{"id":"https://openalex.org/W2065991180","doi":"https://doi.org/10.1109/tvlsi.2013.2272587","title":"STT-MRAM Sensing Circuit With Self-Body Biasing in Deep Submicron Technologies","display_name":"STT-MRAM Sensing Circuit With Self-Body Biasing in Deep Submicron Technologies","publication_year":2013,"publication_date":"2013-07-31","ids":{"openalex":"https://openalex.org/W2065991180","doi":"https://doi.org/10.1109/tvlsi.2013.2272587","mag":"2065991180"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2013.2272587","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2013.2272587","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100729885","display_name":"Ji Su Kim","orcid":"https://orcid.org/0000-0002-9501-9665"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Jisu Kim","raw_affiliation_strings":["Qualcomm Incorporated, San Diego, CA, USA","School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","School of Electrical and Electronic Engineering, Yonsei University , Seoul , Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Incorporated, San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University , Seoul , Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084041151","display_name":"Kyungho Ryu","orcid":"https://orcid.org/0000-0002-0354-4797"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyungho Ryu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","School of Electrical and Electronic Engineering, Yonsei University , Seoul , Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University , Seoul , Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064984422","display_name":"Jung Pill Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210111675","display_name":"Market Matters","ror":"https://ror.org/021yan307","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210111675"]}],"countries":["GB","KR","US"],"is_corresponding":false,"raw_author_name":"Jung Pill Kim","raw_affiliation_strings":["Qualcomm Incorporated, San Diego, CA, USA","School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","Qualcomm Inc.  San Diego CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Incorporated, San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"Qualcomm Inc.  San Diego CA USA","institution_ids":["https://openalex.org/I19268510","https://openalex.org/I4210111675"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103061707","display_name":"Seung H. Kang","orcid":"https://orcid.org/0000-0003-4270-9918"},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210111675","display_name":"Market Matters","ror":"https://ror.org/021yan307","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210111675"]}],"countries":["GB","US"],"is_corresponding":false,"raw_author_name":"Seung H. Kang","raw_affiliation_strings":["Qualcomm Incorporated, San Diego, CA, USA","Qualcomm Inc.  San Diego CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Incorporated, San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596"]},{"raw_affiliation_string":"Qualcomm Inc.  San Diego CA USA","institution_ids":["https://openalex.org/I19268510","https://openalex.org/I4210111675"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037010076","display_name":"Seong\u2010Ook Jung","orcid":"https://orcid.org/0000-0003-0757-2581"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seong-Ook Jung","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","School of Electrical and Electronic Engineering, Yonsei University , Seoul , Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University , Seoul , Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.6526,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.90005873,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"22","issue":"7","first_page":"1630","last_page":"1634"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.922010600566864},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.6258629560470581},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5885394811630249},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5801234841346741},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.562783420085907},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5459441542625427},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.4793030321598053},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4714922606945038},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42948266863822937},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4233907461166382},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.422633558511734},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32202357053756714},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.2806417942047119},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20363855361938477}],"concepts":[{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.922010600566864},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.6258629560470581},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5885394811630249},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5801234841346741},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.562783420085907},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5459441542625427},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4793030321598053},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4714922606945038},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42948266863822937},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4233907461166382},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.422633558511734},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32202357053756714},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2806417942047119},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20363855361938477},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2013.2272587","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2013.2272587","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1979979239","https://openalex.org/W1996356878","https://openalex.org/W1998416174","https://openalex.org/W2003390915","https://openalex.org/W2019228457","https://openalex.org/W2019369293","https://openalex.org/W2036656747","https://openalex.org/W2051431054","https://openalex.org/W2077741710","https://openalex.org/W2101848657","https://openalex.org/W2103126659","https://openalex.org/W2120699192","https://openalex.org/W2125210009","https://openalex.org/W2126700722","https://openalex.org/W2149009819","https://openalex.org/W2543205889"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2124425447","https://openalex.org/W2146592010","https://openalex.org/W4232692331","https://openalex.org/W1968460025","https://openalex.org/W2968761826","https://openalex.org/W1909329442","https://openalex.org/W2064013046","https://openalex.org/W2101728914","https://openalex.org/W1506620311"],"abstract_inverted_index":{"Conventional":[0],"spin":[1],"transfer":[2],"torque":[3],"MRAM":[4],"sensing":[5,11,16,25,55,100,107,112,144,161,178],"circuits":[6],"suffer":[7],"from":[8],"a":[9,14,147,173,177],"small":[10,24,54],"margin":[12,17,26,56,113],"and":[13,102],"large":[15,111],"variation":[18],"in":[19,30],"deep":[20],"submicron":[21],"technologies.":[22],"The":[23,130],"issue":[27],"becomes":[28],"worse":[29],"the":[31,37,44,53,59,62,79,83,99,106,115,120,127,142,150,160],"low-leakage":[32,136],"process":[33],"technology":[34],"due":[35,81],"to":[36,51,82,92],"higher":[38],"threshold":[39,63],"voltage.":[40],"In":[41,58],"this":[42],"brief,":[43],"self-body":[45],"biasing":[46],"(self-BB)":[47],"scheme":[48,118,165],"is":[49,68,89,124],"proposed":[50,143],"resolve":[52],"issue.":[57],"self-BB":[60],"scheme,":[61],"voltage":[64],"of":[65,98,149,157,170,180],"load":[66,128],"pMOS":[67],"adaptively":[69],"controlled":[70],"by":[71],"body":[72,80],"bias.":[73],"Although":[74],"leakage":[75],"current":[76,101],"'lows":[77,103],"through":[78],"positive":[84],"junction":[85],"bias":[86],"voltage,":[87],"it":[88],"well":[90],"suppressed":[91],"less":[93],"than":[94],"1%":[95],"(0.3":[96],"\u03bcA)":[97],"only":[104],"during":[105],"operation.":[108],"To":[109],"reduce":[110],"variation,":[114],"source":[116],"degeneration":[117],"with":[119,176],"longer":[121],"channel":[122],"length":[123],"used":[125],"for":[126,172],"pMOS.":[129],"HSPICE":[131],"simulation":[132],"results":[133],"obtained":[134],"using":[135],"45-nm":[137],"model":[138],"parameters":[139],"show":[140],"that":[141],"circuit":[145,162],"achieves":[146],"probability":[148],"read":[151],"access":[152],"pass":[153],"yield":[154],"(PRAPY":[155],"Memory)":[156],"100%,":[158],"whereas":[159],"without":[163],"BB":[164],"has":[166],"an":[167],"PRAPY":[168],"Memory":[169],"5.8%":[171],"32-Mb":[174],"memory":[175],"time":[179],"2":[181],"ns.":[182]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":7},{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}