{"id":"https://openalex.org/W4416582979","doi":"https://doi.org/10.1109/tsg.2025.3636168","title":"Intelligent Faulted Span Localization for Overhead Power Distribution Networks by Non-Contact Magnetic Sensing","display_name":"Intelligent Faulted Span Localization for Overhead Power Distribution Networks by Non-Contact Magnetic Sensing","publication_year":2025,"publication_date":"2025-11-24","ids":{"openalex":"https://openalex.org/W4416582979","doi":"https://doi.org/10.1109/tsg.2025.3636168"},"language":null,"primary_location":{"id":"doi:10.1109/tsg.2025.3636168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsg.2025.3636168","pdf_url":null,"source":{"id":"https://openalex.org/S59604973","display_name":"IEEE Transactions on Smart Grid","issn_l":"1949-3053","issn":["1949-3053","1949-3061"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Smart Grid","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041422459","display_name":"Arsalan Habib Khawaja","orcid":"https://orcid.org/0000-0002-3507-7767"},"institutions":[{"id":"https://openalex.org/I31595395","display_name":"Chengdu University of Technology","ror":"https://ror.org/05pejbw21","country_code":"CN","type":"education","lineage":["https://openalex.org/I31595395"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Arsalan Habib Khawaja","raw_affiliation_strings":["College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-3507-7767","affiliations":[{"raw_affiliation_string":"College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, Chengdu, China","institution_ids":["https://openalex.org/I31595395"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076350750","display_name":"Qi Huang","orcid":"https://orcid.org/0000-0002-8637-0269"},"institutions":[{"id":"https://openalex.org/I1297991670","display_name":"Southwest University of Science and Technology","ror":"https://ror.org/04d996474","country_code":"CN","type":"education","lineage":["https://openalex.org/I1297991670"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Huang","raw_affiliation_strings":["School of Information Engineering, Southwest University of Science and Technology, Mianyang, China"],"raw_orcid":"https://orcid.org/0000-0002-8637-0269","affiliations":[{"raw_affiliation_string":"School of Information Engineering, Southwest University of Science and Technology, Mianyang, China","institution_ids":["https://openalex.org/I1297991670"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062626459","display_name":"Dongsheng Cai","orcid":"https://orcid.org/0000-0002-6862-7243"},"institutions":[{"id":"https://openalex.org/I31595395","display_name":"Chengdu University of Technology","ror":"https://ror.org/05pejbw21","country_code":"CN","type":"education","lineage":["https://openalex.org/I31595395"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongsheng Cai","raw_affiliation_strings":["College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-6862-7243","affiliations":[{"raw_affiliation_string":"College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, Chengdu, China","institution_ids":["https://openalex.org/I31595395"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026637101","display_name":"Tianxiang Chen","orcid":"https://orcid.org/0000-0001-7484-1417"},"institutions":[{"id":"https://openalex.org/I31595395","display_name":"Chengdu University of Technology","ror":"https://ror.org/05pejbw21","country_code":"CN","type":"education","lineage":["https://openalex.org/I31595395"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianxiang Chen","raw_affiliation_strings":["College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, Chengdu, China","institution_ids":["https://openalex.org/I31595395"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100431969","display_name":"Wei Liu","orcid":"https://orcid.org/0000-0003-2860-1783"},"institutions":[{"id":"https://openalex.org/I31595395","display_name":"Chengdu University of Technology","ror":"https://ror.org/05pejbw21","country_code":"CN","type":"education","lineage":["https://openalex.org/I31595395"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Liu","raw_affiliation_strings":["College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, Chengdu, China","institution_ids":["https://openalex.org/I31595395"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089450818","display_name":"Qiang Ou","orcid":"https://orcid.org/0000-0002-2577-3072"},"institutions":[{"id":"https://openalex.org/I4401041622","display_name":"Chengdu Technological University","ror":"https://ror.org/04713ex73","country_code":null,"type":"education","lineage":["https://openalex.org/I4401041622"]},{"id":"https://openalex.org/I44468530","display_name":"Qingdao