{"id":"https://openalex.org/W1979733337","doi":"https://doi.org/10.1109/tvlsi.2013.2239319","title":"Delay Test for Diagnosis of Power Switches","display_name":"Delay Test for Diagnosis of Power Switches","publication_year":2013,"publication_date":"2013-01-29","ids":{"openalex":"https://openalex.org/W1979733337","doi":"https://doi.org/10.1109/tvlsi.2013.2239319","mag":"1979733337"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2013.2239319","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2013.2239319","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5107854382","display_name":"Saqib Khursheed","orcid":"https://orcid.org/0000-0002-5720-0607"},"institutions":[{"id":"https://openalex.org/I43439940","display_name":"University of Southampton","ror":"https://ror.org/01ryk1543","country_code":"GB","type":"education","lineage":["https://openalex.org/I43439940"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Saqib Khursheed","raw_affiliation_strings":["University of Southampton, School of Electronics and Computer Science, Southampton, U.K","Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Southampton, School of Electronics and Computer Science, Southampton, U.K","institution_ids":["https://openalex.org/I43439940"]},{"raw_affiliation_string":"Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK#TAB#","institution_ids":["https://openalex.org/I43439940"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043579250","display_name":"Kan Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I47508984","display_name":"Imperial College London","ror":"https://ror.org/041kmwe10","country_code":"GB","type":"education","lineage":["https://openalex.org/I47508984"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Kan Shi","raw_affiliation_strings":["Imperial College London, Electrical and Electronics Engineering Department, London, U.K","Electr. & Elect.ron. Eng. Dept., Imperial Coll. London, London, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imperial College London, Electrical and Electronics Engineering Department, London, U.K","institution_ids":["https://openalex.org/I47508984"]},{"raw_affiliation_string":"Electr. & Elect.ron. Eng. Dept., Imperial Coll. London, London, UK","institution_ids":["https://openalex.org/I47508984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012783672","display_name":"Bashir M. Al\u2010Hashimi","orcid":"https://orcid.org/0000-0002-3591-1328"},"institutions":[{"id":"https://openalex.org/I43439940","display_name":"University of Southampton","ror":"https://ror.org/01ryk1543","country_code":"GB","type":"education","lineage":["https://openalex.org/I43439940"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Bashir M. Al-Hashimi","raw_affiliation_strings":["University of Southampton, School of Electronics and Computer Science, Southampton, U.K","Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Southampton, School of Electronics and Computer Science, Southampton, U.K","institution_ids":["https://openalex.org/I43439940"]},{"raw_affiliation_string":"Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK#TAB#","institution_ids":["https://openalex.org/I43439940"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Peter R. Wilson","orcid":null},"institutions":[{"id":"https://openalex.org/I43439940","display_name":"University of Southampton","ror":"https://ror.org/01ryk1543","country_code":"GB","type":"education","lineage":["https://openalex.org/I43439940"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Peter R. Wilson","raw_affiliation_strings":["University of Southampton, School of Electronics and Computer Science, Southampton, U.K","Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Southampton, School of Electronics and Computer Science, Southampton, U.K","institution_ids":["https://openalex.org/I43439940"]},{"raw_affiliation_string":"Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK#TAB#","institution_ids":["https://openalex.org/I43439940"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.1801,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.87053927,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"22","issue":"2","first_page":"197","last_page":"206"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.6766632795333862},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5992831587791443},{"id":"https://openalex.org/keywords/power-gating","display_name":"Power gating","score":0.5648922920227051},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5384168028831482},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5248739123344421},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5247804522514343},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5010359287261963},{"id":"https://openalex.org/keywords/leakage-power","display_name":"Leakage power","score":0.47275620698928833},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4643649756908417},{"id":"https://openalex.org/keywords/power-analysis","display_name":"Power