pipelines: Analysis and Optimizations","display_name":"&lt;italic&gt;In Situ&lt;/italic&gt; Error Detection Techniques in Ultralow Voltage Pipelines: Analysis and Optimizations","publication_year":2016,"publication_date":"2016-11-16","ids":{"openalex":"https://openalex.org/W2554231239","doi":"https://doi.org/10.1109/tvlsi.2016.2625598","mag":"2554231239"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2016.2625598","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2016.2625598","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100640242","display_name":"Wei Jin","orcid":"https://orcid.org/0000-0001-5108-5233"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]},{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["CN","US"],"is_corresponding":true,"raw_author_name":"Wei Jin","raw_affiliation_strings":["Columbia University, New York, NY, USA","Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]},{"raw_affiliation_string":"Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101677870","display_name":"Seongjong Kim","orcid":"https://orcid.org/0000-0002-8263-4597"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seongjong Kim","raw_affiliation_strings":["Columbia University, New York, NY, USA"],"affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101583945","display_name":"Weifeng He","orcid":"https://orcid.org/0000-0002-7753-644X"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weifeng He","raw_affiliation_strings":["Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103236320","display_name":"Zhigang Mao","orcid":"https://orcid.org/0000-0001-9431-9853"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhigang Mao","raw_affiliation_strings":["Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011887658","display_name":"Mingoo Seok","orcid":"https://orcid.org/0000-0002-9722-0979"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mingoo Seok","raw_affiliation_strings":["Columbia University, New York, NY, USA"],"affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100640242"],"corresponding_institution_ids":["https://openalex.org/I183067930","https://openalex.org/I78577930"],"apc_list":null,"apc_paid":null,"fwci":1.6539,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.85817927,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"25","issue":"3","first_page":"1032","last_page":"1043"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pipeline-transport","display_name":"Pipeline transport","score":0.5373380184173584},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.39420825242996216},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3375024199485779},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21525150537490845}],"concepts":[{"id":"https://openalex.org/C175309249","wikidata":"https://www.wikidata.org/wiki/Q725864","display_name":"Pipeline transport","level":2,"score":0.5373380184173584},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.39420825242996216},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3375024199485779},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21525150537490845},{"id":"https://openalex.org/C87717796","wikidata":"https://www.wikidata.org/wiki/Q146326","display_name":"Environmental engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2016.2625598","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2016.2625598","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5227638562","display_name":null,"funder_award_id":"HR0011-13-C-0003","funder_id":"https://openalex.org/F4320332180","funder_display_name":"Defense Advanced Research Projects Agency"},{"id":"https://openalex.org/G5415761988","display_name":null,"funder_award_id":"1453142","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G7691616827","display_name":null,"funder_award_id":"201406230166","funder_id":"https://openalex.org/F4320322725","funder_display_name":"China Scholarship Council"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320322725","display_name":"China Scholarship Council","ror":"https://ror.org/04atp4p48"},{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1966733028","https://openalex.org/W1992373463","https://openalex.org/W1998525920","https://openalex.org/W2007643334","https://openalex.org/W2015917466","https://openalex.org/W2026531723","https://openalex.org/W2031390917","https://openalex.org/W2039559700","https://openalex.org/W2082597509","https://openalex.org/W2101466451","https://openalex.org/W2102587899","https://openalex.org/W2105485345","https://openalex.org/W2106648230","https://openalex.org/W2137616964","https://openalex.org/W2163108907","https://openalex.org/W2170331607","https://openalex.org/W2173315554","https://openalex.org/W2174721295","https://openalex.org/W2178304595","https://openalex.org/W2289333215","https://openalex.org/W2525832288","https://openalex.org/W3142269918","https://openalex.org/W4236991801","https://openalex.org/W4245115327","https://openalex.org/W6660155203","https://openalex.org/W6685416368"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W2350741829","https://openalex.org/W2530322880","https://openalex.org/W1596801655"],"abstract_inverted_index":{"In":[0,48],"order":[1],"to":[2,44,97,120],"achieve":[3],"high":[4],"tolerance":[5],"against":[6],"process,":[7],"voltage,":[8],"and":[9,22,71,94,158],"temperature":[10],"variations":[11],"in":[12,18,41,60,117,139],"the":[13,31,53,76,91,99,153,159],"ultralow":[14],"voltage":[15],"(ULV)":[16],"circuits,":[17],"situ":[19],"error":[20,34,57,87,160],"detection":[21,35,58],"correction":[23],"(EDAC)":[24],"techniques":[25,59,127,150],"were":[26],"presented.":[27],"However,":[28],"circuits":[29,119],"adding":[30],"capability":[32],"of":[33,56,86],"incur":[36],"large":[37],"hardware":[38,54,123],"overhead,":[39],"especially":[40],"ULV":[42,118],"due":[43],"larger":[45],"delay":[46],"variability.":[47],"this":[49],"paper,":[50],"we":[51,79,104],"analyze":[52],"overhead":[55],"pipelines":[61,96],"based":[62],"on":[63,90,130],"three":[64],"different":[65],"sequential":[66,100],"elements:":[67],"flip-flops,":[68],"two-phase":[69,92],"latches,":[70],"pulsed":[72],"latches.":[73],"By":[74],"exploiting":[75],"cycle-borrowing":[77],"ability,":[78],"propose":[80,105],"a":[81,106,110,131,140],"technique":[82],"called":[83],"sparse":[84],"insertion":[85],"detecting":[88,161],"registers":[89],"latch-based":[93],"pulsed-latch-based":[95],"reduce":[98,121,152],"logic":[101],"area.":[102],"Furthermore,":[103],"delay-padding":[107],"methodology":[108],"using":[109],"multi-V":[111],"<sub":[112],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[113],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">t</sub>":[114],"cell":[115],"library":[116],"EDAC":[122,169],"overhead.":[124],"The":[125,143],"proposed":[126,149],"are":[128],"applied":[129],"benchmark":[132],"six-stage":[133],"pipeline":[134],"operating":[135],"at":[136],"0.35":[137],"V":[138],"65-nm":[141],"CMOS.":[142],"analysis":[144],"results":[145],"show":[146],"that":[147],"our":[148],"can":[151],"total":[154],"area":[155],"by":[156,164],"26%-33%":[157],"register":[162],"count":[163],"2.9-4.3\u00d7":[165],"compared":[166],"with":[167],"conventional":[168],"techniques.":[170]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}