{"id":"https://openalex.org/W2335318588","doi":"https://doi.org/10.1109/tvlsi.2016.2533444","title":"A Test Selection Procedure for Improving the Accuracy of Defect Diagnosis","display_name":"A Test Selection Procedure for Improving the Accuracy of Defect Diagnosis","publication_year":2016,"publication_date":"2016-03-08","ids":{"openalex":"https://openalex.org/W2335318588","doi":"https://doi.org/10.1109/tvlsi.2016.2533444","mag":"2335318588"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2016.2533444","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2016.2533444","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032651920","display_name":"Irith Pomeranz","orcid":"https://orcid.org/0000-0002-5491-7282"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Irith Pomeranz","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5032651920"],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":2.5227,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.88433327,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"24","issue":"8","first_page":"2759","last_page":"2767"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9854999780654907,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.5889812707901001},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5401470065116882},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5297197699546814},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5082404017448425},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.47801053524017334},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3340851664543152},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18059289455413818},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.12666457891464233},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10997477173805237}],"concepts":[{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.5889812707901001},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5401470065116882},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5297197699546814},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5082404017448425},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.47801053524017334},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3340851664543152},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18059289455413818},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.12666457891464233},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10997477173805237},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2016.2533444","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2016.2533444","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","score":0.41999998688697815,"id":"https://metadata.un.org/sdg/16"}],"awards":[{"id":"https://openalex.org/G3240848558","display_name":null,"funder_award_id":"2013-TJ-2469","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"}],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1510159504","https://openalex.org/W1554885925","https://openalex.org/W1981209220","https://openalex.org/W2002203901","https://openalex.org/W2007561585","https://openalex.org/W2031335280","https://openalex.org/W2045217056","https://openalex.org/W2096268091","https://openalex.org/W2129401784","https://openalex.org/W2131814033","https://openalex.org/W2138735239","https://openalex.org/W2167012192","https://openalex.org/W2283559063","https://openalex.org/W2416509968","https://openalex.org/W3146581747","https://openalex.org/W4237466351","https://openalex.org/W4243681061"],"related_works":["https://openalex.org/W2131559056","https://openalex.org/W4254560580","https://openalex.org/W2127167802","https://openalex.org/W2080984854","https://openalex.org/W2323083271","https://openalex.org/W2019500818","https://openalex.org/W2009690023","https://openalex.org/W2156691306","https://openalex.org/W3174838144","https://openalex.org/W2151982538"],"abstract_inverted_index":{"Procedures":[0],"that":[1,31,62,83,106,131],"were":[2],"described":[3],"earlier":[4],"increase":[5],"the":[6,34,59,104,109,119,132,147],"accuracy":[7,145],"of":[8,15,33,50,70,116,121,134,144,149,152],"defect":[9,44],"diagnosis":[10,76],"by":[11],"ignoring":[12],"small":[13,48,68],"subsets":[14,69],"tests":[16,35,51,71,92,117,135],"in":[17,36,108],"order":[18],"to":[19,53,66,72],"produce":[20],"smaller":[21],"candidate":[22,111,122,138,154],"fault":[23,112,139,155],"sets.":[24],"The":[25,97,114],"premise":[26],"behind":[27],"these":[28,153],"procedures":[29],"is":[30,64,103],"most":[32],"a":[37,81,95],"given":[38],"test":[39,88,98],"set":[40],"are":[41],"useful":[42],"for":[43,127,160],"diagnosis,":[45],"and":[46,90],"only":[47],"numbers":[49],"need":[52],"be":[54,158],"ignored.":[55],"This":[56,78],"paper":[57,79],"makes":[58],"new":[60],"observation":[61],"it":[63],"possible":[65],"use":[67],"obtain":[73],"more":[74,137],"accurate":[75],"results.":[77],"describes":[80],"procedure":[82],"starts":[84],"from":[85],"an":[86],"empty":[87],"set,":[89],"adds":[91],"one":[93,105],"at":[94,100],"time.":[96],"selected":[99],"every":[101],"iteration":[102],"results":[107,126],"smallest":[110],"set.":[113],"addition":[115,133],"increases":[118],"number":[120],"faults":[123],"gradually.":[124],"Experimental":[125],"benchmark":[128],"circuits":[129],"demonstrate":[130],"provides":[136],"sets":[140,156],"with":[141],"higher":[142],"degrees":[143],"than":[146],"removal":[148],"tests.":[150],"One":[151],"can":[157],"used":[159],"failure":[161],"analysis.":[162]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}