{"id":"https://openalex.org/W2007744600","doi":"https://doi.org/10.1109/tvlsi.2013.2280170","title":"Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing","display_name":"Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing","publication_year":2013,"publication_date":"2013-09-25","ids":{"openalex":"https://openalex.org/W2007744600","doi":"https://doi.org/10.1109/tvlsi.2013.2280170","mag":"2007744600"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2013.2280170","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2013.2280170","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100748284","display_name":"Dong Xiang","orcid":"https://orcid.org/0000-0003-4788-511X"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Dong Xiang","raw_affiliation_strings":["School of Software, Tsinghua University, Beijing, China","School of Software, Tsinghua University Beijing China"],"affiliations":[{"raw_affiliation_string":"School of Software, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"School of Software, Tsinghua University Beijing China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012859371","display_name":"Wenjie Sui","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenjie Sui","raw_affiliation_strings":["School of Software, Tsinghua University, Beijing, China","School of Software, Tsinghua University Beijing China"],"affiliations":[{"raw_affiliation_string":"School of Software, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"School of Software, Tsinghua University Beijing China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048268681","display_name":"Boxue Yin","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Boxue Yin","raw_affiliation_strings":["School of Software, Tsinghua University, Beijing, China","School of Software, Tsinghua University Beijing China"],"affiliations":[{"raw_affiliation_string":"School of Software, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"School of Software, Tsinghua University Beijing China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077687075","display_name":"Kwang\u2010Ting Cheng","orcid":"https://orcid.org/0000-0002-3885-4912"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kwang-Ting Cheng","raw_affiliation_strings":["Department of Electrical Engineering, University of California, Santa Barbara, CA, USA","[Department of Electrical Engineering, University of California, Santa Barbara, CA, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"[Department of Electrical Engineering, University of California, Santa Barbara, CA, USA]","institution_ids":["https://openalex.org/I154570441"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100748284"],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":0.9456,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.74993304,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"22","issue":"9","first_page":"1968","last_page":"1979"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9663000106811523,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.7018432021141052},{"id":"https://openalex.org/keywords/frame","display_name":"Frame (networking)","score":0.699812650680542},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.6539955735206604},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6229031682014465},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5960924625396729},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5369470119476318},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4802972972393036},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4255329668521881},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.41728121042251587},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4086422324180603},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36942440271377563},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.36698511242866516},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26597392559051514},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2326756715774536},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19610822200775146},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.19237467646598816},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.13912132382392883},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10224851965904236}],"concepts":[{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.7018432021141052},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.699812650680542},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.6539955735206604},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6229031682014465},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5960924625396729},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5369470119476318},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4802972972393036},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4255329668521881},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.41728121042251587},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4086422324180603},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36942440271377563},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.36698511242866516},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26597392559051514},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2326756715774536},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19610822200775146},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.19237467646598816},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.13912132382392883},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10224851965904236},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tvlsi.2013.2280170","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2013.2280170","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-76910","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-76910","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"},{"id":"pmh:oai:repository.ust.hk:1783.1-76910","is_oa":false,"landing_page_url":"http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=10638210&rft.volume=22&rft.issue=9&rft.date=2014&rft.spage=1968&rft.aulast=Xiang&rft.aufirst=Dong&rft.atitle=Compact%20Test%20Generation%20With%20an%20Influence%20Input%20Measure%20for%20Launch-On-Capture%20Transition%20Fault%20Testing&rft.title=IEEE%20Transactions%20on%20Very%20Large%20Scale%20Integration%20(VLSI)%20Systems","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1801048996","display_name":null,"funder_award_id":"61373021","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7086577861","display_name":null,"funder_award_id":"61170063","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G995162639","display_name":null,"funder_award_id":"60910003","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W13277579","https://openalex.org/W1983213480","https://openalex.org/W1987212007","https://openalex.org/W1995880343","https://openalex.org/W2003299974","https://openalex.org/W2005520808","https://openalex.org/W2018356883","https://openalex.org/W2036584993","https://openalex.org/W2039231278","https://openalex.org/W2041350247","https://openalex.org/W2060683671","https://openalex.org/W2062338825","https://openalex.org/W2106585148","https://openalex.org/W2107203554","https://openalex.org/W2109087211","https://openalex.org/W2112187634","https://openalex.org/W2116957391","https://openalex.org/W2119241964","https://openalex.org/W2124629253","https://openalex.org/W2126451656","https://openalex.org/W2144898259","https://openalex.org/W2148250222","https://openalex.org/W2149107969","https://openalex.org/W2152321821","https://openalex.org/W2156749158","https://openalex.org/W2160261583","https://openalex.org/W2163730402","https://openalex.org/W2165516518","https://openalex.org/W2165817266","https://openalex.org/W2173124859","https://openalex.org/W2294133975","https://openalex.org/W4230587734","https://openalex.org/W4230592135","https://openalex.org/W4243061192","https://openalex.org/W6600530048","https://openalex.org/W6665494109","https://openalex.org/W6681650642","https://openalex.org/W6684123354"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W2147400189","https://openalex.org/W2340957901","https://openalex.org/W2154529098","https://openalex.org/W2109319621"],"abstract_inverted_index":{"We":[0],"propose":[1],"a":[2,12,98,116],"compact":[3,131],"test":[4,56,119,126],"generation":[5,58],"method":[6],"for":[7,37,106],"transition":[8,39,107],"faults":[9,108,134],"based":[10],"on":[11,74],"conflict":[13],"avoidance":[14],"driven":[15],"scheme.":[16],"A":[17],"new":[18,117,125],"measure":[19,105],"is":[20,28,95,122],"proposed":[21,155],"to":[22,33,130],"estimate":[23],"the":[24,29,45,50,54,71,75,78,84,89,92,110,138,149,154],"influence":[25,103],"inputs,":[26],"which":[27],"subset":[30],"of":[31,49,53,77,83,153],"inputs":[32,47],"be":[34],"specified,":[35],"needed":[36],"detecting":[38],"faults.":[40],"The":[41,66,124],"value":[42,72,86],"requirements":[43,73,87],"at":[44,88],"pseudoprimary":[46],"(PPIs)":[48],"second":[51,79,93],"frame":[52,80,94],"automatic":[55],"pattern":[57],"circuit":[59],"model":[60],"are":[61],"partitioned":[62],"into":[63,137],"separate":[64],"subsets.":[65],"sequential":[67],"backtracing":[68],"scheme":[69,121,128],"backtraces":[70],"PPIs":[76,90],"subset-by-subset.":[81],"Justification":[82],"necessary":[85],"in":[91],"completed":[96],"using":[97],"conflict-driven":[99],"procedure.":[100],"With":[101],"an":[102],"input":[104],"under":[109],"launch-on-capture":[111],"scan":[112],"testing":[113],"application":[114],"scheme,":[115],"dynamic":[118],"compaction":[120,127],"proposed.":[123],"tries":[129],"as":[132,135],"many":[133],"possible":[136],"current":[139],"test.":[140],"Experimental":[141],"results":[142],"and":[143,151],"comparison":[144],"with":[145],"existing":[146],"approaches":[147],"demonstrate":[148],"efficiency":[150],"effectiveness":[152],"method.":[156]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}