{"id":"https://openalex.org/W2155590443","doi":"https://doi.org/10.1109/tvlsi.2008.2005195","title":"Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling","display_name":"Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling","publication_year":2009,"publication_date":"2009-03-12","ids":{"openalex":"https://openalex.org/W2155590443","doi":"https://doi.org/10.1109/tvlsi.2008.2005195","mag":"2155590443"},"language":"en","primary_location":{"id":"doi:10.1109/tvlsi.2008.2005195","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2008.2005195","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061262597","display_name":"Emre Salman","orcid":"https://orcid.org/0000-0001-6538-6803"},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E. Salman","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053517349","display_name":"Eby G. Friedman","orcid":"https://orcid.org/0000-0002-5549-7160"},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E.G. Friedman","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108634711","display_name":"R.M. Secareanu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R.M. Secareanu","raw_affiliation_strings":["Microwave and Mixed-Signal Technology Group, Freescale Semiconductor, Inc., Tempe, AZ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microwave and Mixed-Signal Technology Group, Freescale Semiconductor, Inc., Tempe, AZ, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089852164","display_name":"O. Hartin","orcid":"https://orcid.org/0000-0002-4339-2513"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"O.L. Hartin","raw_affiliation_strings":["Microwave and Mixed-Signal Technology Group, Freescale Semiconductor, Inc., Tempe, AZ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microwave and Mixed-Signal Technology Group, Freescale Semiconductor, Inc., Tempe, AZ, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.18858954,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"17","issue":"10","first_page":"1559","last_page":"1564"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12435","display_name":"Bladed Disk Vibration Dynamics","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6926627159118652},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6876000761985779},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.6200196146965027},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4830801784992218},{"id":"https://openalex.org/keywords/substrate-coupling","display_name":"Substrate coupling","score":0.4664686620235443},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.46469447016716003},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.45738711953163147},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.4507567286491394},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44504427909851074},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4222063422203064},{"id":"https://openalex.org/keywords/biological-system","display_name":"Biological system","score":0.40666499733924866},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.27773386240005493},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22675484418869019},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.14107120037078857},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11931583285331726}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6926627159118652},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6876000761985779},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.6200196146965027},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4830801784992218},{"id":"https://openalex.org/C51674796","wikidata":"https://www.wikidata.org/wiki/Q7632167","display_name":"Substrate coupling","level":4,"score":0.4664686620235443},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.46469447016716003},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.45738711953163147},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.4507567286491394},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44504427909851074},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4222063422203064},{"id":"https://openalex.org/C186060115","wikidata":"https://www.wikidata.org/wiki/Q30336093","display_name":"Biological system","level":1,"score":0.40666499733924866},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.27773386240005493},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22675484418869019},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.14107120037078857},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11931583285331726},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C155310634","wikidata":"https://www.wikidata.org/wiki/Q1852785","display_name":"Trench","level":3,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvlsi.2008.2005195","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvlsi.2008.2005195","pdf_url":null,"source":{"id":"https://openalex.org/S37538908","display_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","issn_l":"1063-8210","issn":["1063-8210","1557-9999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2096912695","https://openalex.org/W2107724715","https://openalex.org/W2129722479","https://openalex.org/W2180333551","https://openalex.org/W2788241019","https://openalex.org/W4255915347"],"related_works":["https://openalex.org/W2217909676","https://openalex.org/W2532402682","https://openalex.org/W3034722817","https://openalex.org/W2137446527","https://openalex.org/W2161299046","https://openalex.org/W2377267056","https://openalex.org/W2083105144","https://openalex.org/W2357426242","https://openalex.org/W2972257016","https://openalex.org/W2337245573"],"abstract_inverted_index":{"A":[0],"simple,":[1],"yet":[2],"physically":[3],"intuitive":[4],"macrolevel":[5],"model":[6],"is":[7,38],"presented":[8],"to":[9,35],"identify":[10],"the":[11,17,21,30,41,53,59],"dominant":[12],"substrate":[13,33],"coupling":[14],"mechanism":[15],"at":[16],"early":[18],"stages":[19],"of":[20,32,44,52,68],"design":[22,50],"process,":[23],"while":[24],"simultaneously":[25],"considering":[26],"multiple":[27],"parameters.":[28],"Furthermore,":[29],"sensitivity":[31],"noise":[34,45,61],"these":[36],"parameters":[37],"evaluated,":[39],"demonstrating":[40],"nonmonotonic":[42],"dependence":[43],"on":[46],"rise":[47],"time.":[48],"The":[49],"implications":[51],"proposed":[54],"analysis":[55],"are":[56],"discussed,":[57],"identifying":[58],"preferred":[60],"reduction":[62],"technique":[63],"for":[64],"a":[65],"specific":[66],"set":[67],"operating":[69],"points.":[70]},"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}