{"id":"https://openalex.org/W1997724838","doi":"https://doi.org/10.1109/tvlsi.2011.2166568","title":"Scalable Methods for Analyzing the Circuit Failure Probability Due to Gate Oxide Breakdown","display_name":"Scalable Methods for Analyzing the Circuit Failure Probability Due to Gate Oxide Breakdown","publication_year":2011,"publication_date":"2011-10-13","ids":{"openalex":"https://openalex.org/W1997724838","doi":"https://doi.org/10.1109/tvlsi.2011.2166568","mag":"1997724838"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2011.2166568","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2011.2166568","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007059788","display_name":"Jianxin Fang","orcid":"https://orcid.org/0009-0000-6376-7119"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jianxin Fang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA","Dept. of Electr. & Comput. Eng, Univ. of Minnesota, Minneapolis, MN, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA","institution_ids":["https://openalex.org/I130238516"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng, Univ. of Minnesota, Minneapolis, MN, USA","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068714995","display_name":"Sachin S. Sapatnekar","orcid":"https://orcid.org/0000-0002-5353-2364"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sachin S. Sapatnekar","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA","Dept. of Electr. & Comput. Eng, Univ. of Minnesota, Minneapolis, MN, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA","institution_ids":["https://openalex.org/I130238516"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng, Univ. of Minnesota, Minneapolis, MN, USA","institution_ids":["https://openalex.org/I130238516"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5007059788"],"corresponding_institution_ids":["https://openalex.org/I130238516"],"apc_list":null,"apc_paid":null,"fwci":2.3847,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.88994873,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"20","issue":"11","first_page":"1960","last_page":"1973"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.5871719121932983},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.5498290061950684},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5236049294471741},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4803279936313629},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.4739539623260498},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4667169451713562},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4210607409477234},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.41452130675315857},{"id":"https://openalex.org/keywords/relaxation","display_name":"Relaxation (psychology)","score":0.4133971333503723},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2492694854736328},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2419748306274414},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19883999228477478},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11495068669319153},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10823798179626465}],"concepts":[{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.5871719121932983},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.5498290061950684},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5236049294471741},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4803279936313629},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.4739539623260498},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4667169451713562},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4210607409477234},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.41452130675315857},{"id":"https://openalex.org/C2776029896","wikidata":"https://www.wikidata.org/wiki/Q3935810","display_name":"Relaxation (psychology)","level":2,"score":0.4133971333503723},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2492694854736328},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2419748306274414},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19883999228477478},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11495068669319153},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10823798179626465},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C77805123","wikidata":"https://www.wikidata.org/wiki/Q161272","display_name":"Social psychology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2011.2166568","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2011.2166568","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1699495354","https://openalex.org/W1712958038","https://openalex.org/W2007792906","https://openalex.org/W2011272075","https://openalex.org/W2059074447","https://openalex.org/W2065658709","https://openalex.org/W2096424065","https://openalex.org/W2102434753","https://openalex.org/W2103512568","https://openalex.org/W2109989578","https://openalex.org/W2113488650","https://openalex.org/W2116500796","https://openalex.org/W2119610788","https://openalex.org/W2121437951","https://openalex.org/W2124085954","https://openalex.org/W2125220969","https://openalex.org/W2126232622","https://openalex.org/W2126564504","https://openalex.org/W2128438297","https://openalex.org/W2129038659","https://openalex.org/W2132389735","https://openalex.org/W2132948050","https://openalex.org/W2139006661","https://openalex.org/W2147842458","https://openalex.org/W2150201236","https://openalex.org/W2158750015","https://openalex.org/W2160207526","https://openalex.org/W2162033285","https://openalex.org/W2168665055","https://openalex.org/W3147797681","https://openalex.org/W4237955880","https://openalex.org/W4240704676","https://openalex.org/W6682331928"],"related_works":["https://openalex.org/W2389214306","https://openalex.org/W4235240664","https://openalex.org/W2965083567","https://openalex.org/W141820298","https://openalex.org/W2757182831","https://openalex.org/W1838576100","https://openalex.org/W2095886385","https://openalex.org/W2889616422","https://openalex.org/W1975778413","https://openalex.org/W1975511343"],"abstract_inverted_index":{"Gate":[0],"oxide":[1],"breakdown":[2,59],"is":[3],"an":[4,31],"important":[5],"reliability":[6],"issue":[7],"that":[8,56,99],"has":[9,19,108],"been":[10],"widely":[11],"studied":[12],"at":[13,24,103],"the":[14,25,36,54,70,76,87,92,100],"individual":[15],"transistor":[16],"level,":[17],"but":[18],"seen":[20],"very":[21],"little":[22],"work":[23,139],"circuit":[26,44,62,101],"level.":[27],"We":[28],"first":[29],"develop":[30],"analytic":[32],"closed-form":[33],"model":[34],"for":[35,53,80],"failure":[37,88],"probability":[38],"(FP)":[39],"of":[40,69,94,137],"a":[41,66,104,109],"large":[42],"digital":[43],"due":[45,112],"to":[46,61,75,90,113,147],"this":[47],"phenomenon.":[48],"The":[49],"new":[50],"approach":[51],"accounts":[52],"fact":[55],"not":[57],"every":[58],"leads":[60],"failure,":[63],"and":[64,97,126,145,151],"shows":[65],"4.8-6.2\u00d7":[67],"relaxation":[68,129],"predicted":[71],"lifetime":[72,121,128],"with":[73,117],"respect":[74],"pessimistic":[77],"area-scaling":[78,131],"method":[79,132],"nominal":[81,124],"process":[82,95,114],"parameters.":[83],"Next,":[84],"we":[85],"extend":[86],"analysis":[89,125],"include":[91],"effect":[93],"variations,":[96],"derive":[98],"FP":[102],"specified":[105],"time":[106],"instant":[107],"lognormal":[110],"distribution":[111],"variations.":[115,134],"Circuits":[116],"variations":[118],"show":[119],"19%-24%":[120],"degradation":[122],"against":[123,130],"4.7-5.9\u00d7":[127],"under":[133],"Both":[135],"parts":[136],"our":[138],"are":[140],"verified":[141],"by":[142],"extensive":[143],"simulations":[144],"proved":[146],"be":[148],"effective,":[149],"accurate":[150],"scalable.":[152]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}