analysis","score":0.4510941505432129},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4490545094013214},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2990961968898773},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.2793346643447876},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18714645504951477},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.17145004868507385}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.6766632795333862},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5992831587791443},{"id":"https://openalex.org/C2780700455","wikidata":"https://www.wikidata.org/wiki/Q7236515","display_name":"Power gating","level":4,"score":0.5648922920227051},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5384168028831482},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5248739123344421},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5247804522514343},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5010359287261963},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.47275620698928833},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4643649756908417},{"id":"https://openalex.org/C71743495","wikidata":"https://www.wikidata.org/wiki/Q2845210","display_name":"Power analysis","level":3,"score":0.4510941505432129},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4490545094013214},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2990961968898773},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2793346643447876},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18714645504951477},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.17145004868507385},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tvlsi.2013.2239319","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2013.2239319","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},{"id":"pmh:oai:eprints.soton.ac.uk:346835","is_oa":false,"landing_page_url":"http://doi.org/10.1109/TVLSI.2013.2239319>).","pdf_url":null,"source":{"id":"https://openalex.org/S4306401019","display_name":"ePrints Soton (University of Southampton)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I43439940","host_organization_name":"University of Southampton","host_organization_lineage":["https://openalex.org/I43439940"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.800000011920929}],"awards":[{"id":"https://openalex.org/G6282963897","display_name":null,"funder_award_id":"EP/H011420/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W4562818","https://openalex.org/W134720151","https://openalex.org/W1554885925","https://openalex.org/W1582019256","https://openalex.org/W1744063783","https://openalex.org/W2021463588","https://openalex.org/W2100345151","https://openalex.org/W2100937788","https://openalex.org/W2112786932","https://openalex.org/W2119691242","https://openalex.org/W2120518773","https://openalex.org/W2131862714","https://openalex.org/W2134214677","https://openalex.org/W2146915167","https://openalex.org/W2147195389","https://openalex.org/W2164942713","https://openalex.org/W6600172413","https://openalex.org/W6605488748"],"related_works":["https://openalex.org/W2004834197","https://openalex.org/W2952738319","https://openalex.org/W1970386983","https://openalex.org/W2404323568","https://openalex.org/W4378175625","https://openalex.org/W2980874615","https://openalex.org/W2025620052","https://openalex.org/W2152651549","https://openalex.org/W3098056519","https://openalex.org/W2612051443"],"abstract_inverted_index":{"Power":[0],"switches":[1,59,72],"are":[2],"used":[3],"as":[4],"a":[5,17,35,98,105],"part":[6],"of":[7,16,22,57,63,100,117,124],"the":[8,13,20,27,49,61,115,120],"power-gating":[9],"technique":[10],"to":[11,33],"reduce":[12],"leakage":[14],"power":[15,42,58,71,79],"design.":[18],"To":[19],"best":[21],"our":[23],"knowledge,":[24],"this":[25],"is":[26,81,92,126,131],"first":[28],"report":[29],"in":[30,60],"open":[31],"literature":[32],"show":[34,111],"systematic":[36],"diagnosis":[37,46,86,90],"method":[38,47,91],"for":[39,54],"accurately":[40],"diagnosing":[41],"switches.":[43],"The":[44,88],"proposed":[45,51,89],"utilizes":[48],"recently":[50],"design-for-test":[52],"solution":[53],"efficient":[55],"testing":[56],"presence":[62],"process,":[64],"voltage,":[65],"and":[66],"temperature":[67],"variation.":[68],"It":[69],"divides":[70],"into":[73],"segments":[74],"such":[75],"that":[76],"any":[77],"faulty":[78],"switch":[80],"detectable,":[82],"thereby":[83],"achieving":[84],"high":[85],"accuracy.":[87],"validated":[93],"through":[94],"SPICE":[95],"simulation":[96],"using":[97],"number":[99],"ISCAS":[101],"benchmarks":[102],"synthesized":[103],"with":[104],"90-nm":[106],"gate":[107],"library.":[108],"Simulation":[109],"results":[110],"that,":[112],"when":[113,135],"considering":[114,136],"influence":[116],"process":[118],"variation,":[119],"worst":[121],"case":[122],"loss":[123],"accuracy":[125],"less":[127,132],"than":[128,133],"4.5%;":[129],"it":[130],"12%":[134],"VT":[137],"variations.":[138]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}