{"id":"https://openalex.org/W2769392971","doi":"https://doi.org/10.1109/tsg.2017.2776310","title":"Intelligent Fault Detection Scheme for Microgrids With Wavelet-Based Deep Neural Networks","display_name":"Intelligent Fault Detection Scheme for Microgrids With Wavelet-Based Deep Neural Networks","publication_year":2017,"publication_date":"2017-11-22","ids":{"openalex":"https://openalex.org/W2769392971","doi":"https://doi.org/10.1109/tsg.2017.2776310","mag":"2769392971"},"language":"en","primary_location":{"id":"doi:10.1109/tsg.2017.2776310","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsg.2017.2776310","pdf_url":null,"source":{"id":"https://openalex.org/S59604973","display_name":"IEEE Transactions on Smart Grid","issn_l":"1949-3053","issn":["1949-3053","1949-3061"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Smart Grid","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076130415","display_name":"James J. Q. Yu","orcid":"https://orcid.org/0000-0002-6392-6711"},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"James J. Q. Yu","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034739083","display_name":"Yunhe Hou","orcid":"https://orcid.org/0000-0002-8882-9897"},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Yunhe Hou","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050605025","display_name":"Albert Y. S. Lam","orcid":"https://orcid.org/0000-0002-6887-9301"},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Albert Y. S. Lam","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056877599","display_name":"Victor O. K. Li","orcid":"https://orcid.org/0000-0002-1380-9445"},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Victor O. K. Li","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I889458895"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5076130415"],"corresponding_institution_ids":["https://openalex.org/I889458895"],"apc_list":null,"apc_paid":null,"fwci":12.8532,"has_fulltext":false,"cited_by_count":439,"citation_normalized_percentile":{"value":0.99079319,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"10","issue":"2","first_page":"1694","last_page":"1703"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13183","display_name":"Islanding Detection in Power Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13183","display_name":"Islanding Detection in Power Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10223","display_name":"Microgrid Control and Optimization","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microgrid","display_name":"Microgrid","score":0.9585435390472412},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.7554118633270264},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7241553068161011},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.5988376140594482},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5815750956535339},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5813446044921875},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5737518668174744},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.5197058320045471},{"id":"https://openalex.org/keywords/discrete-wavelet-transform","display_name":"Discrete wavelet transform","score":0.48393183946609497},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.44910216331481934},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.43815943598747253},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.42334532737731934},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.3572254180908203},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35605037212371826},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2857614755630493},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.08669474720954895}],"concepts":[{"id":"https://openalex.org/C2776784348","wikidata":"https://www.wikidata.org/wiki/Q5762595","display_name":"Microgrid","level":3,"score":0.9585435390472412},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.7554118633270264},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7241553068161011},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.5988376140594482},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5815750956535339},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5813446044921875},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5737518668174744},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.5197058320045471},{"id":"https://openalex.org/C46286280","wikidata":"https://www.wikidata.org/wiki/Q2414958","display_name":"Discrete wavelet transform","level":4,"score":0.48393183946609497},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.44910216331481934},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.43815943598747253},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.42334532737731934},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3572254180908203},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35605037212371826},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2857614755630493},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.08669474720954895},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tsg.2017.2776310","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsg.2017.2776310","pdf_url":null,"source":{"id":"https://openalex.org/S59604973","display_name":"IEEE