{"id":"https://openalex.org/W2002546996","doi":"https://doi.org/10.1109/tsmc.1976.4309417","title":"A Statistical Model for Machine Print Recognition","display_name":"A Statistical Model for Machine Print Recognition","publication_year":1976,"publication_date":"1976-10-01","ids":{"openalex":"https://openalex.org/W2002546996","doi":"https://doi.org/10.1109/tsmc.1976.4309417","mag":"2002546996"},"language":"en","primary_location":{"id":"doi:10.1109/tsmc.1976.4309417","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsmc.1976.4309417","pdf_url":null,"source":{"id":"https://openalex.org/S76152103","display_name":"IEEE Transactions on Systems Man and Cybernetics","issn_l":"0018-9472","issn":["0018-9472","2168-2909"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Systems, Man, and Cybernetics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023368804","display_name":"Thomas E. Milson","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Thomas E. Milson","raw_affiliation_strings":["Electrooptics Division, Texas Instruments, Inc., Dallas, TX, USA","Texas Instruments"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrooptics Division, Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instruments","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078861665","display_name":"K.R. Rao","orcid":"https://orcid.org/0000-0002-8513-3114"},"institutions":[{"id":"https://openalex.org/I189196454","display_name":"The University of Texas at Arlington","ror":"https://ror.org/019kgqr73","country_code":"US","type":"education","lineage":["https://openalex.org/I189196454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. R. Rao","raw_affiliation_strings":["Department of Electrical Engineering, University of Technology, Arlington, TX, USA","Department of Electrical Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Technology, Arlington, TX, USA","institution_ids":["https://openalex.org/I189196454"]},{"raw_affiliation_string":"Department of Electrical Engineering","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0442,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.72701556,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"SMC-6","issue":"10","first_page":"671","last_page":"678"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11447","display_name":"Blind Source Separation Techniques","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11447","display_name":"Blind Source Separation Techniques","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9861999750137329,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10057","display_name":"Face and Expression Recognition","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6585444211959839},{"id":"https://openalex.org/keywords/statistic","display_name":"Statistic","score":0.6434110999107361},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5981542468070984},{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.5132033824920654},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4683994948863983},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4586794972419739},{"id":"https://openalex.org/keywords/bayes-theorem","display_name":"Bayes' theorem","score":0.45490962266921997},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.42203304171562195},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.41517508029937744},{"id":"https://openalex.org/keywords/naive-bayes-classifier","display_name":"Naive Bayes classifier","score":0.41150251030921936},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.34320586919784546},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.33422011137008667},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2543157935142517},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24542254209518433},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.1767508089542389},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.1375163197517395},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.1345311999320984},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.11329814791679382}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6585444211959839},{"id":"https://openalex.org/C89128539","wikidata":"https://www.wikidata.org/wiki/Q1949963","display_name":"Statistic","level":2,"score":0.6434110999107361},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5981542468070984},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.5132033824920654},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4683994948863983},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4586794972419739},{"id":"https://openalex.org/C207201462","wikidata":"https://www.wikidata.org/wiki/Q182505","display_name":"Bayes' theorem","level":3,"score":0.45490962266921997},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.42203304171562195},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.41517508029937744},{"id":"https://openalex.org/C52001869","wikidata":"https://www.wikidata.org/wiki/Q812530","display_name":"Naive Bayes classifier","level":3,"score":0.41150251030921936},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.34320586919784546},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.33422011137008667},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2543157935142517},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24542254209518433},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.1767508089542389},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.1375163197517395},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.1345311999320984},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.11329814791679382},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tsmc.1976.4309417","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsmc.1976.4309417","pdf_url":null,"source":{"id":"https://openalex.org/S76152103","display_name":"IEEE Transactions on Systems Man and Cybernetics","issn_l":"0018-9472","issn":["0018-9472","2168-2909"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Systems, Man, and Cybernetics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1500551892","https://openalex.org/W1978995065","https://openalex.org/W1987338578","https://openalex.org/W2002546996","https://openalex.org/W2009881214","https://openalex.org/W2015346536","https://openalex.org/W2022035875","https://openalex.org/W2028926200","https://openalex.org/W2051058266","https://openalex.org/W2056551493","https://openalex.org/W2066159470","https://openalex.org/W2070970142","https://openalex.org/W2084803441","https://openalex.org/W2093147156","https://openalex.org/W2162783854","https://openalex.org/W2189444568","https://openalex.org/W4239894305","https://openalex.org/W4300636979"],"related_works":["https://openalex.org/W2359776416","https://openalex.org/W2353788488","https://openalex.org/W2394466068","https://openalex.org/W1987683558","https://openalex.org/W2361916204","https://openalex.org/W2372011046","https://openalex.org/W2537862391","https://openalex.org/W2417174640","https://openalex.org/W1973600295","https://openalex.org/W1599512561"],"abstract_inverted_index":{"With":[0],"the":[1,7,29,33,38,44,57,67,71,78,84,118,125,137],"aid":[2],"of":[3],"statistical":[4],"detection":[5],"theory,":[6],"continuous":[8],"optimum":[9,46,96,120],"Bayes":[10],"recognition":[11,47,108],"scheme":[12],"for":[13,66],"machine":[14,106,131],"characters":[15],"is":[16,25,110,122,134],"developed":[17],"using":[18],"a":[19,63,105],"sufficient":[20],"statistic":[21],"approach.":[22],"This":[23],"result":[24],"then":[26,52,90],"extended":[27],"to":[28,92],"discrete":[30,45,95,119],"case":[31],"and":[32,70,117,136],"associated":[34],"problems":[35],"such":[36,82],"as":[37,83],"sampling":[39,59,68],"effects":[40],"are":[41,51,56,89,115,139],"examined.":[42],"Using":[43],"model,":[48],"design":[49,98,113],"parameters":[50,114],"developed.":[53],"Among":[54],"these":[55,94],"critical":[58],"matrix":[60,73],"which":[61,74],"provides":[62,75],"lower":[64],"bound":[65],"rates":[69],"rate":[72],"information":[76],"on":[77,101,124],"classification":[79],"error.":[80],"Algorithms":[81],"two-dimensional":[85],"fast":[86],"Fourier":[87],"transform":[88],"employed":[91],"calculate":[93],"model":[97],"parameters.":[99],"Based":[100],"this":[102],"theoretical":[103],"background":[104],"print":[107,132],"problem":[109],"presented.":[111],"The":[112],"computed":[116],"system":[121],"simulated":[123],"digital":[126],"computer.":[127],"Finally":[128],"some":[129],"actual":[130],"data":[133],"recognized":[135],"results":[138],"analyzed.":[140]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}