{"id":"https://openalex.org/W2289571706","doi":"https://doi.org/10.1109/tsg.2015.2439693","title":"Power System Reliability Analysis With Intrusion Tolerance in SCADA Systems","display_name":"Power System Reliability Analysis With Intrusion Tolerance in SCADA Systems","publication_year":2015,"publication_date":"2015-06-17","ids":{"openalex":"https://openalex.org/W2289571706","doi":"https://doi.org/10.1109/tsg.2015.2439693","mag":"2289571706"},"language":"en","primary_location":{"id":"doi:10.1109/tsg.2015.2439693","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsg.2015.2439693","pdf_url":null,"source":{"id":"https://openalex.org/S59604973","display_name":"IEEE Transactions on Smart Grid","issn_l":"1949-3053","issn":["1949-3053","1949-3061"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Smart Grid","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100444199","display_name":"Yichi Zhang","orcid":"https://orcid.org/0000-0003-1183-8629"},"institutions":[{"id":"https://openalex.org/I90871651","display_name":"University of Toledo","ror":"https://ror.org/01pbdzh19","country_code":"US","type":"education","lineage":["https://openalex.org/I90871651"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yichi Zhang","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of Toledo, Toledo, OH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Toledo, Toledo, OH, USA","institution_ids":["https://openalex.org/I90871651"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100629699","display_name":"Lingfeng Wang","orcid":"https://orcid.org/0000-0003-1658-9860"},"institutions":[{"id":"https://openalex.org/I43579087","display_name":"University of Wisconsin\u2013Milwaukee","ror":"https://ror.org/031q21x57","country_code":"US","type":"education","lineage":["https://openalex.org/I43579087"]},{"id":"https://openalex.org/I90871651","display_name":"University of Toledo","ror":"https://ror.org/01pbdzh19","country_code":"US","type":"education","lineage":["https://openalex.org/I90871651"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lingfeng Wang","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of Toledo, Toledo, OH, USA","Department of Electrical Engineering and Computer Science, University of Wisconsin\u2013Milwaukee, Milwaukee, WI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Toledo, Toledo, OH, USA","institution_ids":["https://openalex.org/I90871651"]},{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Wisconsin\u2013Milwaukee, Milwaukee, WI, USA","institution_ids":["https://openalex.org/I43579087"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086651883","display_name":"Yingmeng Xiang","orcid":"https://orcid.org/0000-0001-6515-1027"},"institutions":[{"id":"https://openalex.org/I90871651","display_name":"University of Toledo","ror":"https://ror.org/01pbdzh19","country_code":"US","type":"education","lineage":["https://openalex.org/I90871651"]},{"id":"https://openalex.org/I43579087","display_name":"University of Wisconsin\u2013Milwaukee","ror":"https://ror.org/031q21x57","country_code":"US","type":"education","lineage":["https://openalex.org/I43579087"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yingmeng Xiang","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of Toledo, Toledo, OH, USA","Department of Electrical Engineering and Computer Science, University of Wisconsin\u2013Milwaukee, Milwaukee, WI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Toledo, Toledo, OH, USA","institution_ids":["https://openalex.org/I90871651"]},{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Wisconsin\u2013Milwaukee, Milwaukee, WI, USA","institution_ids":["https://openalex.org/I43579087"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100444199"],"corresponding_institution_ids":["https://openalex.org/I90871651"],"apc_list":null,"apc_paid":null,"fwci":5.7825,"has_fulltext":false,"cited_by_count":55,"citation_normalized_percentile":{"value":0.9613276,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"7","issue":"2","first_page":"669","last_page":"683"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10400","display_name":"Network Security and Intrusion Detection","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10734","display_name":"Information and Cyber