{"id":"https://openalex.org/W2146979290","doi":"https://doi.org/10.1109/tvlsi.2014.2321393","title":"A CMOS PWM Transceiver Using Self-Referenced Edge Detection","display_name":"A CMOS PWM Transceiver Using Self-Referenced Edge Detection","publication_year":2015,"publication_date":"2015-01-23","ids":{"openalex":"https://openalex.org/W2146979290","doi":"https://doi.org/10.1109/tvlsi.2014.2321393","mag":"2146979290"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2014.2321393","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tvlsi.2014.2321393","pdf_url":"https://ieeexplore.ieee.org/ielx7/92/7110706/06822641.pdf","source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/92/7110706/06822641.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056677721","display_name":"Kiichi Niitsu","orcid":"https://orcid.org/0000-0002-3813-3955"},"institutions":[{"id":"https://openalex.org/I60134161","display_name":"Nagoya University","ror":"https://ror.org/04chrp450","country_code":"JP","type":"education","lineage":["https://openalex.org/I60134161"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kiichi Niitsu","raw_affiliation_strings":["Department of Electronic Engineering and Computer Science, Nagoya University, Nagoya, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering and Computer Science, Nagoya University, Nagoya, Japan","institution_ids":["https://openalex.org/I60134161"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011626454","display_name":"Yusuke Osawa","orcid":"https://orcid.org/0000-0002-8823-3532"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]},{"id":"https://openalex.org/I258063972","display_name":"Kiryu University","ror":"https://ror.org/02snehe53","country_code":"JP","type":"education","lineage":["https://openalex.org/I258063972"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yusuke Osawa","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Japan","institution_ids":["https://openalex.org/I165735259","https://openalex.org/I258063972"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089541278","display_name":"Naohiro Harigai","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]},{"id":"https://openalex.org/I258063972","display_name":"Kiryu University","ror":"https://ror.org/02snehe53","country_code":"JP","type":"education","lineage":["https://openalex.org/I258063972"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Naohiro Harigai","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Japan","institution_ids":["https://openalex.org/I165735259","https://openalex.org/I258063972"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031069725","display_name":"Daiki Hirabayashi","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]},{"id":"https://openalex.org/I258063972","display_name":"Kiryu University","ror":"https://ror.org/02snehe53","country_code":"JP","type":"education","lineage":["https://openalex.org/I258063972"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Daiki Hirabayashi","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Japan","institution_ids":["https://openalex.org/I165735259","https://openalex.org/I258063972"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019563893","display_name":"Osamu Kobayashi","orcid":"https://orcid.org/0000-0001-8037-4624"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Osamu Kobayashi","raw_affiliation_strings":["STARC, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STARC, Yokohama, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010763159","display_name":"Takahiro Yamaguchi","orcid":"https://orcid.org/0000-0003-0325-8878"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro J. Yamaguchi","raw_affiliation_strings":["Advantest Laboratories Ltd., Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Laboratories Ltd., Sendai, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101691738","display_name":"Haruo Kobayashi","orcid":"https://orcid.org/0000-0002-0990-5522"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]},{"id":"https://openalex.org/I258063972","display_name":"Kiryu University","ror":"https://ror.org/02snehe53","country_code":"JP","type":"education","lineage":["https://openalex.org/I258063972"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruo Kobayashi","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Japan","institution_ids":["https://openalex.org/I165735259","https://openalex.org/I258063972"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4813,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.70141337,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"23","issue":"6","first_page":"1145","last_page":"1149"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7334569096565247},{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.6749708652496338},{"id":"https://openalex.org/keywords/signal-edge","display_name":"Signal edge","score":0.6170568466186523},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6150997877120972},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.5576813220977783},{"id":"https://openalex.org/keywords/pulse-width-modulation","display_name":"Pulse-width