{"id":"https://openalex.org/W2522616335","doi":"https://doi.org/10.1109/tvlsi.2016.2569532","title":"A Fault Tolerance Technique for Combinational Circuits Based on Selective-Transistor Redundancy","display_name":"A Fault Tolerance Technique for Combinational Circuits Based on Selective-Transistor Redundancy","publication_year":2016,"publication_date":"2016-05-30","ids":{"openalex":"https://openalex.org/W2522616335","doi":"https://doi.org/10.1109/tvlsi.2016.2569532","mag":"2522616335"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2016.2569532","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2016.2569532","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036164568","display_name":"Ahmad T. Sheikh","orcid":"https://orcid.org/0000-0002-7235-9691"},"institutions":[{"id":"https://openalex.org/I134085113","display_name":"King Fahd University of Petroleum and Minerals","ror":"https://ror.org/03yez3163","country_code":"SA","type":"education","lineage":["https://openalex.org/I134085113"]}],"countries":["SA"],"is_corresponding":true,"raw_author_name":"Ahmad T. Sheikh","raw_affiliation_strings":["College of Computer Science and Engineering, King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia"],"raw_orcid":"https://orcid.org/0000-0002-7235-9691","affiliations":[{"raw_affiliation_string":"College of Computer Science and Engineering, King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia","institution_ids":["https://openalex.org/I134085113"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086020181","display_name":"Aiman H. El\u2010Maleh","orcid":"https://orcid.org/0000-0002-3247-0598"},"institutions":[{"id":"https://openalex.org/I134085113","display_name":"King Fahd University of Petroleum and Minerals","ror":"https://ror.org/03yez3163","country_code":"SA","type":"education","lineage":["https://openalex.org/I134085113"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Aiman H. El-Maleh","raw_affiliation_strings":["Computer Engineering Department, King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia","institution_ids":["https://openalex.org/I134085113"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065409583","display_name":"Muhammad E. S. Elrabaa","orcid":"https://orcid.org/0000-0002-4643-0853"},"institutions":[{"id":"https://openalex.org/I134085113","display_name":"King Fahd University of Petroleum and Minerals","ror":"https://ror.org/03yez3163","country_code":"SA","type":"education","lineage":["https://openalex.org/I134085113"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Muhammad E. S. Elrabaa","raw_affiliation_strings":["Computer Engineering Department, King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia","institution_ids":["https://openalex.org/I134085113"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017285624","display_name":"Sadiq M. Sait","orcid":"https://orcid.org/0000-0002-4796-0581"},"institutions":[{"id":"https://openalex.org/I134085113","display_name":"King Fahd University of Petroleum and Minerals","ror":"https://ror.org/03yez3163","country_code":"SA","type":"education","lineage":["https://openalex.org/I134085113"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Sadiq M. Sait","raw_affiliation_strings":["Computer Engineering Department, King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia","institution_ids":["https://openalex.org/I134085113"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5036164568"],"corresponding_institution_ids":["https://openalex.org/I134085113"],"apc_list":null,"apc_paid":null,"fwci":2.7895,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.91178766,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"25","issue":"1","first_page":"224","last_page":"237"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.752653181552887},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.7032490372657776},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6501235365867615},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5350486040115356},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5306338667869568},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.496620237827301},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4469807744026184},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4150155484676361},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.395262748003006},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3210141658782959},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.26879894733428955},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2526693642139435},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2095898687839508},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0891616940498352}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.752653181552887},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.7032490372657776},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6501235365867615},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5350486040115356},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5306338667869568},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.496620237827301},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4469807744026184},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4150155484676361},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.395262748003006},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3210141658782959},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.26879894733428955},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2526693642139435},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2095898687839508},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0891616940498352}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2016.2569532","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2016.2569532","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5400000214576721}],"awards":[{"id":"https://openalex.org/G7290144199","display_name":null,"funder_award_id":"IN131014","funder_id":"https://openalex.org/F4320322323","funder_display_name":"King