{"id":"https://openalex.org/W2126044301","doi":"https://doi.org/10.1109/tvlsi.2009.2020591","title":"Design of Low-Power High-Speed Truncation-Error-Tolerant Adder and Its Application in Digital Signal Processing","display_name":"Design of Low-Power High-Speed Truncation-Error-Tolerant Adder and Its Application in Digital Signal Processing","publication_year":2009,"publication_date":"2009-10-13","ids":{"openalex":"https://openalex.org/W2126044301","doi":"https://doi.org/10.1109/tvlsi.2009.2020591","mag":"2126044301"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2009.2020591","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2009.2020591","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://dr.ntu.edu.sg/bitstream/10356/79964/1/Design%20of%20Low-Power%20High-Speed%20Truncation-Error-Tolerant%20Adder%20and%20Its%20Application%20in%20Digital%20Signal%20Processing.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040329242","display_name":"Ning Zhu","orcid":"https://orcid.org/0000-0003-0152-4634"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Ning Zhu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, Singapore","Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042682339","display_name":"Wang Ling Goh","orcid":"https://orcid.org/0000-0001-7466-8941"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Wang Ling Goh","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, Singapore","Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084020660","display_name":"W ZHANG","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Weija Zhang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, Singapore","Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009974389","display_name":"Kiat Seng Yeo","orcid":"https://orcid.org/0000-0002-4524-707X"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kiat Seng Yeo","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, Singapore","Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102243210","display_name":"Zhi Hui Kong","orcid":"https://orcid.org/0009-0004-4522-796X"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Zhi Hui Kong","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, Singapore","Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":3.4266,"has_fulltext":true,"cited_by_count":377,"citation_normalized_percentile":{"value":0.92919927,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"18","issue":"8","first_page":"1225","last_page":"1229"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/adder","display_name":"Adder","score":0.8531533479690552},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.7892317771911621},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6798727512359619},{"id":"https://openalex.org/keywords/power\u2013delay-product","display_name":"Power\u2013delay product","score":0.6125034093856812},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.5387358069419861},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5180811882019043},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.48549750447273254},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.4567415118217468},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4117073714733124},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.32207274436950684},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.31759846210479736},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2725986838340759},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.20025721192359924},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18200233578681946},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13455963134765625},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12457215785980225}],"concepts":[{"id":"https://openalex.org/C164620267","wikidata":"https://www.wikidata.org/wiki/Q376953","display_name":"Adder","level":3,"score":0.8531533479690552},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.7892317771911621},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6798727512359619},{"id":"https://openalex.org/C2776391166","wikidata":"https://www.wikidata.org/wiki/Q7236873","display_name":"Power\u2013delay product","level":4,"score":0.6125034093856812},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.5387358069419861},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5180811882019043},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.48549750447273254},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.4567415118217468},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4117073714733124},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.32207274436950684},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.31759846210479736},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2725986838340759},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.20025721192359924},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18200233578681946},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13455963134765625},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12457215785980225},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tvlsi.2009.2020591","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2009.2020591","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},{"id":"pmh:oai:dr.ntu.edu.sg:10356/79964","is_oa":true,"landing_page_url":"http://hdl.handle.net/10220/6241","pdf_url":"https://dr.ntu.edu.sg/bitstream/10356/79964/1/Design%20of%20Low-Power%20High-Speed%20Truncation-Error-Tolerant%20Adder%20and%20Its%20Application%20in%20Digital%20Signal%20Processing.pdf","source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.417.504","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.417.504","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ijera.com/papers/Vol2_issue2/FB22939944.pdf","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:dr.ntu.edu.sg:10356/79964","is_oa":true,"landing_page_url":"http://hdl.handle.net/10220/6241","pdf_url":"https://dr.ntu.edu.sg/bitstream/10356/79964/1/Design%20of%20Low-Power%20High-Speed%20Truncation-Error-Tolerant%20Adder%20and%20Its%20Application%20in%20Digital%20Signal%20Processing.pdf","source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8500000238418579}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320766","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2126044301.pdf","grobid_xml":"https://content.openalex.org/works/W2126044301.grobid-xml"},"referenced_works_count":19,"referenced_works":["https://openalex.org/W588799346","https://openalex.org/W1575022128","https://openalex.org/W1871391557","https://openalex.org/W1976039195","https://openalex.org/W1977432623","https://openalex.org/W2035974948","https://openalex.org/W2052363354","https://openalex.org/W2096648424","https://openalex.org/W2097325076","https://openalex.org/W2099971661","https://openalex.org/W2135856491","https://openalex.org/W2138179663","https://openalex.org/W2155664816","https://openalex.org/W2161891759","https://openalex.org/W2164241781","https://openalex.org/W2168165445","https://openalex.org/W2410363825","https://openalex.org/W3140075805","https://openalex.org/W4245420982"],"related_works":["https://openalex.org/W2527731084","https://openalex.org/W2619307913","https://openalex.org/W4200113551","https://openalex.org/W2015155483","https://openalex.org/W2376573441","https://openalex.org/W2187717486","https://openalex.org/W3161678484","https://openalex.org/W4225985484","https://openalex.org/W1863387014","https://openalex.org/W2558163707"],"abstract_inverted_index":{"In":[0],"modern":[1],"VLSI":[2,20],"technology,":[3],"the":[4,40,47,55,67,79,88],"occurrence":[5],"of":[6,9,87,102],"all":[7],"kinds":[8],"errors":[10],"has":[11],"become":[12],"inevitable.":[13],"By":[14],"adopting":[15],"an":[16],"emerging":[17],"concept":[18],"in":[19,53,78,92],"design":[21],"and":[22,45,58],"test,":[23],"error":[24],"tolerance":[25],"(ET),":[26],"a":[27],"novel":[28],"error-tolerant":[29],"adder":[30],"(ETA)":[31],"is":[32,36,70,91],"proposed.":[33],"The":[34],"ETA":[35,69,90],"able":[37,71],"to":[38,63,72],"ease":[39],"strict":[41],"restriction":[42],"on":[43],"accuracy,":[44],"at":[46],"same":[48],"time":[49],"achieve":[50],"tremendous":[51],"improvements":[52],"both":[54],"power":[56],"consumption":[57],"speed":[59],"performance.":[60],"When":[61],"compared":[62],"its":[64],"conventional":[65],"counterparts,":[66],"proposed":[68,89],"attain":[73],"more":[74],"than":[75],"65%":[76],"improvement":[77],"Power-Delay":[80],"Product":[81],"(PDP).":[82],"One":[83],"important":[84],"potential":[85],"application":[86],"digital":[93],"signal":[94],"processing":[95],"systems":[96],"that":[97],"can":[98],"tolerate":[99],"certain":[100],"amount":[101],"errors.":[103]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":24},{"year":2024,"cited_by_count":22},{"year":2023,"cited_by_count":30},{"year":2022,"cited_by_count":32},{"year":2021,"cited_by_count":32},{"year":2020,"cited_by_count":58},{"year":2019,"cited_by_count":31},{"year":2018,"cited_by_count":37},{"year":2017,"cited_by_count":22},{"year":2016,"cited_by_count":23},{"year":2015,"cited_by_count":17},{"year":2014,"cited_by_count":13},{"year":2013,"cited_by_count":18},{"year":2012,"cited_by_count":8}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
