{"id":"https://openalex.org/W2160240353","doi":"https://doi.org/10.1109/tvlsi.2010.2056397","title":"Embedded Memories Fault-Tolerant Pre- and Post-Silicon Optimization","display_name":"Embedded Memories Fault-Tolerant Pre- and Post-Silicon Optimization","publication_year":2010,"publication_date":"2010-08-10","ids":{"openalex":"https://openalex.org/W2160240353","doi":"https://doi.org/10.1109/tvlsi.2010.2056397","mag":"2160240353"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2010.2056397","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2010.2056397","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077252302","display_name":"Amin Khajeh","orcid":"https://orcid.org/0000-0003-0770-0109"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Amin Khajeh","raw_affiliation_strings":["University of California, Irvine, Irvine, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013660772","display_name":"Ahmed M. Eltawil","orcid":"https://orcid.org/0000-0003-1849-083X"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]},{"id":"https://openalex.org/I28022161","display_name":"King Saud University","ror":"https://ror.org/02f81g417","country_code":"SA","type":"education","lineage":["https://openalex.org/I28022161"]}],"countries":["SA","US"],"is_corresponding":false,"raw_author_name":"Ahmed M. Eltawil","raw_affiliation_strings":["King Saud University, Saudi Arabia","University of California, Irvine, Irvine, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"King Saud University, Saudi Arabia","institution_ids":["https://openalex.org/I28022161"]},{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008034875","display_name":"Fadi Kurdahi","orcid":"https://orcid.org/0000-0002-6982-365X"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fadi J. Kurdahi","raw_affiliation_strings":["University of California, Irvine, Irvine, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4487,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.84493029,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"19","issue":"10","first_page":"1916","last_page":"1921"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7246602773666382},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6621142625808716},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6564980745315552},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5732720494270325},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5452282428741455},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.5180113911628723},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.49894213676452637},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4919106960296631},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4628960192203522},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.44443267583847046},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4295562505722046},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.42168647050857544},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4175349473953247},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4029814302921295},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3453421890735626},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.21763485670089722},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.19978371262550354},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18713760375976562},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15324300527572632},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.13894492387771606}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7246602773666382},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6621142625808716},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6564980745315552},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5732720494270325},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5452282428741455},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.5180113911628723},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.49894213676452637},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4919106960296631},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4628960192203522},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.44443267583847046},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4295562505722046},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.42168647050857544},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4175349473953247},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4029814302921295},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3453421890735626},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.21763485670089722},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.19978371262550354},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18713760375976562},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15324300527572632},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13894492387771606},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2010.2056397","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2010.2056397","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8600000143051147}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1965044833","https://openalex.org/W1991507700","https://openalex.org/W2043318181","https://openalex.org/W2061609000","https://openalex.org/W2105524902","https://openalex.org/W2107969039","https://openalex.org/W2114774494","https://openalex.org/W2117648153","https://openalex.org/W2123085386","https://openalex.org/W2131627666","https://openalex.org/W2136251980","https://openalex.org/W2150526221","https://openalex.org/W2169675423","https://openalex.org/W2170444169","https://openalex.org/W4233255476","https://openalex.org/W4245604880","https://openalex.org/W6685206872"],"related_works":["https://openalex.org/W1500230652","https://openalex.org/W4290647047","https://openalex.org/W2066033226","https://openalex.org/W2363504003","https://openalex.org/W2548582980","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W2612883256","https://openalex.org/W4386933833","https://openalex.org/W1030007664"],"abstract_inverted_index":{"This":[0,70],"paper":[1,96],"proposes":[2],"a":[3,29,65,98],"structured":[4],"method":[5],"for":[6,19,40],"scaling":[7],"both":[8,112],"the":[9,15,25,52,59,62,77,92,106],"supply":[10],"voltage":[11,18],"as":[12,14,85],"well":[13],"body":[16],"bias":[17],"CMOS":[20],"embedded":[21],"static":[22],"memory":[23,42,63],"with":[24,36],"aim":[26],"of":[27,34,58,79],"achieving":[28],"controllable":[30],"and":[31,83,101,114],"dynamic":[32],"probability":[33,47],"failure":[35],"minimum":[37],"power":[38,80],"consumption":[39],"each":[41],"block.":[43],"The":[44,95],"target":[45],"error":[46,55,119],"is":[48],"managed":[49],"according":[50],"to":[51,75],"time":[53],"varying":[54],"tolerance":[56],"attributes":[57],"application":[60,89],"using":[61],"at":[64],"certain":[66],"instant":[67],"in":[68,91],"time.":[69],"approach":[71],"enables":[72],"system":[73,113],"designers":[74,116],"abstract":[76],"concepts":[78],"awareness,":[81],"yield":[82],"reliability":[84],"design":[86,93],"tradeoffs-that":[87],"incorporate":[88],"knowledge-early":[90],"cycle.":[94],"develops":[97],"formal":[99],"theoretical":[100],"practical":[102],"foundation":[103],"based":[104],"on":[105],"underlying":[107],"device":[108],"statistics":[109],"upon":[110],"which":[111],"circuit":[115],"can":[117],"investigate":[118],"aware":[120],"design.":[121]},"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}