{"id":"https://openalex.org/W2059164349","doi":"https://doi.org/10.1109/tvlsi.2014.2354378","title":"High Repair-Efficiency BISR Scheme for RAMs by Reusing Bitmap for Bit Redundancy","display_name":"High Repair-Efficiency BISR Scheme for RAMs by Reusing Bitmap for Bit Redundancy","publication_year":2014,"publication_date":"2014-09-12","ids":{"openalex":"https://openalex.org/W2059164349","doi":"https://doi.org/10.1109/tvlsi.2014.2354378","mag":"2059164349"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2014.2354378","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2014.2354378","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081576356","display_name":"Chih-Sheng Hou","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Sheng Hou","raw_affiliation_strings":["Advanced Reliable Systems Laboratory, National Central University, Zhongli, Taiwan","Department of Electrical EngineeringAdvanced Reliable Systems Laboratory, National Central University, Zhongli, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Reliable Systems Laboratory, National Central University, Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Department of Electrical EngineeringAdvanced Reliable Systems Laboratory, National Central University, Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100741020","display_name":"Jin-Fu Li","orcid":"https://orcid.org/0000-0003-1961-9674"},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jin-Fu Li","raw_affiliation_strings":["Advanced Reliable Systems Laboratory, National Central University, Zhongli, Taiwan","Department of Electrical EngineeringAdvanced Reliable Systems Laboratory, National Central University, Zhongli, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Reliable Systems Laboratory, National Central University, Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Department of Electrical EngineeringAdvanced Reliable Systems Laboratory, National Central University, Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I22265921"],"apc_list":null,"apc_paid":null,"fwci":2.0895,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.8861632,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"23","issue":"9","first_page":"1720","last_page":"1728"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.8073979616165161},{"id":"https://openalex.org/keywords/bitmap","display_name":"Bitmap","score":0.7830262780189514},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7489850521087646},{"id":"https://openalex.org/keywords/row","display_name":"Row","score":0.4565976560115814},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.43843603134155273},{"id":"https://openalex.org/keywords/cyclic-redundancy-check","display_name":"Cyclic redundancy check","score":0.420878529548645},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41372671723365784},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38984593749046326},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3880879580974579},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.38232746720314026},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3569697141647339},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.33067065477371216},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.18317216634750366},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.07753309607505798}],"concepts":[{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.8073979616165161},{"id":"https://openalex.org/C3115412","wikidata":"https://www.wikidata.org/wiki/Q1194708","display_name":"Bitmap","level":2,"score":0.7830262780189514},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7489850521087646},{"id":"https://openalex.org/C135598885","wikidata":"https://www.wikidata.org/wiki/Q1366302","display_name":"Row","level":2,"score":0.4565976560115814},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.43843603134155273},{"id":"https://openalex.org/C137627569","wikidata":"https://www.wikidata.org/wiki/Q245471","display_name":"Cyclic redundancy