Security","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.7909353971481323},{"id":"https://openalex.org/keywords/scada","display_name":"SCADA","score":0.777164101600647},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6807984113693237},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.661677360534668},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.5463292598724365},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5461158156394958},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5198290944099426},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.440490186214447},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38968124985694885},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2970888316631317},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1600574553012848}],"concepts":[{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.7909353971481323},{"id":"https://openalex.org/C113863187","wikidata":"https://www.wikidata.org/wiki/Q17498","display_name":"SCADA","level":2,"score":0.777164101600647},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6807984113693237},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.661677360534668},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.5463292598724365},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5461158156394958},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5198290944099426},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.440490186214447},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38968124985694885},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2970888316631317},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1600574553012848},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tsg.2015.2439693","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsg.2015.2439693","pdf_url":null,"source":{"id":"https://openalex.org/S59604973","display_name":"IEEE Transactions on Smart Grid","issn_l":"1949-3053","issn":["1949-3053","1949-3061"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Smart Grid","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.4399999976158142}],"awards":[{"id":"https://openalex.org/G4581131814","display_name":null,"funder_award_id":"ECCS1128594","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W180604521","https://openalex.org/W303893330","https://openalex.org/W1486460655","https://openalex.org/W1533138781","https://openalex.org/W1593545818","https://openalex.org/W1968808436","https://openalex.org/W1970818505","https://openalex.org/W1986076419","https://openalex.org/W2001679520","https://openalex.org/W2004360894","https://openalex.org/W2010397953","https://openalex.org/W2012246208","https://openalex.org/W2020786402","https://openalex.org/W2041830596","https://openalex.org/W2044910823","https://openalex.org/W2050104152","https://openalex.org/W2051054517","https://openalex.org/W2056437389","https://openalex.org/W2056636551","https://openalex.org/W2058530497","https://openalex.org/W2061737329","https://openalex.org/W2090985577","https://openalex.org/W2095243110","https://openalex.org/W2100591382","https://openalex.org/W2109917095","https://openalex.org/W2111158431","https://openalex.org/W2113310679","https://openalex.org/W2119091749","https://openalex.org/W2126622431","https://openalex.org/W2132704120","https://openalex.org/W2139221454","https://openalex.org/W2166159416","https://openalex.org/W2170590256","https://openalex.org/W4302078459","https://openalex.org/W6607334089"],"related_works":["https://openalex.org/W2615977515","https://openalex.org/W2115760278","https://openalex.org/W2146396794","https://openalex.org/W2807864071","https://openalex.org/W3036711525","https://openalex.org/W2379651310","https://openalex.org/W2113019827","https://openalex.org/W1541249122","https://openalex.org/W2413828414","https://openalex.org/W2367222340"],"abstract_inverted_index":{"By":[0,67],"intruding":[1],"on":[2,113],"the":[3,9,27,33,40,55,63,69,73,83,88,103,105,120,126,131,134,139],"substations":[4],"and":[5,12,59,76,90],"control":[6,11,26],"center":[7],"of":[8,32,57,79,98,107,122,128],"supervisory":[10],"data":[13],"acquisition":[14],"system,":[15],"trip":[16],"commands":[17],"can":[18,36],"be":[19,37],"sent":[20],"to":[21,53,86],"intelligent":[22],"electronic":[23],"devices":[24],"that":[25,138],"power":[28,34,140],"system":[29,35,117,132,141],"breakers.":[30],"Reliability":[31],"impacted":[38],"through":[39],"cyberattacks.":[41],"In":[42],"this":[43],"paper,":[44],"a":[45],"modified":[46],"semi-Markov":[47],"process":[48],"(SMP)":[49],"model":[50],"is":[51],"used":[52],"describe":[54],"procedures":[56],"normal":[58,89],"penetration":[60,91],"attacks":[61,92],"against":[62],"intrusion":[64],"tolerant":[65],"system.":[66],"modeling":[68],"transition":[70],"probabilities":[71,97,109],"between":[72],"SMP":[74,81],"states":[75],"sojourn":[77],"time":[78],"each":[80],"state,":[82],"mean":[84],"times":[85],"compromise":[87],"are":[93,110],"calculated.":[94],"With":[95],"increased":[96],"breaker":[99],"trips":[100],"resulted":[101],"from":[102],"cyberattacks,":[104],"loss":[106],"load":[108],"evaluated":[111],"based":[112],"IEEE":[114],"reliability":[115],"test":[116],"79.":[118],"When":[119],"level":[121,127],"attack":[123],"increases":[124],"or":[125],"defense":[129],"in":[130],"decreases,":[133],"simulation":[135],"results":[136],"demonstrate":[137],"becomes":[142],"less":[143],"reliable.":[144]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":10},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-03-15T09:29:46.208133","created_date":"2025-10-10T00:00:00"}