{"id":"https://openalex.org/W2899053985","doi":"https://doi.org/10.1109/tsusc.2018.2878832","title":"The Quest of the Ideal Error Detecting Architecture: The GRAAL Architecture","display_name":"The Quest of the Ideal Error Detecting Architecture: The GRAAL Architecture","publication_year":2018,"publication_date":"2018-10-31","ids":{"openalex":"https://openalex.org/W2899053985","doi":"https://doi.org/10.1109/tsusc.2018.2878832","mag":"2899053985"},"language":"en","primary_location":{"id":"doi:10.1109/tsusc.2018.2878832","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsusc.2018.2878832","pdf_url":null,"source":{"id":"https://openalex.org/S4210221417","display_name":"IEEE Transactions on Sustainable Computing","issn_l":"2377-3782","issn":["2377-3782","2377-3790"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Sustainable Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060678776","display_name":"Michael G. Dimopoulos","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Michael Dimopoulos","raw_affiliation_strings":["TIMA Laboratory, Grenoble, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)"],"raw_orcid":"https://orcid.org/0000-0002-5475-2887","affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039513293","display_name":"M. Nicolaidis","orcid":"https://orcid.org/0000-0003-1091-9339"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Michael Nicolaidis","raw_affiliation_strings":["TIMA Laboratory, Grenoble, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)"],"raw_orcid":"https://orcid.org/0000-0003-1091-9339","affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210087012"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11428793,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"6","issue":"3","first_page":"493","last_page":"506"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.8481385707855225},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6469064950942993},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.5670480728149414},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5213881134986877},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4882931709289551},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4859829843044281},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4661003351211548},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4509812593460083},{"id":"https://openalex.org/keywords/ideal","display_name":"Ideal (ethics)","score":0.4250052571296692},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4238676428794861},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36088621616363525},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3092736601829529},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10723021626472473},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10315263271331787}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.8481385707855225},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6469064950942993},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.5670480728149414},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5213881134986877},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4882931709289551},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4859829843044281},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4661003351211548},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4509812593460083},{"id":"https://openalex.org/C2776639384","wikidata":"https://www.wikidata.org/wiki/Q840396","display_name":"Ideal (ethics)","level":2,"score":0.4250052571296692},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4238676428794861},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36088621616363525},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3092736601829529},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10723021626472473},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10315263271331787},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tsusc.2018.2878832","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsusc.2018.2878832","pdf_url":null,"source":{"id":"https://openalex.org/S4210221417","display_name":"IEEE Transactions on Sustainable Computing","issn_l":"2377-3782","issn":["2377-3782","2377-3790"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Sustainable Computing","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-02010951v1","is_oa":false,"landing_page_url":"https://hal.science/hal-02010951","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Sustainable Computing, 2018, ⟨10.1109/TSUSC.2018.2878832⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W2013185880","https://openalex.org/W2041727850","https://openalex.org/W2043318181","https://openalex.org/W2069217703","https://openalex.org/W2073292902","https://openalex.org/W2079706534","https://openalex.org/W2084578528","https://openalex.org/W2086447087","https://openalex.org/W2097596884","https://openalex.org/W2101301454","https://openalex.org/W2104677471","https://openalex.org/W2121618685","https://openalex.org/W2133079932","https://openalex.org/W2138634741","https://openalex.org/W2153409103","https://openalex.org/W2163094833","https://openalex.org/W2163421219","https://openalex.org/W2178304595","https://openalex.org/W2789221923","https://openalex.org/W4236432903","https://openalex.org/W4299639710","https://openalex.org/W6653795448"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W2590472383","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W141820298","https://openalex.org/W2383873009","https://openalex.org/W2393580911","https://openalex.org/W4378770497"],"abstract_inverted_index":{"Silicon-based":[0],"CMOS":[1],"technologies":[2],"are":[3,43],"fast":[4],"approaching":[5,10],"their":[6],"ultimate":[7],"limits.":[8],"By":[9],"these":[11],"limits,":[12],"fabrication":[13],"yield,":[14,50],"reliability,":[15,51],"and":[16,34,40,52,69,96],"power":[17,53],"densities,":[18],"worsen":[19],"steadily":[20],"making":[21],"further":[22],"nanometric":[23],"scaling":[24,90],"increasingly":[25],"difficult.":[26],"These":[27],"problems":[28],"would":[29],"become":[30],"showstoppers":[31],"in":[32,91],"ultimate-CMOS":[33,95],"post-CMOS":[35,97],"technologies,":[36],"unless":[37],"efficient":[38,80],"fault-mitigation":[39],"low-power":[41],"approaches":[42],"developed":[44],"to":[45],"maintain":[46],"acceptable":[47],"levels":[48],"of":[49,72,94],"densities.":[54],"This":[55],"paper":[56],"describes":[57],"the":[58,64,73,84,92],"GRAAL":[59],"architecture,":[60],"which":[61],"improves":[62],"significantly":[63],"fault":[65],"detection":[66],"efficiency,":[67],"cost,":[68],"timing":[70],"constraints":[71],"double-sampling":[74],"approach,":[75],"providing":[76],"this":[77],"way":[78],"an":[79],"scheme":[81],"for":[82],"solving":[83],"issues":[85],"induced":[86],"by":[87],"aggressive":[88],"technology":[89],"era":[93],"technologies.":[98]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2018-11-09T00:00:00"}