{"id":"https://openalex.org/W2141039252","doi":"https://doi.org/10.1109/tsmcb.2002.1033176","title":"Defect detection in textured materials using optimized filters","display_name":"Defect detection in textured materials using optimized filters","publication_year":2002,"publication_date":"2002-10-01","ids":{"openalex":"https://openalex.org/W2141039252","doi":"https://doi.org/10.1109/tsmcb.2002.1033176","mag":"2141039252","pmid":"https://pubmed.ncbi.nlm.nih.gov/18244861"},"language":"en","primary_location":{"id":"doi:10.1109/tsmcb.2002.1033176","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsmcb.2002.1033176","pdf_url":null,"source":{"id":"https://openalex.org/S4210170378","display_name":"IEEE Transactions on Systems Man and Cybernetics Part B (Cybernetics)","issn_l":"1083-4419","issn":["1083-4419","1941-0492"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Systems, Man and Cybernetics, Part B (Cybernetics)","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051203367","display_name":"Ajay Kumar","orcid":"https://orcid.org/0000-0002-3761-2436"},"institutions":[{"id":"https://openalex.org/I200769079","display_name":"Hong Kong University of Science and Technology","ror":"https://ror.org/00q4vv597","country_code":"HK","type":"education","lineage":["https://openalex.org/I200769079"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"A. Kumar","raw_affiliation_strings":["Dept. of Comput. Sci., Hong Kong Univ. of Sci. & Technol., Clear Water Bay, China","[Department of Computer Science, Hong Kong University of Science and Technology, Clear Water Bay, China]"],"affiliations":[{"raw_affiliation_string":"Dept. of Comput. Sci., Hong Kong Univ. of Sci. & Technol., Clear Water Bay, China","institution_ids":["https://openalex.org/I200769079"]},{"raw_affiliation_string":"[Department of Computer Science, Hong Kong University of Science and Technology, Clear Water Bay, China]","institution_ids":["https://openalex.org/I200769079"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050782286","display_name":"G.K.H. Pang","orcid":"https://orcid.org/0000-0003-2257-2301"},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"G.K.H. Pang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I889458895"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5051203367"],"corresponding_institution_ids":["https://openalex.org/I200769079"],"apc_list":null,"apc_paid":null,"fwci":8.2401,"has_fulltext":false,"cited_by_count":126,"citation_normalized_percentile":{"value":0.97478077,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"32","issue":"5","first_page":"553","last_page":"570"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6107416749000549},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5578803420066833},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5104221701622009},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.45411399006843567},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4228420853614807},{"id":"https://openalex.org/keywords/linear-filter","display_name":"Linear filter","score":0.41548609733581543},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3672468066215515},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3327818214893341},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.2186494767665863},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16122853755950928},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07300963997840881}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6107416749000549},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5578803420066833},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5104221701622009},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.45411399006843567},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4228420853614807},{"id":"https://openalex.org/C139722471","wikidata":"https://www.wikidata.org/wiki/Q2619517","display_name":"Linear filter","level":3,"score":0.41548609733581543},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3672468066215515},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3327818214893341},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2186494767665863},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16122853755950928},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07300963997840881},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/tsmcb.2002.1033176","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsmcb.2002.1033176","pdf_url":null,"source":{"id":"https://openalex.org/S4210170378","display_name":"IEEE Transactions on Systems Man and Cybernetics Part B (Cybernetics)","issn_l":"1083-4419","issn":["1083-4419","1941-0492"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Systems, Man and Cybernetics, Part