modulation","score":0.5442625880241394},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5310450196266174},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.472801148891449},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4337875247001648},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27234819531440735},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2220161259174347},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.22006046772003174},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2021581530570984},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18862971663475037},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.16520950198173523}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7334569096565247},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.6749708652496338},{"id":"https://openalex.org/C117525741","wikidata":"https://www.wikidata.org/wiki/Q775654","display_name":"Signal edge","level":4,"score":0.6170568466186523},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6150997877120972},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.5576813220977783},{"id":"https://openalex.org/C92746544","wikidata":"https://www.wikidata.org/wiki/Q585184","display_name":"Pulse-width modulation","level":3,"score":0.5442625880241394},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5310450196266174},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.472801148891449},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4337875247001648},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27234819531440735},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2220161259174347},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.22006046772003174},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2021581530570984},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18862971663475037},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16520950198173523},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.0},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2014.2321393","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tvlsi.2014.2321393","pdf_url":"https://ieeexplore.ieee.org/ielx7/92/7110706/06822641.pdf","source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tvlsi.2014.2321393","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tvlsi.2014.2321393","pdf_url":"https://ieeexplore.ieee.org/ielx7/92/7110706/06822641.pdf","source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4822624520","display_name":"Development of Wireless Jitter Testing System Using Inductive-Coupling Interface","funder_award_id":"24760266","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320321679","display_name":"Ministry of Economy, Trade and Industry","ror":"https://ror.org/055tm7f07"},{"id":"https://openalex.org/F4320322832","display_name":"University of Tokyo","ror":"https://ror.org/057zh3y96"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2146979290.pdf","grobid_xml":"https://content.openalex.org/works/W2146979290.grobid-xml"},"referenced_works_count":11,"referenced_works":["https://openalex.org/W1604115488","https://openalex.org/W2021633363","https://openalex.org/W2045718689","https://openalex.org/W2087632825","https://openalex.org/W2102053377","https://openalex.org/W2119123494","https://openalex.org/W2126801466","https://openalex.org/W2137221607","https://openalex.org/W2145645157","https://openalex.org/W2158591247","https://openalex.org/W6683505331"],"related_works":["https://openalex.org/W4249165909","https://openalex.org/W2783437851","https://openalex.org/W1672137312","https://openalex.org/W1650483958","https://openalex.org/W2320869333","https://openalex.org/W2136659592","https://openalex.org/W2115569193","https://openalex.org/W2161127017","https://openalex.org/W2110290642","https://openalex.org/W2170973299"],"abstract_inverted_index":{"A":[0],"CMOS":[1,91],"pulsewidth":[2],"modulation":[3],"(PWM)":[4],"transceiver":[5],"circuit":[6,62],"that":[7,21],"exploits":[8],"the":[9,18,29,57,64,72],"self-referenced":[10,59],"edge":[11,20,32,44,60,124],"detection":[12,45,61,125],"technique":[13],"is":[14,22,49,126,131],"presented.":[15],"By":[16],"comparing":[17],"rising":[19],"self-delayed":[23],"by":[24,133],"about":[25],"0.5":[26],"T":[27],"and":[28,39,80,103,119,128],"modulated":[30],"falling":[31],"in":[33],"one":[34],"carrier":[35],"clock":[36],"cycle,":[37],"area-efficient":[38],"high-robustness":[40],"(against":[41],"timing":[42,67],"fluctuations)":[43],"enabling":[46],"PWM":[47,96,135],"communication":[48],"achieved":[50],"without":[51],"requiring":[52],"elaborate":[53],"phase-locked":[54],"loops.":[55],"Since":[56],"proposed":[58],"has":[63],"capability":[65],"of":[66,74],"error":[68,117],"measurement":[69],"while":[70],"changing":[71],"length":[73],"self-delay":[75],"element,":[76],"adaptive":[77],"data-rate":[78],"optimization":[79],"delay-line":[81],"calibration":[82],"are":[83],"realized.":[84],"The":[85],"measured":[86],"results":[87],"with":[88,108,122],"a":[89,94],"65-nm":[90],"prototype":[92],"demonstrate":[93],"2-bit":[95],"communication,":[97],"high":[98,104],"data":[99],"rate":[100],"(3.2":[101],"Gb/s),":[102],"reliability":[105,115],"(BER>":[106],"10-12)":[107],"small":[109],"area":[110],"occupation":[111],"(540":[112],"\u03bcm2).":[113],"For":[114],"improvement,":[116],"check":[118],"correction":[120],"associated":[121],"intercycle":[123],"introduced":[127],"its":[129],"effectiveness":[130],"verified":[132],"1-bit":[134],"measurement.":[136]},"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}