{"id":"https://openalex.org/W2128968556","doi":"https://doi.org/10.1109/tvlsi.2011.2132765","title":"Dynamic Supply and Threshold Voltage Scaling for CMOS Digital Circuits Using In-Situ Power Monitor","display_name":"Dynamic Supply and Threshold Voltage Scaling for CMOS Digital Circuits Using In-Situ Power Monitor","publication_year":2011,"publication_date":"2011-04-26","ids":{"openalex":"https://openalex.org/W2128968556","doi":"https://doi.org/10.1109/tvlsi.2011.2132765","mag":"2128968556"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2011.2132765","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2011.2132765","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036295841","display_name":"Nandish Mehta","orcid":"https://orcid.org/0000-0001-5912-8859"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Nandish Mehta","raw_affiliation_strings":["Microelectronics Laboratory, Department of Electrical Communication Engineering, Indian Institute of Science, Bangalore, Karnataka, India","Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Microelectronics Laboratory, Department of Electrical Communication Engineering, Indian Institute of Science, Bangalore, Karnataka, India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore, India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111888576","display_name":"Bharadwaj Amrutur","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Bharadwaj Amrutur","raw_affiliation_strings":["Microelectronics Laboratory, Department of Electrical Communication Engineering, Indian Institute of Science, Bangalore, Karnataka, India","Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Microelectronics Laboratory, Department of Electrical Communication Engineering, Indian Institute of Science, Bangalore, Karnataka, India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore, India","institution_ids":["https://openalex.org/I59270414"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5036295841"],"corresponding_institution_ids":["https://openalex.org/I59270414"],"apc_list":null,"apc_paid":null,"fwci":2.5871,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.89159361,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"20","issue":"5","first_page":"892","last_page":"901"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6026463508605957},{"id":"https://openalex.org/keywords/dynamic-demand","display_name":"Dynamic demand","score":0.5862589478492737},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.5837438106536865},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5373470187187195},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5361767411231995},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5019712448120117},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45937666296958923},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.45348095893859863},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4449726641178131},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.41234320402145386},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38451147079467773},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.37844476103782654},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.1340806782245636},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09517145156860352}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6026463508605957},{"id":"https://openalex.org/C45872418","wikidata":"https://www.wikidata.org/wiki/Q5318966","display_name":"Dynamic demand","level":3,"score":0.5862589478492737},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.5837438106536865},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5373470187187195},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5361767411231995},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5019712448120117},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45937666296958923},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.45348095893859863},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4449726641178131},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.41234320402145386},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38451147079467773},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37844476103782654},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.1340806782245636},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09517145156860352},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tvlsi.2011.2132765","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2011.2132765","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},{"id":"pmh:oai:eprints.iisc.ac.in:42824","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4377196309","display_name":"NOT FOUND REPOSITORY (Indian Institute of Science Bangalore)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I59270414","host_organization_name":"Indian Institute of Science Bangalore","host_organization_lineage":["https://openalex.org/I59270414"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8899999856948853}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1601364107","https://openalex.org/W1977269298","https://openalex.org/W1980390262","https://openalex.org/W1993107416","https://openalex.org/W2014132352","https://openalex.org/W2037921569","https://openalex.org/W2056796532","https://openalex.org/W2060870267","https://openalex.org/W2078835261","https://openalex.org/W2108519747","https://openalex.org/W2112611349","https://openalex.org/W2116175063","https://openalex.org/W2116295078","https://openalex.org/W2122309939","https://openalex.org/W2126806376","https://openalex.org/W2133079932","https://openalex.org/W2137255658","https://openalex.org/W2140784785","https://openalex.org/W2144509711","https://openalex.org/W2145148378","https://openalex.org/W2162250277","https://openalex.org/W2187189666","https://openalex.org/W2541144911","https://openalex.org/W6644199519","https://openalex.org/W6677377052","https://openalex.org/W6687056768"],"related_works":["https://openalex.org/W2139774918","https://openalex.org/W1561253851","https://openalex.org/W2568381411","https://openalex.org/W2484520058","https://openalex.org/W2129412844","https://openalex.org/W2165090310","https://openalex.org/W2395653873","https://openalex.org/W2776347734","https://openalex.org/W1992389990","https://openalex.org/W3111144840"],"abstract_inverted_index":{"A":[0,24],"generalized":[1],"power":[2,7,26,42,58,82,86,112,133,143,158],"tracking":[3,61],"algorithm":[4,62,79],"that":[5,31],"minimizes":[6],"consumption":[8],"of":[9,15,57,88,92,98,114,132,145,147],"digital":[10],"circuits":[11],"by":[12,44,65],"dynamic":[13],"control":[14],"supply":[16],"voltage":[17],"and":[18,37,50,55,60,94,116,125,139,154],"the":[19],"body":[20],"bias":[21],"is":[22,29,135],"proposed.":[23],"direct":[25,81],"monitoring":[27],"scheme":[28],"proposed":[30,78],"does":[32],"not":[33],"need":[34],"any":[35],"replica":[36],"hence":[38],"can":[39],"sense":[40],"total":[41],"consumed":[43],"load":[45,119],"circuit":[46,120],"across":[47],"process,":[48],"voltage,":[49],"temperature":[51],"corners.":[52],"Design":[53],"details":[54],"performance":[56],"monitor":[59,83,134,159],"are":[63,160],"examined":[64],"a":[66,85,142],"simulation":[67],"framework":[68],"developed":[69],"using":[70],"UMC":[71],"90-nm":[72],"CMOS":[73],"triple":[74],"well":[75],"process.":[76],"The":[77],"with":[80,151],"achieves":[84],"savings":[87,113],"42.2%":[89],"for":[90,96,118,157],"activity":[91,97],"0.02":[93],"22.4%":[95],"0.04.":[99],"Experimental":[100],"results":[101],"from":[102],"test":[103],"chip":[104],"fabricated":[105],"in":[106,122,163],"AMS":[107],"350":[108],"nm":[109],"process":[110],"shows":[111],"46.3%":[115],"65%":[117],"operating":[121],"super":[123],"threshold":[124],"near":[126],"sub-threshold":[127],"region,":[128],"respectively.":[129],"Measured":[130],"resolution":[131],"around":[136],"0.25":[137],"mV":[138],"it":[140],"has":[141],"overhead":[144],"2.2%":[146],"die":[148],"power.":[149],"Issues":[150],"loop":[152],"convergence":[153],"design":[155],"tradeoff":[156],"also":[161],"discussed":[162],"this":[164],"paper.":[165]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":6},{"year":2012,"cited_by_count":4}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}