{"id":"https://openalex.org/W2141190432","doi":"https://doi.org/10.1109/tvlsi.2009.2017542","title":"Detailed Characterization of Transceiver Parameters Through Loop-Back-Based BiST","display_name":"Detailed Characterization of Transceiver Parameters Through Loop-Back-Based BiST","publication_year":2009,"publication_date":"2009-07-30","ids":{"openalex":"https://openalex.org/W2141190432","doi":"https://doi.org/10.1109/tvlsi.2009.2017542","mag":"2141190432"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2009.2017542","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2009.2017542","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041848011","display_name":"Erdem S. Erdogan","orcid":null},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Erdem S Erdogan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058946013","display_name":"Sule Ozev","orcid":"https://orcid.org/0000-0002-3636-715X"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sule Ozev","raw_affiliation_strings":["Department of Electrical Engineering, Arizona State University, Tempe, AZ, USA","Dept. of Electr. Eng.. Arizona State Univ., Tempe, AZ, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Dept. of Electr. Eng.. Arizona State Univ., Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5041848011"],"corresponding_institution_ids":["https://openalex.org/I170897317"],"apc_list":null,"apc_paid":null,"fwci":4.485,"has_fulltext":false,"cited_by_count":53,"citation_normalized_percentile":{"value":0.95115935,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"18","issue":"6","first_page":"901","last_page":"911"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transmitter","display_name":"Transmitter","score":0.9323416948318481},{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.8770219087600708},{"id":"https://openalex.org/keywords/baseband","display_name":"Baseband","score":0.848491370677948},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6741814017295837},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.5499266982078552},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5418800115585327},{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.49656587839126587},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.478059321641922},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4561445415019989},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4279240369796753},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35770511627197266},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2489735186100006},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.20693063735961914},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.18099898099899292},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.16137108206748962},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09075748920440674},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.07940477132797241}],"concepts":[{"id":"https://openalex.org/C47798520","wikidata":"https://www.wikidata.org/wiki/Q190157","display_name":"Transmitter","level":3,"score":0.9323416948318481},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.8770219087600708},{"id":"https://openalex.org/C65165936","wikidata":"https://www.wikidata.org/wiki/Q575784","display_name":"Baseband","level":3,"score":0.848491370677948},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6741814017295837},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.5499266982078552},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5418800115585327},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.49656587839126587},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.478059321641922},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4561445415019989},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4279240369796753},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35770511627197266},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2489735186100006},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.20693063735961914},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.18099898099899292},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16137108206748962},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09075748920440674},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.07940477132797241},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2009.2017542","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2009.2017542","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1496134064","https://openalex.org/W1543869560","https://openalex.org/W1594163357","https://openalex.org/W1815731809","https://openalex.org/W1843876656","https://openalex.org/W1941310251","https://openalex.org/W1973847976","https://openalex.org/W1977067929","https://openalex.org/W1978805351","https://openalex.org/W2057667075","https://openalex.org/W2087070363","https://openalex.org/W2102741949","https://openalex.org/W2102771100","https://openalex.org/W2113223154","https://openalex.org/W2123999339","https://openalex.org/W2124647791","https://openalex.org/W2135838871","https://openalex.org/W2138030335","https://openalex.org/W2145612150","https://openalex.org/W2160939840","https://openalex.org/W2161922577","https://openalex.org/W2170928161","https://openalex.org/W2272034138","https://openalex.org/W4232477441","https://openalex.org/W6678456271"],"related_works":["https://openalex.org/W2197707731","https://openalex.org/W1991798954","https://openalex.org/W2181756922","https://openalex.org/W2135838871","https://openalex.org/W2145704360","https://openalex.org/W2150591383","https://openalex.org/W2062634911","https://openalex.org/W2261435898","https://openalex.org/W343219895","https://openalex.org/W2108425632"],"abstract_inverted_index":{"The":[0,49],"impact":[1],"of":[2,71,96],"impairments":[3],"such":[4],"as":[5],"transmitter/receiver":[6],"I/Q":[7],"gain/phase":[8],"mismatch":[9],"on":[10],"the":[11,69,72,88,93,97],"performance":[12],"have":[13],"become":[14],"severe":[15],"due":[16],"to":[17,61],"high":[18,94],"operational":[19],"speeds":[20],"and":[21,42,55,64,75,90],"continuous":[22],"technology":[23],"scaling.":[24],"In":[25],"this":[26],"paper,":[27],"we":[28],"present":[29],"a":[30],"built-in-self-test":[31],"(BiST)":[32],"solution":[33],"for":[34,46],"quadrature":[35],"modulation":[36],"transceiver":[37],"circuits":[38],"using":[39],"only":[40],"transmitter":[41,52],"receiver":[43,56],"baseband":[44],"signals":[45,54,58],"test":[47],"analysis.":[48],"mapping":[50],"between":[51],"input":[53],"output":[57],"are":[59,83],"used":[60],"extract":[62],"impairment":[63],"nonlinearity":[65],"parameters":[66],"separately":[67],"with":[68,87],"help":[70],"NLS":[73],"method":[74],"detailed":[76],"nonlinear":[77],"system":[78],"modeling.":[79],"Experimental":[80],"measurement":[81],"results":[82],"in":[84],"good":[85],"agreement":[86],"simulations":[89],"they":[91],"confirm":[92],"accuracy":[95],"proposed":[98],"method.":[99]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":7},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":9}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}