check","level":3,"score":0.420878529548645},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41372671723365784},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38984593749046326},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3880879580974579},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.38232746720314026},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3569697141647339},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.33067065477371216},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.18317216634750366},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.07753309607505798},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2014.2354378","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2014.2354378","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2941394907","display_name":null,"funder_award_id":"NSC-101-2221-E-008-130-MY3","funder_id":"https://openalex.org/F4320321040","funder_display_name":"National Science Council"},{"id":"https://openalex.org/G8830351471","display_name":null,"funder_award_id":"NSC-102-2221-E-008-108-MY3","funder_id":"https://openalex.org/F4320321040","funder_display_name":"National Science Council"}],"funders":[{"id":"https://openalex.org/F4320321040","display_name":"National Science Council","ror":"https://ror.org/02kv4zf79"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1509465067","https://openalex.org/W1904762676","https://openalex.org/W1922918362","https://openalex.org/W1966747106","https://openalex.org/W1973508428","https://openalex.org/W1976009011","https://openalex.org/W2040066907","https://openalex.org/W2060071452","https://openalex.org/W2079486027","https://openalex.org/W2097643666","https://openalex.org/W2098987953","https://openalex.org/W2100312232","https://openalex.org/W2102048395","https://openalex.org/W2105064876","https://openalex.org/W2116273964","https://openalex.org/W2121556616","https://openalex.org/W2124479423","https://openalex.org/W2129780639","https://openalex.org/W2132584944","https://openalex.org/W2132635813","https://openalex.org/W2136323667","https://openalex.org/W2136759973","https://openalex.org/W2138356008","https://openalex.org/W2139269776","https://openalex.org/W2141400030","https://openalex.org/W2149233130","https://openalex.org/W2152425525","https://openalex.org/W2155640457","https://openalex.org/W2155888756","https://openalex.org/W2157130998","https://openalex.org/W2164674249","https://openalex.org/W2169087039","https://openalex.org/W2169312773","https://openalex.org/W2169342007","https://openalex.org/W6675341223"],"related_works":["https://openalex.org/W1976009011","https://openalex.org/W2539765418","https://openalex.org/W2257995899","https://openalex.org/W2594657263","https://openalex.org/W2121556616","https://openalex.org/W2106978220","https://openalex.org/W1922918362","https://openalex.org/W2124479423","https://openalex.org/W2018421045","https://openalex.org/W2059164349"],"abstract_inverted_index":{"A":[0],"built-in":[1,15],"self-repair":[2],"(BISR)":[3],"scheme":[4,46,97,108,137,171],"for":[5,19,33,47,77,144,152,181],"random":[6],"access":[7],"memories":[8],"(RAMs)":[9],"with":[10,80,160,172],"2-D":[11],"redundancy":[12,16,73],"has":[13,26],"a":[14,27,42,71,78,105,153],"analyzer":[17],"(BIRA)":[18],"allocating":[20],"the":[21,35,54,94,111,127,135,169],"redundancy.":[22],"The":[23,51],"BIRA":[24],"typically":[25],"cache-like":[28],"element":[29],"called":[30],"local":[31,55,112,128,142],"bitmap":[32,56,113,129,143],"storing":[34],"fault":[36,183],"information":[37],"temporary.":[38],"In":[39,69,133],"this":[40],"paper,":[41],"high-repair-efficiency":[43],"BISR":[44,107],"(HRE-BISR)":[45],"RAMs":[48],"is":[49,88,123],"proposed.":[50],"HRE-BISR":[52,96,136],"reuses":[53],"to":[57,125],"serve":[58],"as":[59,114,130],"spare":[60,81,83,86,115,131,162,166],"bits":[61,87],"such":[62],"that":[63,93],"it":[64],"can":[65,98,175],"repair":[66,101],"more":[67],"faults.":[68],"addition,":[70,134],"row/column/bit":[72],"analysis":[74],"(RCB-RA)":[75],"algorithm":[76,174],"RAM":[79,159],"rows,":[82],"columns,":[84],"and":[85,164],"presented.":[89],"Simulation":[90],"results":[91],"show":[92],"proposed":[95],"provide":[99,176],"higher":[100],"rate":[102],"(RR)":[103],"than":[104],"typical":[106],"without":[109],"reusing":[110],"bits.":[116,132],"Only":[117],"about":[118,148],"0.44%":[119],"additional":[120],"hardware":[121],"overhead":[122],"needed":[124],"modify":[126],"using":[138],"3":[139],"\u00d7":[140,155,157],"3-bit":[141],"RA":[145],"only":[146],"incurs":[147],"0.08-ns":[149],"delay":[150],"penalty":[151],"512":[154],"16":[156],"32-bit":[158],"one":[161,165],"row":[163],"column.":[167],"However,":[168],"HRE-BIRA":[170],"RCB-RA":[173],"0.48%-11.95%":[177],"increment":[178],"of":[179],"RR":[180],"different":[182],"distributions.":[184]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}