University of Technology","ror":"https://ror.org/01qzc0f54","country_code":"CN","type":"education","lineage":["https://openalex.org/I44468530"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Ou","raw_affiliation_strings":["School of Automation and Electrical Engineering, Chengdu Technological University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-2577-3072","affiliations":[{"raw_affiliation_string":"School of Automation and Electrical Engineering, Chengdu Technological University, Chengdu, China","institution_ids":["https://openalex.org/I44468530","https://openalex.org/I4401041622"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.30664654,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"17","issue":"3","first_page":"2143","last_page":"2157"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.7152000069618225,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.7152000069618225,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13715","display_name":"Power Line Inspection Robots","score":0.11010000109672546,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.08829999715089798,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/span","display_name":"Span (engineering)","score":0.7350999712944031},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6614999771118164},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6446999907493591},{"id":"https://openalex.org/keywords/overhead-line","display_name":"Overhead line","score":0.5849000215530396},{"id":"https://openalex.org/keywords/electric-power-transmission","display_name":"Electric power transmission","score":0.5827000141143799},{"id":"https://openalex.org/keywords/bottleneck","display_name":"Bottleneck","score":0.5408999919891357},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.47699999809265137},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.46799999475479126},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.3806999921798706},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3743000030517578}],"concepts":[{"id":"https://openalex.org/C2778753569","wikidata":"https://www.wikidata.org/wiki/Q1960395","display_name":"Span (engineering)","level":2,"score":0.7350999712944031},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6614999771118164},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6446999907493591},{"id":"https://openalex.org/C2775861652","wikidata":"https://www.wikidata.org/wiki/Q110701","display_name":"Overhead line","level":2,"score":0.5849000215530396},{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.5827000141143799},{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.5408999919891357},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5047000050544739},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.47699999809265137},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.46799999475479126},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43650001287460327},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41659998893737793},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41440001130104065},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.3806999921798706},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3797000050544739},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3743000030517578},{"id":"https://openalex.org/C132885549","wikidata":"https://www.wikidata.org/wiki/Q271870","display_name":"Power-line communication","level":3,"score":0.3718000054359436},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.3709999918937683},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3700000047683716},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.3521000146865845},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.34310001134872437},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.3384999930858612},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.33160001039505005},{"id":"https://openalex.org/C92018576","wikidata":"https://www.wikidata.org/wiki/Q3242194","display_name":"Power transmission","level":3,"score":0.33070001006126404},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.32989999651908875},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.3149000108242035},{"id":"https://openalex.org/C2779119184","wikidata":"https://www.wikidata.org/wiki/Q294350","display_name":"ALARM","level":2,"score":0.31200000643730164},{"id":"https://openalex.org/C23340480","wikidata":"https://www.wikidata.org/wiki/Q358932","display_name":"Inrush