B (Cybernetics)","raw_type":"journal-article"},{"id":"pmid:18244861","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/18244861","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on systems, man, and cybernetics. Part B, Cybernetics : a publication of the IEEE Systems, Man, and Cybernetics Society","raw_type":null},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.141.6704","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.141.6704","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://web.iitd.ac.in/~ajaykr/Journal%20paper-2000.pdf","raw_type":"text"},{"id":"pmh:oai:hub.hku.hk:10722/42905","is_oa":false,"landing_page_url":"http://hdl.handle.net/10722/42905","pdf_url":null,"source":{"id":"https://openalex.org/S4377196271","display_name":"The HKU Scholars Hub (University of Hong Kong)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I889458895","host_organization_name":"University of Hong Kong","host_organization_lineage":["https://openalex.org/I889458895"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7799999713897705,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":57,"referenced_works":["https://openalex.org/W42700527","https://openalex.org/W117795156","https://openalex.org/W1495179279","https://openalex.org/W1588043677","https://openalex.org/W1667165204","https://openalex.org/W1871561359","https://openalex.org/W1967537313","https://openalex.org/W1969115782","https://openalex.org/W1973678689","https://openalex.org/W1980004124","https://openalex.org/W1985563622","https://openalex.org/W1987580879","https://openalex.org/W1992117926","https://openalex.org/W2008405640","https://openalex.org/W2013207319","https://openalex.org/W2014179144","https://openalex.org/W2017672812","https://openalex.org/W2018554424","https://openalex.org/W2028555403","https://openalex.org/W2031919959","https://openalex.org/W2033548270","https://openalex.org/W2043664341","https://openalex.org/W2049694710","https://openalex.org/W2050151150","https://openalex.org/W2072930813","https://openalex.org/W2088478449","https://openalex.org/W2089186563","https://openalex.org/W2101202505","https://openalex.org/W2107813057","https://openalex.org/W2112368969","https://openalex.org/W2117070909","https://openalex.org/W2117312310","https://openalex.org/W2121166252","https://openalex.org/W2125050360","https://openalex.org/W2125465482","https://openalex.org/W2125612465","https://openalex.org/W2126413416","https://openalex.org/W2130037961","https://openalex.org/W2132549764","https://openalex.org/W2145456339","https://openalex.org/W2147278757","https://openalex.org/W2153701440","https://openalex.org/W2162241465","https://openalex.org/W2169029660","https://openalex.org/W2169551060","https://openalex.org/W2169868103","https://openalex.org/W2170758136","https://openalex.org/W2171542147","https://openalex.org/W2285291295","https://openalex.org/W2540326728","https://openalex.org/W2577732136","https://openalex.org/W2893844675","https://openalex.org/W4241964224","https://openalex.org/W4254403724","https://openalex.org/W4255391993","https://openalex.org/W4285719527","https://openalex.org/W6731663847"],"related_works":["https://openalex.org/W3147584709","https://openalex.org/W2977677679","https://openalex.org/W1992327129","https://openalex.org/W2381986121","https://openalex.org/W2370918718","https://openalex.org/W2256933480","https://openalex.org/W2370081953","https://openalex.org/W2166955423","https://openalex.org/W2010558825","https://openalex.org/W1977836105"],"abstract_inverted_index":{"The":[0,27,42,71,81],"problem":[1],"of":[2,29,48,88],"automated":[3],"defect":[4,15],"detection":[5,16],"in":[6],"textured":[7],"materials":[8],"is":[9,25,69],"investigated.":[10],"A":[11,59],"new":[12,75],"approach":[13,76,90],"for":[14,51,91],"using":[17],"linear":[18],"FIR":[19],"filters":[20,50,68],"with":[21,34],"optimized":[22],"energy":[23],"separation":[24,32],"proposed.":[26,70],"performance":[28],"different":[30],"feature":[31],"criteria":[33],"reference":[35],"to":[36,45],"fabric":[37],"defects":[38],"has":[39],"been":[40],"evaluated.":[41],"issues":[43],"relating":[44],"the":[46,66,86,89],"design":[47],"optimal":[49,67],"supervised":[52],"and":[53],"unsupervised":[54],"web":[55,61],"inspection":[56,62],"are":[57],"addressed.":[58],"general":[60],"system":[63],"based":[64],"on":[65,73],"experiments":[72],"this":[74],"have":[77],"yielded":[78],"excellent":[79],"results.":[80],"low":[82],"computational":[83],"requirement":[84],"confirms":[85],"usefulness":[87],"industrial":[92],"inspection.":[93]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":11},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":4}],"updated_date":"2026-04-15T08:11:43.952461","created_date":"2025-10-10T00:00:00"}