{"id":"https://openalex.org/W2062027733","doi":"https://doi.org/10.1109/tsmc.1984.6313300","title":"A system for the automatic visual inspection of bare-printed circuit boards","display_name":"A system for the automatic visual inspection of bare-printed circuit boards","publication_year":1984,"publication_date":"1984-09-01","ids":{"openalex":"https://openalex.org/W2062027733","doi":"https://doi.org/10.1109/tsmc.1984.6313300","mag":"2062027733"},"language":"en","primary_location":{"id":"doi:10.1109/tsmc.1984.6313300","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsmc.1984.6313300","pdf_url":null,"source":{"id":"https://openalex.org/S76152103","display_name":"IEEE Transactions on Systems Man and Cybernetics","issn_l":"0018-9472","issn":["0018-9472","2168-2909"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Systems, Man, and Cybernetics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075769902","display_name":"Geoff West","orcid":"https://orcid.org/0000-0003-3279-3642"},"institutions":[{"id":"https://openalex.org/I180825142","display_name":"City, University of London","ror":"https://ror.org/04489at23","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I180825142"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"G. A. W. West","raw_affiliation_strings":["Measurement and Instrument Centre, The School of Electrical Engineering and Applied Physics, The City University, London, England"],"affiliations":[{"raw_affiliation_string":"Measurement and Instrument Centre, The School of Electrical Engineering and Applied Physics, The City University, London, England","institution_ids":["https://openalex.org/I180825142"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5075769902"],"corresponding_institution_ids":["https://openalex.org/I180825142"],"apc_list":null,"apc_paid":null,"fwci":4.8266,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.93812483,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"SMC-14","issue":"5","first_page":"767","last_page":"773"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9686999917030334,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9646000266075134,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.8045358657836914},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.7919232249259949},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.780078649520874},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.7615410685539246},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.7519510388374329},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5738703608512878},{"id":"https://openalex.org/keywords/hierarchy","display_name":"Hierarchy","score":0.4841254651546478},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.4551326334476471},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.35012948513031006},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32890719175338745},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.32107219099998474},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.2116374373435974},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.1380528211593628},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07108673453330994}],"concepts":[{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.8045358657836914},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.7919232249259949},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.780078649520874},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.7615410685539246},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.7519510388374329},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5738703608512878},{"id":"https://openalex.org/C31170391","wikidata":"https://www.wikidata.org/wiki/Q188619","display_name":"Hierarchy","level":2,"score":0.4841254651546478},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.4551326334476471},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.35012948513031006},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32890719175338745},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.32107219099998474},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.2116374373435974},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.1380528211593628},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07108673453330994},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C34447519","wikidata":"https://www.wikidata.org/wiki/Q179522","display_name":"Market economy","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tsmc.1984.6313300","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsmc.1984.6313300","pdf_url":null,"source":{"id":"https://openalex.org/S76152103","display_name":"IEEE Transactions on Systems Man and Cybernetics","issn_l":"0018-9472","issn":["0018-9472","2168-2909"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Systems, Man, and Cybernetics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2113302376","https://openalex.org/W1560398276","https://openalex.org/W4362650061","https://openalex.org/W2969283495","https://openalex.org/W1979172994","https://openalex.org/W2107946198","https://openalex.org/W3149631139","https://openalex.org/W2004056068","https://openalex.org/W1521088445","https://openalex.org/W2003501636"],"abstract_inverted_index":{"A":[0],"system":[1,49],"for":[2,36],"automatic":[3],"inspection":[4,17,39],"of":[5,23,27],"bare":[6],"printed":[7],"circuit":[8],"boards":[9],"is":[10],"described":[11],"that":[12],"uses":[13],"three":[14],"concepts:":[15],"multiple":[16],"systems;":[18],"learn":[19],"and":[20,46],"inspect":[21],"phases":[22],"inspection;":[24],"a":[25,37,52],"hierarchy":[26],"detection":[28,42],"processes":[29],"to":[30],"satisfy":[31],"the":[32],"four":[33],"basic":[34],"criteria":[35],"successful":[38],"system,":[40],"namely":[41],"performance,":[43],"speed,":[44],"cost,":[45],"flexibility.":[47],"The":[48],"has":[50],"reached":[51],"stage":[53],"at":[54],"which":[55],"industrial":[56],"implementation":[57],"can":[58],"be":[59],"considered.":[60]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}