Fahd University of Petroleum and Minerals"}],"funders":[{"id":"https://openalex.org/F4320322323","display_name":"King Fahd University of Petroleum and Minerals","ror":"https://ror.org/03yez3163"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":55,"referenced_works":["https://openalex.org/W1484520464","https://openalex.org/W1489489324","https://openalex.org/W1511688816","https://openalex.org/W1541483005","https://openalex.org/W1565030957","https://openalex.org/W1566296806","https://openalex.org/W1583619271","https://openalex.org/W1592886836","https://openalex.org/W1870528983","https://openalex.org/W1951775667","https://openalex.org/W1967835393","https://openalex.org/W1988477180","https://openalex.org/W1990185544","https://openalex.org/W1995607470","https://openalex.org/W1999039453","https://openalex.org/W2004047298","https://openalex.org/W2004688003","https://openalex.org/W2022829874","https://openalex.org/W2026055941","https://openalex.org/W2029293703","https://openalex.org/W2030501553","https://openalex.org/W2042559971","https://openalex.org/W2061643944","https://openalex.org/W2071068906","https://openalex.org/W2081215702","https://openalex.org/W2096927458","https://openalex.org/W2099569658","https://openalex.org/W2102849483","https://openalex.org/W2104489073","https://openalex.org/W2105761964","https://openalex.org/W2111713070","https://openalex.org/W2128248970","https://openalex.org/W2133934114","https://openalex.org/W2134225871","https://openalex.org/W2137504933","https://openalex.org/W2141068710","https://openalex.org/W2153953229","https://openalex.org/W2159262743","https://openalex.org/W2167865703","https://openalex.org/W2169213530","https://openalex.org/W2170408097","https://openalex.org/W2327121431","https://openalex.org/W2497735908","https://openalex.org/W2532367691","https://openalex.org/W2536220680","https://openalex.org/W2889024928","https://openalex.org/W3149410719","https://openalex.org/W3182208082","https://openalex.org/W4231340621","https://openalex.org/W4251881069","https://openalex.org/W6628937319","https://openalex.org/W6630623413","https://openalex.org/W6657016603","https://openalex.org/W6666080695","https://openalex.org/W6685336676"],"related_works":["https://openalex.org/W2128496560","https://openalex.org/W2153096481","https://openalex.org/W2095349217","https://openalex.org/W2148616436","https://openalex.org/W2102525122","https://openalex.org/W2126951255","https://openalex.org/W4248162147","https://openalex.org/W4306316843","https://openalex.org/W2036953450","https://openalex.org/W2130594209"],"abstract_inverted_index":{"With":[0],"fabrication":[1],"technology":[2,165],"reaching":[3],"nanolevels,":[4],"systems":[5],"are":[6,76,129],"becoming":[7],"more":[8],"prone":[9],"to":[10,16,94,108,131],"manufacturing":[11],"defects":[12],"with":[13,31,117,157],"higher":[14],"susceptibility":[15],"soft":[17,28,54],"errors.":[18],"This":[19],"paper":[20],"is":[21,37,58,65,73,102],"focused":[22],"on":[23,39,79],"designing":[24],"combinational":[25],"circuits":[26,128],"for":[27,88,162],"error":[29,55],"tolerance":[30],"minimal":[32],"area":[33,70,160],"overhead.":[34],"The":[35],"idea":[36],"based":[38,78],"analyzing":[40],"random":[41],"pattern":[42],"testability":[43],"of":[44,85,120],"faults":[45],"in":[46,123],"a":[47,68,83,96,167],"circuit":[48,63],"and":[49,81,151],"protecting":[50],"sensitive":[51],"transistors,":[52],"whose":[53],"detection":[56],"probability":[57],"relatively":[59],"high,":[60],"until":[61],"desired":[62],"reliability":[64,99,109,145],"achieved":[66],"or":[67],"given":[69],"overhead":[71,161],"constraint":[72],"met.":[74],"Transistors":[75],"protected":[77],"duplicating":[80],"sizing":[82],"subset":[84],"transistors":[86],"necessary":[87],"providing":[89],"the":[90,112,118,133,140,152],"protection.":[91],"In":[92],"addition":[93],"that,":[95],"novel":[97],"gate-level":[98],"evaluation":[100,110],"technique":[101,156],"proposed":[103,134,141],"that":[104,139],"provides":[105],"similar":[106],"results":[107,137],"at":[111,166],"transistor":[113,148],"level":[114],"(using":[115],"SPICE)":[116],"orders":[119],"magnitude":[121],"reduction":[122],"CPU":[124],"time.":[125],"LGSynth'91":[126],"benchmark":[127],"used":[130],"evaluate":[132],"algorithm.":[135],"Simulation":[136],"show":[138],"algorithm":[142],"achieves":[143],"better":[144],"than":[146],"other":[147],"sizing-based":[149],"techniques":[150],"triple":[153],"modular":[154],"redundancy":[155],"significantly":[158],"lower":[159],"130-nm":[163],"process":[164],"ground":[168],"level.":[169]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":7}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}