current","level":4,"score":0.3001999855041504},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2921000123023987},{"id":"https://openalex.org/C89992363","wikidata":"https://www.wikidata.org/wiki/Q5961558","display_name":"Track (disk drive)","level":2,"score":0.29019999504089355},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.27889999747276306},{"id":"https://openalex.org/C206658404","wikidata":"https://www.wikidata.org/wiki/Q12725","display_name":"Electricity","level":2,"score":0.27709999680519104},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.26249998807907104},{"id":"https://openalex.org/C2778562939","wikidata":"https://www.wikidata.org/wiki/Q1298791","display_name":"Synchronization (alternating current)","level":3,"score":0.2621999979019165},{"id":"https://openalex.org/C2776836416","wikidata":"https://www.wikidata.org/wiki/Q1364844","display_name":"False alarm","level":2,"score":0.257999986410141},{"id":"https://openalex.org/C2988516024","wikidata":"https://www.wikidata.org/wiki/Q441195","display_name":"Life span","level":2,"score":0.25679999589920044}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tsg.2025.3636168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsg.2025.3636168","pdf_url":null,"source":{"id":"https://openalex.org/S59604973","display_name":"IEEE Transactions on Smart Grid","issn_l":"1949-3053","issn":["1949-3053","1949-3061"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Smart Grid","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3508024397","display_name":null,"funder_award_id":"ISF29523","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5560773564","display_name":null,"funder_award_id":"U23A20651","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Power":[0,8],"distribution":[1,41,150],"network":[2],"is":[3,158,171,205],"a":[4,77,127,143,185],"critical":[5],"link":[6],"of":[7,96,111,116,182,227],"grid":[9],"throughout":[10],"the":[11,22,37,241,248],"world,":[12],"where":[13],"overhead":[14,140],"power":[15,215],"lines":[16,141],"transport":[17],"electricity":[18],"from":[19,139,155,187],"substation":[20],"to":[21,32,45,82,133,146,161,164,173,192,207,221,245],"consumers":[23],"end.":[24],"Short":[25],"circuit":[26],"faults":[27,39,56],"are":[28],"common":[29],"and":[30,51,68,75,93,113,121,148,190,230,236],"contribute":[31],"more":[33],"than":[34],"50%":[35],"for":[36,106,175],"total":[38],"in":[40,64,102,142,225],"lines,":[42],"mainly":[43],"due":[44],"insulation":[46],"failures,":[47],"vegetation":[48],"growth,":[49],"birding":[50],"line":[52,117,151],"intrusion.":[53],"Such":[54],"non-clearing":[55],"require":[57],"manual":[58,84],"faulted":[59,97,166,249],"span":[60,98,167,250],"retrieval":[61],"which":[62],"results":[63,101],"longer":[65],"outage":[66,104],"times":[67],"enormous":[69],"human":[70],"effort.":[71],"This":[72,100],"work":[73],"presents":[74],"demonstrate":[76],"complete":[78],"system":[79,204,243],"level":[80],"approach":[81],"automates":[83],"fault":[85],"localization":[86],"by":[87],"non-contact":[88,144],"magnetic":[89,136],"sensing,":[90],"its":[91],"processing":[92],"rapid":[94],"reporting":[95],"length.":[99,168,251],"reduced":[103],"time":[105],"customers,":[107],"less":[108],"man":[109],"hours":[110],"patrolling,":[112],"improved":[114],"safety":[115],"personnel.":[118],"To":[119],"test":[120],"validate,":[122],"this":[123],"article":[124],"further":[125,159],"designs":[126],"novel":[128],"Remote":[129],"Terminal":[130],"Unit":[131],"(RTU)":[132],"track":[134],"weak":[135],"signatures":[137],"radiated":[138],"arrangement":[145],"detect":[147],"identify":[149,165],"status.":[152],"The":[153,169,202],"state":[154],"deployed":[156],"RTUs":[157],"transmitted":[160],"cloud-based":[162],"algorithm":[163],"RTU":[170],"developed":[172],"cater":[174],"real":[176],"world":[177],"modalities":[178],"such":[179],"as":[180,196,198,209,211],"ease":[181],"installation":[183],"at":[184],"distance":[186],"live":[188],"conductors,":[189],"ability":[191],"withstand":[193],"geomagnetic,":[194],"ferromagnetic":[195],"well":[197,210],"intrinsic":[199],"sensor":[200],"noise.":[201],"presented":[203],"implementable":[206],"radial":[208],"meshed":[212],"based":[213],"modern":[214],"systems":[216],"with":[217],"an":[218],"inbuilt":[219],"mechanism":[220],"prevent":[222],"false":[223],"alarm":[224],"events":[226],"back":[228],"feeding":[229],"inrush":[231],"current.":[232],"High":[233],"voltage":[234],"lab":[235],"extensive":[237],"on-field":[238],"testing":[239],"verifies":[240],"overall":[242],"efficacy":[244],"successfully":[246],"localize":[247]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-11-25T00:00:00"}