{"id":"https://openalex.org/W2007664866","doi":"https://doi.org/10.1109/tsmc.1975.5408442","title":"On Pattern Recognition and Quality Control","display_name":"On Pattern Recognition and Quality Control","publication_year":1975,"publication_date":"1975-01-01","ids":{"openalex":"https://openalex.org/W2007664866","doi":"https://doi.org/10.1109/tsmc.1975.5408442","mag":"2007664866"},"language":"en","primary_location":{"id":"doi:10.1109/tsmc.1975.5408442","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsmc.1975.5408442","pdf_url":null,"source":{"id":"https://openalex.org/S76152103","display_name":"IEEE Transactions on Systems Man and Cybernetics","issn_l":"0018-9472","issn":["0018-9472","2168-2909"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Systems, Man, and Cybernetics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042224273","display_name":"Paul P. Wang","orcid":"https://orcid.org/0000-0002-9602-5979"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]},{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Paul P. Wang","raw_affiliation_strings":["Department of Electrical Engineering, Duke University, Durham, NC, USA","Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA","institution_ids":["https://openalex.org/I24603500"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5042224273"],"corresponding_institution_ids":["https://openalex.org/I170897317","https://openalex.org/I24603500"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.27289462,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"SMC-5","issue":"4","first_page":"470","last_page":"472"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.8920999765396118,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.8920999765396118,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.891700029373169,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.8495000004768372,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quality-assurance","display_name":"Quality assurance","score":0.7569824457168579},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.741987943649292},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.6341977715492249},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5584410429000854},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.556698739528656},{"id":"https://openalex.org/keywords/process-control","display_name":"Process control","score":0.5182964205741882},{"id":"https://openalex.org/keywords/quality-control","display_name":"Quality control","score":0.4881373345851898},{"id":"https://openalex.org/keywords/quality-management","display_name":"Quality management","score":0.43593621253967285},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.35665321350097656},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.33881765604019165},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3278122544288635},{"id":"https://openalex.org/keywords/operations-management","display_name":"Operations management","score":0.21170365810394287}],"concepts":[{"id":"https://openalex.org/C106436119","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assurance","level":3,"score":0.7569824457168579},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.741987943649292},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.6341977715492249},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5584410429000854},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.556698739528656},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.5182964205741882},{"id":"https://openalex.org/C51704429","wikidata":"https://www.wikidata.org/wiki/Q827792","display_name":"Quality control","level":3,"score":0.4881373345851898},{"id":"https://openalex.org/C71405471","wikidata":"https://www.wikidata.org/wiki/Q757012","display_name":"Quality management","level":3,"score":0.43593621253967285},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.35665321350097656},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.33881765604019165},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3278122544288635},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.21170365810394287},{"id":"https://openalex.org/C2778618615","wikidata":"https://www.wikidata.org/wiki/Q4008393","display_name":"External quality assessment","level":2,"score":0.0},{"id":"https://openalex.org/C198783460","wikidata":"https://www.wikidata.org/wiki/Q629173","display_name":"Management system","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tsmc.1975.5408442","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsmc.1975.5408442","pdf_url":null,"source":{"id":"https://openalex.org/S76152103","display_name":"IEEE Transactions on Systems Man and Cybernetics","issn_l":"0018-9472","issn":["0018-9472","2168-2909"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Systems, Man, and Cybernetics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W321570508","https://openalex.org/W1570063685","https://openalex.org/W2330764091","https://openalex.org/W2791384966","https://openalex.org/W4254730433"],"related_works":["https://openalex.org/W2094580389","https://openalex.org/W1498614377","https://openalex.org/W351088382","https://openalex.org/W2364677363","https://openalex.org/W2350278637","https://openalex.org/W1578826488","https://openalex.org/W856965851","https://openalex.org/W2140661954","https://openalex.org/W2364800666","https://openalex.org/W2485333066"],"abstract_inverted_index":{"The":[0,10,27],"application":[1],"of":[2,13,24,29,48,54,63,71],"pattern":[3,32],"recognition":[4],"to":[5,20],"quality":[6,15,25,36,39,43],"control":[7,16,37,62,74],"is":[8,17],"shown.":[9],"well-known":[11],"methodology":[12],"conventional":[14,50],"described":[18],"briefly":[19],"illustrate":[21],"the":[22,31,55,64,69],"philosophy":[23],"measurement.":[26],"advantages":[28],"adopting":[30],"classification":[33],"approach":[34],"in":[35],"(or":[38],"assurance)":[40],"include":[41],"on-line":[42],"monitoring":[44],"without":[45],"much":[46],"alteration":[47],"existing":[49],"systems,":[51],"instant":[52],"diagnosis":[53],"production":[56],"process,":[57],"and":[58],"ultimately,":[59],"automatic":[60],"feedback":[61],"overall":[65],"manufacturing":[66],"process":[67],"through":[68],"development":[70],"a":[72],"corrective":[73],"policy.":[75]},"counts_by_year":[],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}