Transactions on Smart Grid","issn_l":"1949-3053","issn":["1949-3053","1949-3061"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Smart Grid","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4844567096","display_name":null,"funder_award_id":"T23-701/14-N","funder_id":"https://openalex.org/F4320321592","funder_display_name":"Research Grants Council, University Grants Committee"},{"id":"https://openalex.org/G5420861545","display_name":null,"funder_award_id":"51707170","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321592","display_name":"Research Grants Council, University Grants Committee","ror":"https://ror.org/00djwmt25"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W1486474377","https://openalex.org/W1514403297","https://openalex.org/W1522301498","https://openalex.org/W1759197186","https://openalex.org/W1904365287","https://openalex.org/W1969044724","https://openalex.org/W1969786648","https://openalex.org/W1995165836","https://openalex.org/W2025169524","https://openalex.org/W2034102307","https://openalex.org/W2048172509","https://openalex.org/W2057570745","https://openalex.org/W2063895100","https://openalex.org/W2097395608","https://openalex.org/W2101927907","https://openalex.org/W2117539524","https://openalex.org/W2132984323","https://openalex.org/W2138484437","https://openalex.org/W2143995107","https://openalex.org/W2146045846","https://openalex.org/W2154291887","https://openalex.org/W2155388595","https://openalex.org/W2157331557","https://openalex.org/W2157483081","https://openalex.org/W2163605009","https://openalex.org/W2166609379","https://openalex.org/W2271840356","https://openalex.org/W2304131693","https://openalex.org/W2327849618","https://openalex.org/W2343847222","https://openalex.org/W2418137996","https://openalex.org/W2508193135","https://openalex.org/W2518115626","https://openalex.org/W2540406226","https://openalex.org/W2579461652","https://openalex.org/W2591489243","https://openalex.org/W2919115771","https://openalex.org/W2964121744","https://openalex.org/W4232897760","https://openalex.org/W4244471710","https://openalex.org/W4244844149","https://openalex.org/W6631190155","https://openalex.org/W6640036494","https://openalex.org/W6677651945","https://openalex.org/W6684191040","https://openalex.org/W6694517276"],"related_works":["https://openalex.org/W2085792030","https://openalex.org/W1588899229","https://openalex.org/W2172291505","https://openalex.org/W2023142747","https://openalex.org/W2037009764","https://openalex.org/W2063036707","https://openalex.org/W2501033992","https://openalex.org/W2377605153","https://openalex.org/W1967182499","https://openalex.org/W2088723847"],"abstract_inverted_index":{"Fault":[0],"detection":[1,32,51,155,184],"is":[2,106],"essential":[3],"in":[4,27,144,181],"microgrid":[5,54,77,166],"control":[6],"and":[7,19,59,73,79,167,188],"operation,":[8],"as":[9],"it":[10],"enables":[11],"the":[12,83,120,132,137,149,152,164,175,178],"system":[13],"to":[14,36,67,98,112],"perform":[15],"fast":[16,69],"fault":[17,31,41,50,70,114,127,154],"isolation":[18],"recovery.":[20,81],"The":[21,63,171],"adoption":[22],"of":[23,139,151,177,183],"inverter-interfaced":[24],"distributed":[25],"generation":[26],"microgrids":[28],"makes":[29],"traditional":[30],"schemes":[33],"inappropriate":[34],"due":[35],"their":[37],"dependence":[38],"on":[39,56,163],"significant":[40],"currents.":[42],"In":[43,82],"this":[44],"paper,":[45],"we":[46,157],"devise":[47],"an":[48],"intelligent":[49],"scheme":[52,65,122,133,180],"for":[53,76],"based":[55],"wavelet":[57,96],"transform":[58,97],"deep":[60,109],"neural":[61,110],"networks.":[62],"proposed":[64,121,153,179],"aims":[66],"provide":[68,124],"type,":[71],"phase,":[72],"location":[74],"information":[75],"protection":[78],"service":[80],"scheme,":[84,156],"branch":[85],"current":[86],"measurements":[87],"sampled":[88],"by":[89,94],"protective":[90],"relays":[91],"are":[92,142],"pre-processed":[93],"discrete":[95],"extract":[99],"statistical":[100],"features.":[101],"Then":[102],"all":[103],"available":[104],"data":[105],"input":[107],"into":[108],"networks":[111],"develop":[113],"information.":[115],"Compared":[116],"with":[117],"previous":[118,145],"work,":[119],"can":[123,134],"significantly":[125],"better":[126],"type":[128],"classification":[129],"accuracy.":[130],"Moreover,":[131],"also":[135],"detect":[136],"locations":[138],"faults,":[140],"which":[141],"unavailable":[143],"work.":[146],"To":[147],"evaluate":[148],"performance":[150],"conduct":[158],"a":[159],"comprehensive":[160],"evaluation":[161],"study":[162],"CERTS":[165],"IEEE":[168],"34-bus":[169],"system.":[170],"simulation":[172],"results":[173],"demonstrate":[174],"efficacy":[176],"terms":[182],"accuracy,":[185],"computation":[186],"time,":[187],"robustness":[189],"against":[190],"measurement":[191],"uncertainty.":[192]},"counts_by_year":[{"year":2026,"cited_by_count":8},{"year":2025,"cited_by_count":55},{"year":2024,"cited_by_count":62},{"year":2023,"cited_by_count":91},{"year":2022,"cited_by_count":80},{"year":2021,"cited_by_count":55},{"year":2020,"cited_by_count":48},{"year":2019,"cited_by_count":32},{"year":2018,"cited_by_count":8}],"updated_date":"2026-04-07T14:57:38.498316","created_date":"2025-10-10T00:00:00"}